Patent classifications
H03K19/00369
System for enabling external oscillators in system-on-chips
An enabling system that includes a controller and processing circuitry, is configured to enable an external oscillator that operates in one of single-ended, differential, and crystal modes. To enable the external oscillator, the controller is configured to detect a mode of operation of the external oscillator, and the processing circuitry is configured to operate in the detected mode. The controller detects the mode of operation of the external oscillator by sequentially initializing the processing circuitry to operate in the single-ended, differential, and crystal modes, and determining whether the current operating mode of the processing circuitry is same as the mode of operation of the external oscillator based on a clock signal outputted by the processing circuitry during the corresponding mode.
Systems and methods for integrating power and thermal management in an integrated circuit
An integrated circuit assembly may include an integrated circuit having a plurality of programmable logic sectors and an interposer circuit positioned adjacent to the integrated circuit. The interposer circuit may include at least one voltage regulator that distributes a voltage to at least one of the plurality of programmable logic sectors and at least one thermal sensor that measures a temperature of the at least one of the plurality of programmable logic sectors.
INTEGRATED CIRCUIT, CIRCUIT BOARD, AND ELECTRONIC APPARATUS
An integrated circuit according to one or more embodiments may include a terminal to which an impedance element and a power supply having a predetermined potential can be connected. The integrated circuit may be configured to change a potential of one of electrodes of the impedance element connected to the terminal, detect a change in electrical characteristics of the terminal based on characteristics of the impedance element when the potential of the one electrode of the impedance element is changed, to determine a setting condition among a plurality of setting conditions that are used for an operation of the integrated circuit, store the setting condition in a storage, and use the setting condition stored in the storage for the operation of the integrated circuit.
Dynamic integration time adjustment of a clocked data sampler using a static analog calibration circuit
Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.
Runtime measurement of process variations and supply voltage characteristics
Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.
ADAPTIVE ANTI-AGING SENSOR BASED ON CUCKOO ALGORITHM
An adaptive anti-aging sensor based on a cuckoo algorithm, comprising a control module, a reference voltage-controlled oscillator, two shaping circuits, a frequency difference circuit, a resolution adjustment circuit, a 16-bit counter, a parallel-to-serial circuit, an adaptive module, and a digital-to-analog converter. A lookup table is prestored in the adaptive module; when aging monitoring is performed on a voltage-controlled oscillator in an integrated circuit, the adaptive module uses the cuckoo algorithm to determines the optimal working voltage of the currently monitored voltage-controlled oscillator, and the control module accordingly changes the input voltage of the voltage-controlled oscillator of the integrated circuit. The present invention has the advantages that the degree of aging of the integrated circuit is reflected by monitoring the degree of aging of the voltage-controlled oscillator in the integrated circuit, and the optimal working voltage of the voltage-controlled oscillator in the integrated circuit is adaptively adjusted.
Semiconductor Device, And Display Device And Electronic Device Having The Same
An object is to provide a semiconductor device which can suppress characteristic deterioration in each transistor without destabilizing operation. In a non-selection period, a transistor is turned on at regular intervals, so that a power supply potential is supplied to an output terminal of a shift register circuit. A power supply potential is supplied to the output terminal of the shift register circuit through the transistor. Since the transistor is not always on in a non-selection period, a shift of the threshold voltage of the transistor is suppressed. In addition, a power supply potential is supplied to the output terminal of the shift register circuit through the transistor at regular intervals. Therefore, the shift register circuit can suppress noise which is generated in the output terminal.
Semiconductor integrated circuit device and level shifter circuit
A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND LEVEL SHIFTER CIRCUIT
A semiconductor integrated circuit device includes: first and second transistors provided between a first power source and an output terminal; a step-down circuit that generates a second power source from the first power source; a power source switch circuit that outputs, as a fourth power source, a higher one of potentials of the second power source and a third power source; and a level shifter circuit that transits between the first power source and a fourth power source. The first transistor has a gate connected to an output of the level shifter circuit; the second transistor has a gate connected to the fourth power source.
FAULT DETECTION SYSTEM FOR ISOLATED TWO-SWITCH EXCITER DRIVE GATE DRIVER
A generator control unit (GCU) includes a fault detection system configured to generate a direct current (DC) voltage signal based on a difference of a DC-equivalent voltage between the positive and negative exciter gate drive signals. The fault detection system further outputs a fault detection signal indicating the fault status of the gate drive integrated circuits based on a comparison between the DC average voltage signal and a threshold value.