A DLL circuit that has a programmable output frequency is provided. The DLL circuit uses a single delay line to produce the multiple frequencies. In various embodiments, the delay line is configured to receive an input clock defining an input clock period. The delay line comprises delay stages, each configured to generate a corresponding output clock having a phase relative to the input clock based on a delay of the delay line. In those embodiments, a control circuit is configured to change the delay of the delay line so as to cause a phase difference between the input clock and a sensed output clock to be substantially equal to the input clock period. An edge combiner is configured to generate a DLL output clock based on the output clocks of the delay stages and presents an equal schematic load for each of the output clocks of the delay stages.

A time delay circuit comprising a plurality of differential delay cells each having a respective time delay and being arranged in series. Each delay cell comprises first and second inverter sub-cells, each comprising a respective PMOS transistor and an NMOS transistor arranged in series such that their respective drain terminals are connected at a drain node. Each of the transistors has a back-gate terminal and is arranged such that a respective voltage applied to said back-gate terminal linearly controls its respective threshold voltage. The back-gate terminal of the PMOS transistor in each inverter sub-cell is connected to the drain node of the other sub-cell and/or the back-gate terminal of the NMOS transistor in each inverter sub-cell is connected to the drain node of the other sub-cell. A control signal varies the time delay of the delay cell by adjusting a voltage supplied to a back-gate terminal of a transistor.

Multiple, distributed, clock generating delay-locked loop (DLL) elements are interconnected/coupled in such a way as to reduce the amount of phase error present in the clocks output by these DLL elements. A plurality of DLL elements are interconnected/coupled such that a root input clock is successively relayed down a series of DLL elements. The output clocks from each of these DLL elements are interconnected/coupled to phase-corresponding output clocks from DLL elements in the series. This reduces the amount of phase error on these output clocks when compared to DLL elements that do not have outputs coupled to each other.

A semiconductor module including a semiconductor element, a controller, a cooler, and a temperature sensor are included. The controller is connected to the semiconductor module and controls switching operation of the semiconductor element. The temperature sensor measures a coolant temperature, which is a temperature of the coolant. The controller controls turn-off speed of the semiconductor element based on the coolant temperature. The controller increases the turn-off speed as the coolant temperature rises.

A quadrature clock generator that takes advantage of the inherently low delay of a shunt-series inductively peaked clock buffer to generate quadrature clocks with the high jitter performance using just one additional stage in Q path compared to I path. The generator includes a delay cell that uses shunt-series peaking and uses a resistive DAC in series with the shunt inductor to provide a large delay range with good jitter characteristics. The resistive DAC can be placed near a real or a virtual ground to minimize capacitive loading on the signal path. This delay cell can provide greater than 2× delay tuning range and is suitable for clocks at high frequencies. This delay cell can also be used as a ring oscillator with large frequency tuning range. A low voltage differential signaling termination switch control that uses feed forward mechanism to control termination impedance of device in a receiver.

A device includes a sensor configured to provide a temperature-sensitive voltage and an oscillator. The sensor includes: a first transistor, being a diode-connected transistor; a second transistor coupled between a source of the first transistor and ground, wherein a gate of the second transistor is controllable by an enable signal; and a current source configured to control the first transistor and comprising a third transistor, a drain of which is directly connected to a drain of the first transistor, the third transistor being a diode-connected transistor. The oscillator includes: a digital delay cell; and an adjustment device configured to, based on the temperature-sensitive voltage, adjust a delay of the digital delay cell. The digital delay cell produces, based on the adjusted delay, a signal at an oscillation frequency.

A DLL circuit that has a programmable output frequency is provided. The DLL circuit uses a single delay line to produce the multiple frequencies. In various embodiments, the delay line is configured to receive an input clock defining an input clock period. The delay line comprises delay stages, each configured to generate a corresponding output clock having a phase relative to the input clock based on a delay of the delay line. In those embodiments, a control circuit is configured to change the delay of the delay line so as to cause a phase difference between the input clock and a sensed output clock to be substantially equal to the input clock period. An edge combiner is configured to generate a DLL output clock based on the output clocks of the delay stages and presents an equal schematic load for each of the output clocks of the delay stages.

A duty cycle correction circuit includes: a first inverter, a first delayer, and a first adjustment circuit. An input terminal and output terminal of the first inverter are respectively configured to receive a first signal and output a third signal. A first input terminal and an output terminal of the first adjustment circuit are respectively configured to receive the third signal and output a first correction signal. An input terminal and output terminal of the first delayer are respectively configured to input a second signal and output a fourth signal to the first adjustment circuit. The fourth signal has a first delay time relative to the second signal. When the third signal and the fourth signal are at a high level, so is the first correction signal. When the third signal and the fourth signal are at a low level, so is the first correction signal.

A duty cycle correction circuit includes: a first inverter, a first delayer, and a first adjustment circuit. An input terminal and output terminal of the first inverter are respectively configured to receive a first signal and output a third signal. A first input terminal and an output terminal of the first adjustment circuit are respectively configured to receive the third signal and output a first correction signal. An input terminal and output terminal of the first delayer are respectively configured to input a second signal and output a fourth signal to the first adjustment circuit. The fourth signal has a delay of a first time duration relative to the second signal. When the third signal and the fourth signal are at a high level, so is the first correction signal. When the third signal and the fourth signal are at a low level, so is the first correction signal.

A device includes a sensor configured to provide a temperature-sensitive voltage and an oscillator. The sensor includes: a first transistor, being a diode-connected transistor; a second transistor coupled between a source of the first transistor and ground, wherein a gate of the second transistor is controllable by an enable signal; and a current source configured to control the first transistor and comprising a third transistor, a drain of which is directly connected to a drain of the first transistor, the third transistor being a diode-connected transistor. The oscillator includes: a digital delay cell; and an adjustment device configured to, based on the temperature-sensitive voltage, adjust a delay of the digital delay cell. The digital delay cell produces, based on the adjusted delay, a signal at an oscillation frequency.