A delay circuit and a delay structure are provided. The circuit includes: a first delay unit configured to delay a rising edge and/or a falling edge of a pulse signal, where, an input terminal of the first delay unit receives the pulse signal, and an output terminal of the first delay unit outputs a first delay signal, and a second delay unit, configured to delay the first delay signal, where an input terminal of the second delay unit is connected to the output terminal of the first delay unit, and an output terminal of the second delay unit outputs a second delay signal.

A delay circuit and a delay structure are provided. The circuit includes: a first delay unit configured to delay a rising edge and/or a falling edge of a pulse signal, where, an input terminal of the first delay unit receives the pulse signal, and an output terminal of the first delay unit outputs a first delay signal, and a second delay unit, configured to delay the first delay signal, where an input terminal of the second delay unit is connected to the output terminal of the first delay unit, and an output terminal of the second delay unit outputs a second delay signal.

A delay cell includes: a plurality of delay elements coupled in series; and at least one three-phase inverter that is coupled in parallel to at least one of the delay elements, and that receives through a first control terminal a first bias voltage for compensating for a variation of a power source voltage, and receives through a second control terminal a second bias voltage for compensating for a variation of a ground voltage.

A delay cell includes: a plurality of delay elements coupled in series; and at least one three-phase inverter that is coupled in parallel to at least one of the delay elements, and that receives through a first control terminal a first bias voltage for compensating for a variation of a power source voltage, and receives through a second control terminal a second bias voltage for compensating for a variation of a ground voltage.

An integrated circuit may include path delay calibration circuitry. The calibration circuitry may be configured to calibrate respective delay paths so that data and control signals travelling through the respective delay paths experience proper propagation delays during normal user operation. The calibration circuitry may include a high frequency error calibration circuit, a monitoring circuit, and a calibration processing circuit. The high frequency error calibration circuit may be used to compute first calibration settings that take into account jitter and process variations. The monitoring circuit may be used to measure a proxy parameter of interest. The processing circuit may be used to compute an offset based at least partly on the measured value of the proxy parameter. The offset may be applied to the first calibration settings to obtain second calibration settings, which can be used to configure the respective delay paths.