Programming time delay data in an oversampled sensor includes determining whether to enter Programming Mode based on a value of a system parameter received by the oversampled sensor. Programming Mode is entered when the value of the system parameter corresponds to Programming Mode. The time delay data is programmed in the oversampled sensor during Programming Mode. The oversampled sensor uses the time delay data to time delay its output in an oversampled domain. Programming Mode is exited after a predetermined time has expired relative to when Programming Mode was entered. The system parameter can be a frequency of a sampling clock signal.

A delay circuit includes a voltage/current conversion unit, a capacitor, and an output logic unit. The voltage/current conversion unit receives an input signal and generates current based on a voltage level of the input signal, and the generated current is proportional to the voltage level of the input signal. The capacitor is electrically connected to the voltage/current conversion unit and configured to receive the current generated by the voltage/current conversion unit, to charge. The output logic unit is electrically connected to the capacitor configured to receive a voltage signal on a terminal of the capacitor and generate an output signal based on the voltage signal, a delay time between a transition time point of the input signal and a transition time point of the output signal is not related to the voltage level of the input signal.

A switching power amplifier includes logic circuitry that generates first and second components of a differential signal, based on received amplitude code and a delayed version of the same. The amplitude code includes a sign and a magnitude. When the sign is positive, a first logic path is configured to generate the first component based on the received amplitude code and the second logic path is configured to generate the second component based on the delayed amplitude code. When the sign is negative, the first logic path is configured to generate the first component based on the delayed amplitude code and the second logic path is configured to generate the second component based on the received amplitude code. The switching power amplifier further includes a differential-to-single ended conversion circuit configured to generate a single-ended signal based on the differential signal.

An apparatus to time delay a digital, signal output from an oversampled sensor includes a first time delay element and a second time delay element. The first time delay element has a first input and a first output. The first time delay element is configured to output a time delayed signal that is time delayed by an integer number of sampling clock cycles. An output of the oversampled sensor is connected to the first input of the first time delay element. The second time delay element has a second input and a second output and is configured to output a time delayed signal that is time delayed by an integer number of sampling clock cycles. The first output of the first time delay element is connected to the second input of the second time delay element. A multiplexer has a control input and a multiplexer output. The first output of the first time delay element is connected to a first multiplexer input. The second output of the second time delay element is connected to a second multiplexer input. In operation, time delay information is used to provide a signal to the control input to select a particular multiplexer input for output on the multiplexer output. The output of the oversampled sensor is time delayed by an amount provided by the particular multiplexer input.

A delay circuit includes a plurality of cascaded delay elements responsive to control signals. Each delay element is configurable to receive an input signal on a forward path and return the input signal on two return paths. A control unit is connected to the plurality of cascaded delay elements and configured to generate a first set of control signals for defining a first configuration of the plurality of cascaded delay elements, a second set of control signals for causing a delay element of the plurality of cascaded delay elements to change from a powered off status to a powered on status while configured in an initialization mode, and a third set of control signals for defining a second configuration of the plurality of cascaded delay elements.

A delay locked loop includes a delay line, a delay circuit, a phase detector, a delay code generator, and a delay controller. The delay line may delay an input clock signal in units of unit delay in response to a delay control code to generate an output clock signal. The delay circuit may delay the output clock signal to generate a delay clock signal. The phase detector may compare the input clock signal and the delay clock signal to generate a phase detection signal. The delay code generator may compare the input clock signal and the delay clock signal to detect a phase difference therebetween, and generate a delay code using the phase difference. The delay controller may generate the delay control code using the delay code and the phase detection signal.

An imaging device includes an imaging unit, a reference signal generation unit, m (m is an integer of 3 or more) number of column delay units, and a plurality of column AD conversion units. The plurality of column delay units is arranged so as to correspond to two or more and less than m of the column AD conversion units. Each of the plurality of column delay units includes a first delay circuit. The first delay circuit generates a plurality of first delay clocks. The column AD conversion unit includes a comparison unit, a latch unit, and a counter unit. The comparison unit compares a pixel signal with a reference signal, and outputs a control signal corresponding to a comparison result. The latch unit includes a plurality of latch circuits that latches the plurality of first delay clocks on the basis of a state change of the control signal.

An apparatus including semiconductor dies in a stack. The semiconductor dies are configured to power-up in a staggered manner. Methods for powering up an electronic device include detecting a power-up event with the semiconductor dies in the stack, and responsive to the power-up event, powering up a first semiconductor die in the stack at a first time, and powering up a second semiconductor die in the stack at a second time that is different from the first time.

A phase correction circuit includes: a test clock generation unit including a plurality of signal paths and configurable to generate a plurality of test clock signals in response to a plurality of selection signals and a plurality of phase control signals; a detection unit configured to generate a plurality of detection voltages using the plurality of test clock signals; and a control unit configured to generate the plurality of selection signals, detect phase skews of the plurality of signal paths according to the plurality of detection voltages, and generate the plurality of phase control signals for correcting the phase skews.

A phase and frequency control circuit may be provided. The phase and frequency control circuit may include a division circuit configured to generate a plurality of divided signals by dividing an input signal. The phase and frequency control circuit may include a timing control circuit configured to generate a plurality of timing control signals by sampling the plurality of divided signals according to a phase control code and a sampling reference signal.