Patent classifications
H03K3/023
High speed comparator with digitally calibrated threshold
A subsystem configured to implement an analog to digital converter that includes a high speed comparator with an embedded reference voltage level that functions as a calibrated threshold. A calibration element applies power to a reference voltage system. The calibration element then selects a differential analog voltage and applies the differential analog voltage to the inputs of the comparator. A digitally coded signal then configures an array of switches that connect complements of integrated resistors to each input of the comparator so that the switching point of the comparator occurs coincident with the applied differential analog reference voltage, nulling out the effect of the applied differential analog voltage and comparator errors. The calibration element then removes power from the reference voltage system. As a result, the comparator is configured with an embedded threshold that equals the differential analog reference voltage.
Self-calibrating quadrature clock generator and method thereof
A quadrature clock generator includes a variable delay clock generator configured to receive a first clock and a third clock and output a second clock and a fourth clock in accordance with a control signal, wherein the first clock and the third clock are substantially the same but offset in timing by one half of the period; a quadrature phase error detector configured to receive the first clock, the second clock, the third clock, and the fourth clock and output a first phase detection signal and a second phase detection signal, wherein the first phase detection signal represents a relative timing between the first clock and the second clock and the second phase detection signal represents a relative timing between the second clock and the third clock; and an amplifier configured to amplify a difference between the first phase detection signal and the second phase detection signal into the control signal.
Circuits and methods for reducing kickback noise in a comparator
Circuits and methods for reducing and cancelling out kickback noise are disclosed. In one example, a circuit for a comparator is disclosed. The circuit includes: a first transistor group, a second transistor group, and a first switch. The first transistor group comprises a first transistor having a drain coupled to a first node, and a second transistor having a source coupled to the first node. Gates of the first transistor and the second transistor are coupled together to a first input of the comparator. The second transistor group comprises a third transistor having a drain coupled to a second node, and a fourth transistor having a source coupled to the second node. Gates of the third transistor and the fourth transistor are coupled together to a second input of the comparator. The first switch is connected to and between the first node and the second node.
Circuits and methods for reducing kickback noise in a comparator
Circuits and methods for reducing and cancelling out kickback noise are disclosed. In one example, a circuit for a comparator is disclosed. The circuit includes: a first transistor group, a second transistor group, and a first switch. The first transistor group comprises a first transistor having a drain coupled to a first node, and a second transistor having a source coupled to the first node. Gates of the first transistor and the second transistor are coupled together to a first input of the comparator. The second transistor group comprises a third transistor having a drain coupled to a second node, and a fourth transistor having a source coupled to the second node. Gates of the third transistor and the fourth transistor are coupled together to a second input of the comparator. The first switch is connected to and between the first node and the second node.
TIME INTERLEAVED PHASED ARRAY RECEIVERS
A phased array receiver can include a plurality of antennas, a plurality of compound analog-to-digital converters and a beam former. The plurality of antennas can be arranged in an array. The plurality of compound analog-to-digital converters can include respective inputs coupled to respective ones of the plurality of antennas. Respective output of the plurality of compound analog-to-digital converters can be coupled to the beam former. Each compound analog-to-digital converter can include a plurality of time interleaved sub-analog-to-digital converters. Sampling by the sub-analog-to-digital converters can be random between the sub-analog-to-digital converters within respective compound analog-to-digital converters and random between the plurality of compound analog-to-digital converters. In addition, dynamic element mismatch using a random bitstream generator can be employed in digital-to-analog converters and analog-to-digital converters.
Current sensing multiple output current stimulators
A multiple output current stimulator circuit with fast turn on time is described. At least one pair of input side and output side transistors is arranged in a current mirror connected to a supply transistor by cascode coupling. The output side transistor supplies stimulation current to an electrode in contact with tissue. An operational amplifier connected to a reference voltage and to the output side transistor drives the supply transistor to maintain the voltage at the output side transistor equal to the reference voltage. The at least one pair of transistors includes multiple pairs of transistors whose output side transistors drive respective electrodes with stimulation currents. The stimulator determines the initiation and duration of stimulation current pulses supplied to each electrode. At circuit activation, large currents are generated which discharge capacitances in the output side transistors causing rapid output side transistor turn on.
Current sensing multiple output current stimulators
A multiple output current stimulator circuit with fast turn on time is described. At least one pair of input side and output side transistors is arranged in a current mirror connected to a supply transistor by cascode coupling. The output side transistor supplies stimulation current to an electrode in contact with tissue. An operational amplifier connected to a reference voltage and to the output side transistor drives the supply transistor to maintain the voltage at the output side transistor equal to the reference voltage. The at least one pair of transistors includes multiple pairs of transistors whose output side transistors drive respective electrodes with stimulation currents. The stimulator determines the initiation and duration of stimulation current pulses supplied to each electrode. At circuit activation, large currents are generated which discharge capacitances in the output side transistors causing rapid output side transistor turn on.
Data receiving circuit
A data receiving circuit is provided. The data receiving circuit includes a data input circuit, a latch circuit, and a current source. The data input circuit is configured to receive an input signal. The latch circuit is configured to output an output signal in response to the input signal. The current source is configured to provide a current to the latch circuit. The current source is different from the data input circuit.
Apparatus for offset cancellation in comparators and associated methods
An apparatus includes a comparator. The comparator includes first and second pregain stages, and a switch network coupled to the first and second pregain stages. A plurality of switches in the switch network are operable to provide a feedback path around at least one of the first and second pregain stages. The comparator further includes a latch coupled to the second pregain stage.
MANAGEMENT OF NON-VOLATILE MEMORY ARRAYS
The system may include a digital-to-analog converter configured to convert a digital signal to an analog signal. The system may include sample/hold circuits configured to receive and store the analog signal. The system may include an address controller configured to regulate which sample/hold circuits propagate the analog signal. The sample/hold circuits may be configured to feed the analog signal to devices of a memory array. The system may include an output circuit configured to program the devices by comparing currents of the devices to a target current. In response to one or more of the currents of the devices being within a threshold range, the output circuit may discontinue programming the corresponding devices. In response to one or more of the currents of the devices not being within the threshold range, the output circuit may continue programming the corresponding devices.