A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.

An integrated circuit (IC) for clock and phase aligning and synchronization between physical (PHY) layers and a communications controller is provided. The IC includes a clock multiplier configured to multiply a frequency of the clock signal from a plurality of PHY layers to match a frequency of a clock signal of the controller, wherein the clock signal from the plurality of PHY layers is less than the frequency of the clock signal of the controller. IC support circuitry is configured to provide the multiplied clock signal to the controller. The IC includes a first clock divider configured to divide the frequency of the multiplied clock signal and to output the divided clock signal to the controller. The IC includes a phase alignment circuit configured to align phases of one or more data signals based on a phase of the clock signal and a phase of the multiplied clock signal.

The disclosure provides a voltage adjust circuit. The voltage adjust circuit includes a buffer circuit, a bias circuit, a level shifter and a cross voltage limit circuit. The buffer circuit includes a plurality of pull-up transistors and a plurality of pull-down transistors. The pull-up transistors coupled in series between an output terminal of the circuit and a high voltage system terminal. The pull-down transistors coupled in series between the output terminal and a low voltage system terminal. The cross voltage limit circuit is configured to limit transient and static bias voltages across two terminals of the pull-up transistors or the pull-down transistors.

A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.

A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.

A driver circuit for driving, for example, ultrasonic transducers in medical equipment, such as ultrasound scanning equipment. The driver circuit includes first inputs receptive of a pulsed signal, second inputs receptive of an analog signal, an output for applying a pulsed drive signal or an analog drive signal to a load. A pair of output transistors of complementary polarities are positioned with their current paths in series between opposing supply lines with a connection point intermediate between the transistors of the pair of transistors. The connection point between output transistors is coupled to the output of the circuit. The control terminals of the output transistors, which are coupled together, may be coupled to the first inputs with the driver functioning as a pulser, or else coupled to the second inputs with the driver functioning as a linear driver.

An electronic device may include a sensing circuit and a current subtraction circuit. The sensing circuit may output first and second current signals. The current subtraction circuit may mirror the first and second current signals onto first and second current branches. The second current branch may be split into a first sub-path and a second sub-path. An amplifier may control the amount of current flowing through the second sub-path by forcing the current flowing through the first current branch and the current flowing through the first sub-path to be identical. Configured in this way, the current flowing through the second sub-path will be equal to the difference between the first and second current signals. The current flowing through the second sub-path may be optionally amplified using another current mirror.

A clock signal boost circuit includes a first NMOS transistor having a drain to a power terminal, a source to a first node, and a gate to a first terminal, a second NMOS transistor having a drain to the first node, a source to a GND, and a gate to a second terminal, a third NMOS transistor having a drain to the power terminal, a source to a second node, and a gate to the second terminal, a capacitor between the first node and the second node, a PMOS transistor having a source to the second node, a drain to an output terminal, and a gate to the second terminal, and a fourth NMOS transistor having a drain to the output terminal, a source to the GND, and a gate to the second terminal. The first and the third NMOS transistors are depletion type NMOS transistors.

A signal receiver circuit includes: a negative voltage applier suitable for applying a negative voltage to a common source node in response to a first clock is at a first logic level; a first sampling transistor coupled between the common source node and a first sampling node to sink a current from the first sampling node to the common source node in response to a first input signal; a second sampling transistor coupled between the common source node and a second sampling node to sink a current from the second sampling node to the common source node in response to a second input signal; an equalizer suitable for equalizing the first sampling node and the second sampling node in response to the first clock is at a second logic level; a precharger suitable for precharging a first output node and a second output node with a pull-up voltage in response to a second clock is at the first logic level, and electrically coupling the first output node and second output node to the second sampling node and the first sampling node, respectively, in response to the second clock is at the second logic level; and an amplifier suitable for amplifying a voltage difference between the first output node and the second output node in response to the second clock is at the second logic level.

In certain aspects, a clock generation circuit couples to a first clock having a first duty cycle and a second clock having the first duty cycle. The second clock lags the first clock by 90 degrees in phase. The clock generation circuit is configured to couple the output terminal to a ground when the first clock and the second clock both are at logic high and decouple the output terminal from the ground when at least one of the first clock and the second clock is at logic low and couple a supply voltage to the output terminal only when the first clock is at logic low and decouple the supply voltage from the output terminal when the first clock is at logic high. The clock generation circuit generates clock signals having a second duty cycle.