An integrated circuit includes a pipeline of compare logic stages. The pipeline, at successive pipeline stages, determines whether each of a set of input symbols meets a corresponding programmable criteria. The compare logic stages each compare the set of input symbols to a respective programmable value. The compare logic stages also each provide, to a respective successive compare logic stage, a corresponding plurality of indicators of whether respective ones of the set of input symbols met the corresponding programmable criteria for that compare logic stage. The corresponding programmable criteria are configurable to be based at least in part on the corresponding plurality of indicators from a respective previous compare logic stage.

An integrated circuit includes a pipeline of compare logic stages. The pipeline, at successive pipeline stages, determines whether each of a set of input symbols meets a corresponding programmable criteria. The compare logic stages each compare the set of input symbols to a respective programmable value. The compare logic stages also each provide, to a respective successive compare logic stage, a corresponding plurality of indicators of whether respective ones of the set of input symbols met the corresponding programmable criteria for that compare logic stage. The corresponding programmable criteria are configurable to be based at least in part on the corresponding plurality of indicators from a respective previous compare logic stage.

A circuit arrangement is disclosed for controlling the switching of a field effect transistor (FET). A current controlled amplifier may be configured to amplify a current in a current sense device to generate an amplified current, wherein the current in the current sense device indicates a current through the FET. A comparator may be coupled to the current sense amplifier to compare a voltage corresponding to the amplified current with a voltage reference and to generate a comparator output based on the comparison, wherein the comparator output controls whether the FET is on or off.

The present invention provides a dynamic comparator including a dynamic amplifier and a latch circuit. The dynamic amplifier includes a first input pair, a current source and a gain boosting circuit. The first input pair is configured to receive an input signal to generate an amplified signal at an output terminal. The current source is coupled between the first input pair and a first reference voltage. The gain-boosting circuit is coupled between the first input pair and a second reference voltage, and is configured to receive the input signal to selectively inject current to the output terminal or sink current from the output terminal. The latch circuit is coupled to the dynamic amplifier, and is configured to receive the amplified signal to generate an output signal.

The present invention provides a dynamic comparator including a dynamic amplifier and a latch circuit. The dynamic amplifier includes a first input pair, a current source and a gain boosting circuit. The first input pair is configured to receive an input signal to generate an amplified signal at an output terminal. The current source is coupled between the first input pair and a first reference voltage. The gain-boosting circuit is coupled between the first input pair and a second reference voltage, and is configured to receive the input signal to selectively inject current to the output terminal or sink current from the output terminal. The latch circuit is coupled to the dynamic amplifier, and is configured to receive the amplified signal to generate an output signal.

A cross-coupled differential activated latch circuit with circuitry comprising a plurality of n-FETs and inverters that can be implemented completely in GaN. The circuitry prevents the digital latched values on the outputs of the latch from changing unless the digital input values on the inputs are different, thus preventing common-mode voltage on the inputs from corrupting the stored latch values.

A voltage comparator and an operation method thereof are provided. The voltage comparator includes an amplifying circuit, a reference current source, and a transient current source. A first input terminal and a second input terminal of the amplifying circuit respectively receive a first corresponding voltage corresponding to a target voltage and a reference voltage. The reference current source is coupled to the amplifying circuit to provide a reference current. The transient current source is coupled to the amplifying circuit to selectively provide a transient current. The transient current source detects a transition of a second corresponding voltage corresponding to the target voltage to dynamically adjust the transient current. Therefore, when a rapidly increasing voltage occurs in the target voltage, the transient current source may temporarily increase the current of the amplifying circuit, thereby accelerating the response speed of the amplifying circuit.

A voltage comparator and an operation method thereof are provided. The voltage comparator includes an amplifying circuit, a reference current source, and a transient current source. A first input terminal and a second input terminal of the amplifying circuit respectively receive a first corresponding voltage corresponding to a target voltage and a reference voltage. The reference current source is coupled to the amplifying circuit to provide a reference current. The transient current source is coupled to the amplifying circuit to selectively provide a transient current. The transient current source detects a transition of a second corresponding voltage corresponding to the target voltage to dynamically adjust the transient current. Therefore, when a rapidly increasing voltage occurs in the target voltage, the transient current source may temporarily increase the current of the amplifying circuit, thereby accelerating the response speed of the amplifying circuit.

A self-test mechanism within an integrated circuit to test for faulty operation of a clock monitor unit implemented within the integrated circuit for monitoring a clock signal. The mechanism intentionally injects faults into the clock monitor unit to evaluate if the clock monitor unit is operating in accordance with its specified operating parameters. The injected faults are intended to cause the clock monitor unit to determine that the clock signal is operating outside of an artificially generated, imaginary specified frequency range. If the injected faults do not cause the clock monitor unit to determine that the clock signal is operating both above and below the artificially generated, imaginary specified frequency range, then the clock monitor unit is not functioning according to specified operating parameters.

A self-test mechanism within an integrated circuit to test for faulty operation of a clock monitor unit implemented within the integrated circuit for monitoring a clock signal. The mechanism intentionally injects faults into the clock monitor unit to evaluate if the clock monitor unit is operating in accordance with its specified operating parameters. The injected faults are intended to cause the clock monitor unit to determine that the clock signal is operating outside of an artificially generated, imaginary specified frequency range. If the injected faults do not cause the clock monitor unit to determine that the clock signal is operating both above and below the artificially generated, imaginary specified frequency range, then the clock monitor unit is not functioning according to specified operating parameters.