A ratiometric analog-to-digital conversion circuit includes a first voltage range operation circuit configured to use a first power supply voltage of a first voltage range, and output an analog signal corresponding to an external input signal; and a second voltage range operation circuit configured to use a second power supply voltage of a second voltage range, generate a digital value by analog-to-digital converting the analog signal, feed back the digital value for analog-to-digital conversion, and output a digital signal corresponding to the digital value and proportional to the input signal.

A digital/analog converter (DAC) includes a reference current generator including an internal resistor, and configured to generate reference current according to a resistance value of the internal resistor and a reference voltage, a digital gain block configured to generate a calibrated digital input signal that is obtained by adjusting a digital gain of a digital input signal based on a ratio between a reference resistance value and a resistance value of the internal resistor, and a conversion circuit configured to convert the calibrated digital input signal into an analog output signal, based on the reference current.

A ratiometric analog-to-digital conversion circuit includes a first voltage range operation circuit configured to use a first power supply voltage of a first voltage range, and output an analog signal corresponding to an external input signal; and a second voltage range operation circuit configured to use a second power supply voltage of a second voltage range, generate a digital value by analog-to-digital converting the analog signal, feed back the digital value for analog-to-digital conversion, and output a digital signal corresponding to the digital value and proportional to the input signal.

A method of operating a memory device includes: supplying one or more supply voltages to a memory array; and monitoring the one or more supply voltages, which includes: selecting, from the one or more supply voltages, a selected supply voltage; converting, using an analog-to-digital converter (ADC), an internal reference voltage of the memory device and a scaled version of the selected supply voltage into one or more digital values; generating a calibrated measurement result using the one or more digital values; and determining whether the calibrated measurement result is within a pre-determined range.

A temperature sensing circuit includes a current generation circuit generating an initial current proportional to absolute temperature (Iptat), and a voltage generation circuit configured to mirror Iptat using an adjustable current source to produce a scaled current and to source the scaled current to a first terminal of a resistor to produce a reference voltage at the first terminal. A second terminal of the resistor has a voltage complementary to absolute temperature (Vctat) applied thereto. An analog-to-digital converter (ADC) has a reference input receiving the reference voltage, and a data input receiving Vctat or an externally sourced voltage. The ADC generates an output code indicative of a ratio between: a) either Vctat or the externally sourced voltage, and b) the reference voltage. A digital circuit determines a temperature readout from the output code and calibrates the reference voltage and the temperature readout determination based upon the output code.

Various embodiments relate to a single slope analog to digital converter (ADC), including: a voltage slope generator; a reference voltage generator configured to generate a first reference voltage, a second reference voltage, and a third reference voltage, where the first reference voltage equals the sum of the second reference voltage and the third reference voltage; a first comparator configured to compare a voltage to a voltage output from the voltage slope generator; a first register configured to store a first count based upon the first reference voltage being input into the first comparator; a second register configured to store a second count based upon the second reference voltage being input into the first comparator; a third register configured to store a third count based upon the third reference voltage being input into the first comparator; a fourth register configured to store a fourth count based upon a first input voltage being input into the first comparator, wherein the first input voltage is the voltage to be converted to a digital value by the ADC; and an output circuit configured to calculate a digital value for the first input voltage based upon the first, second, third, and fourth counts.

A signal processing apparatus, a signal processing system and a signal processing method are provided. The signal processing apparatus includes at least one analog channel and an analog-to-digital conversion unit. Each of the at least one analog channel is configured to, in response to receiving a first analog signal inputted from outside, condition the first analog signal to generate a second analog signal, and send the second analog signal to the analog-to-digital conversion unit. The analog-to-digital conversion unit is configured to convert the second analog signal sent from any of the at least one analog channel into a digital signal.

It is described an electronic device (1) for measuring an electric quantity, comprising: an analog-digital conversion module (2) configured to digitally convert time portions of an analog signal (S.sub.M(t)) to be measured alternated with time portions of a reference analog signal (S.sub.R(t)), for supplying respective first (D.sub.SM) and second pluralities (D.sub.SR) of digital values and a digital processing module (3) configured to: calculate a first mean amplitude (A1) of the first pluralities of digital values, and a second mean amplitude (A2) of the second pluralities of digital values; the first and second mean amplitudes being proportional to a mean gain value of the analog-digital conversion module (2); supply a ratio value (V.sub.RT) of the first mean amplitude to the second mean amplitude, representative of a measured amplitude of the analog signal (S.sub.M(t)) to be measured.

Device for ratiometric measurement of voltages for an analog-digital converter, wherein the device comprises a functional providing unit, a microcontroller and a first sensor, wherein a reference voltage is provided to the microcontroller and a first supply voltage is provided to the first sensor and the microcontroller by the functional providing unit, and wherein the first sensor is connected to the microcontroller in terms of signalling by transmitting sensor signals, and wherein the microcontroller comprises a first multiplexer and a second multiplexer, wherein the multiplexers outputs signals to the analog-digital-converter. According to the invention, it is provided that the reference voltage and the first supply voltage are in each case present on the input side at the first multiplexer and at the second multiplexer, wherein in a first switching state the first supply voltage can be measured on the output side by using the reference voltage as a reference for the analog-digital-converter and in a second switching state the reference voltage can be measured by using the first supply voltage as a reference for the analog-digital-converter.

A signal processing apparatus, a signal processing system and a signal processing method are provided. The signal processing apparatus includes at least one analog channel and an analog-to-digital conversion unit. Each of the at least one analog channel is configured to, in response to receiving a first analog signal inputted from outside, condition the first analog signal to generate a second analog signal, and send the second analog signal to the analog-to-digital conversion unit. The analog-to-digital conversion unit is configured to convert the second analog signal sent from any of the at least one analog channel into a digital signal.