An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.

An apparatus and a method of correcting a mismatch of a time-interleaved analog-to-digital converter are provided. The apparatus may include: a time-interleaved analog-to-digital converter configured to receive a non-return-to-zero (NRZ) signal in a correction mode and generate a first output signal, and including a plurality of analog-to-digital converters; and a mismatch corrector configured to generate a second output signal by processing the first output signal of the time-interleaved analog-to-digital converter based on parameters, wherein the parameters may be generated based on the first output signal of the time-interleaved analog-to-digital converter in the correction mode, and a period of the NRZ signal may be different from a product of a sampling period of the time-interleaved analog-to-digital converter and a number of the plurality of analog-to-digital converters included in the time-interleaved analog-to-digital converter.

In a method of operating an analog-to-digital converter, a gain error and an offset error that are associated with a digital code generated from the analog-to-digital converter are obtained by performing a first analog-to-digital conversion on a first input analog signal. The gain error and the offset error are stored. A calibration digital code is generated by performing a second analog-to-digital conversion on a second input analog signal based on the gain error and the offset error.

A method for self-calibration of reference voltage drop in a Digital to Analog Converter (DAC) includes measuring each one of a plurality of thermometric weightages associated with a respective one of a plurality of thermometric bits, wherein the DAC includes a plurality of sub-binary bits and the plurality of thermometric bits. For each sequentially increasing combination of thermometric bit settings including at least two thermometric bits coupled to a high reference voltage and each sub-binary bit coupled to a low reference voltage, performing the steps of: determining a respective combined weightage correction; adding the combined weightage correction to the highest order bit of the combination of thermometric bit settings; and incrementing a number of bits of the combination of thermometric bit settings in response to the number of bits of the sequential combination being less than a total number of the plurality of thermometric bits.

An AD converter with self-calibration function that does not require an instrument for calibration, and includes: a reference voltage unit that generates a reference voltage; a summation and conversion unit that has two or more unit voltages serving as units of amount of change in a summed voltage, and during conversion, sums up any one unit voltage of the two or more unit voltages until the summed voltage exceeds the reference voltage, with an input voltage being an initial value of the summed voltage; and a control unit including a calibration control section that calibrates the two or more unit voltages and an offset voltage of a comparator at a time of calibration, and a conversion control section that determines a polarity of the offset voltage of the comparator and thereafter converts the input voltage to a digital value during conversion.

A method (100) for characterising processing differences between analog channels, the method comprising injecting (102) three analog signals into a first analog channel and a second analog channel, digitising (104) these signals so as to obtain digital signals x.sub.k, x.sub.l and y.sub.l having N samples, estimating (106) parameters γ.sub.k,l and δ.sub.k,l from the digital signals, where γ.sub.k,l is a ratio between an amplitude of the first analog signal at the output of the first analog channel and an amplitude of the second analog signal at the output of the second analog channel, and where δ.sub.k,l is a difference between a phase shift induced by the first analog channel in the first analog signal and a phase shift induced by the second analog channel in the second analog signal, the estimation comprising the application of a least squares method in order to determine values of the parameters γ.sub.k,l and δ.sub.k,l minimising the following quantity:

[00001]$\underset{n=1}{\overset{N}{.Math.}}{\left(x_k\left(n\right)-{\gamma }_{k,l}\left(\cos \left({\delta }_{k,l}\right)x_l\left(n\right)-\sin \left({\delta }_{k,l}\right)y_l\left(n\right)\right)\right)}^2$

A high-speed data receiver includes interleaver circuitry configured to divide a received data stream into a plurality of interleaved paths for processing, spectral content detection circuitry configured to derive spectral content information from data on each of the plurality of interleaved paths, sorting circuitry configured to bin the derived spectral content information according to energy levels, stream attribute determination circuitry configured to determine, based on sorted spectral content, one or more of path offsets of the interleaved paths, gain mismatch among interleaved paths, signal bandwidth mismatch and pulse width mismatch, and equalization circuitry configured to correct the one or more of the determined offsets, the determined gain mismatch and the determined signal width mismatch. Equalization circuitry may be configured to equalize a gain-normalized signal by separately adjusting respective bandwidth actuators of each respective interleaved path and respective pulse width actuators of each respective interleaved path.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a controlling circuit. The ADC circuits are configured to generate first quantized outputs according to clock signals. The calibration circuit is configured to perform at least one error operation according to the first quantized outputs to generate second quantized outputs, and is configured to analyze time difference information of the clock signals according to the second quantized outputs to generate adjustment signals. The controlling circuit is configured to analyze the first quantized outputs to generate at least one control signal to the calibration circuit, wherein the at least one control signal is configured to control the calibration circuit to selectively perform the at least one error operation and selectively analyze the time difference information of the clock signals.

According to the one embodiment, a semiconductor circuit includes: an analog-to-digital conversion circuit including a first analog-to-digital converter configured to sample at least one first sampling signal regarding an input signal based on a first clock, and a second analog-to-digital converter configured to sample at least one second sampling signal regarding the input signal based on a second clock shifted from the first clock by a first time; and a first calibration circuit configured to calibrate at least one timing of the first clock and the second clock based on a calculation result of a moving average of the first sampling signal and the second sampling signal.

An image pickup apparatus comprising a pixel configured to convert optical signal into an electrical signal, a comparison unit configured to compare a pixel signal from the pixel with a reference voltage, an A/D conversion unit configured to analog/digital (A/D)-convert the pixel signal in a conversion mode selected based on a comparison result of the comparison unit, and a correction unit configured to correct at least one of an offset and a gain generated by the A/D conversion for an output data of the A/D conversion unit, wherein a value for offset correction or gain correction performed by the correction unit is changed according to the selected conversion mode.