An amplifier includes a first stage and a second stage. The first stage includes a first output and a second output. The second stage includes an output, a first transistor and a second transistor. The first transistor includes a drain coupled to the first output of the first stage, and a source coupled to the output of the second stage. The second transistor includes a drain coupled to the second output of the first stage, and a gate coupled to the output of the second stage.

An amplifier includes a first stage and a second stage. The first stage includes a first output and a second output. The second stage includes an output, a first transistor and a second transistor. The first transistor includes a drain coupled to the first output of the first stage, and a source coupled to the output of the second stage. The second transistor includes a drain coupled to the second output of the first stage, and a gate coupled to the output of the second stage.

A track-and-hold circuit includes: a transistor, in which a base is connected to a signal input terminal, a power supply voltage is applied to a collector, and an emitter is connected to a first signal output terminal; a transistor in which a base is connected to the signal input terminal, the power supply voltage is applied to a collector, and an emitter is connected to a second signal output terminal; capacitors; a constant current source; and a switch circuit alternately turning the transistors to an ON state in response to differential clock signals.

The disclosure discloses a temperature compensation circuit and method for a neural network computing-in-memory array. Reference arrays sparsely inserted in the computing-in-memory array are adopted to provide a reference voltage for ADCs, so that an input voltage and a reference voltage of the ADCs have a same temperature coefficient. Finally, after analog-to-digital conversion by the ADC, the digital output of the ADC is not affected by the external temperature, thereby ensuring the operational precision of the neural network. According to the temperature compensation circuit of the disclosure, the reference arrays have the same structure as the computing-in-memory array. The insertion density of the reference arrays is related to the temperature field where the computing-in-memory arrays are located. One reference array may provide the reference voltage of the ADC for a plurality of computing-in-memory arrays, thereby minimizing the increase of area and power consumption caused by inserting the reference arrays.

The disclosure discloses a temperature compensation circuit and method for a neural network computing-in-memory array. Reference arrays sparsely inserted in the computing-in-memory array are adopted to provide a reference voltage for ADCs, so that an input voltage and a reference voltage of the ADCs have a same temperature coefficient. Finally, after analog-to-digital conversion by the ADC, the digital output of the ADC is not affected by the external temperature, thereby ensuring the operational precision of the neural network. According to the temperature compensation circuit of the disclosure, the reference arrays have the same structure as the computing-in-memory array. The insertion density of the reference arrays is related to the temperature field where the computing-in-memory arrays are located. One reference array may provide the reference voltage of the ADC for a plurality of computing-in-memory arrays, thereby minimizing the increase of area and power consumption caused by inserting the reference arrays.

Techniques and apparatus for output common-mode control of dynamic amplifiers, as well as analog-to-digital converters (ADCs) and other circuits implemented with such dynamic amplifiers. One example amplifier circuit includes a dynamic amplifier and a current source. The dynamic amplifier generally includes differential inputs, differential outputs, transconductance elements coupled to the differential inputs, a first set of capacitive elements coupled to the differential outputs, and a control input for controlling a time length of amplification for the dynamic amplifier. The current source is configured to generate an output current such that portions of the output current are selectively applied to the differential outputs of the dynamic amplifier during at least a portion of the time length of amplification.

An amplifier includes a first stage and a second stage. The first stage includes a first output, and a second output. The second stage includes a first transistor, a second transistor, and a common-mode circuit. The first transistor includes a drain coupled to the first output of the first stage. The second transistor includes a drain coupled to the second output of the first stage. The common-mode circuit includes a reversible current mirror circuit coupled to the drain of the first transistor and the drain of the second transistor.

An amplifier includes a first stage and a second stage. The first stage includes a first output, and a second output. The second stage includes a first transistor, a second transistor, and a common-mode circuit. The first transistor includes a drain coupled to the first output of the first stage. The second transistor includes a drain coupled to the second output of the first stage. The common-mode circuit includes a reversible current mirror circuit coupled to the drain of the first transistor and the drain of the second transistor.

An analog-to-digital conversion apparatus is provided. The analog-to-digital conversion apparatus includes an integrated circuit (IC) configured to generate a first interrupt request; and an analog-to-digital converter included in an integrated circuit, wherein the analog-to-digital converter is configured to receive a plurality of analog values from a plurality of channels, and convert at least a portion of the received analog values that correspond to at least a portion of channels of the plurality of channels, that are selected based on the first interrupt request into at least a portion of digital values.

An analog-to-digital conversion apparatus is provided. The analog-to-digital conversion apparatus includes an integrated circuit (IC) configured to generate a first interrupt request; and an analog-to-digital converter included in an integrated circuit, wherein the analog-to-digital converter is configured to receive a plurality of analog values from a plurality of channels, and convert at least a portion of the received analog values that correspond to at least a portion of channels of the plurality of channels, that are selected based on the first interrupt request into at least a portion of digital values.