An ADC circuit (50) is disclosed. It comprises a global input configured to receive an input voltage (V.sub.in) and a plurality of converter circuits (105.sub.1-105.sub.N). Each converter circuit (105.sub.j) comprises a comparator circuit (70.sub.j) having a first input connected to the global input, a second input, and an output configured to output a one-bit output signal of the comparator circuit (70.sub.j). Furthermore, each converter circuit (105.sub.j) comprises a one-bit current-output DAC (110.sub.j) having an input directly controlled from the output of the comparator circuit (70.sub.j) and an output connected to the second input of the comparator circuit (70.sub.j). The second inputs of all comparator circuits are interconnected. The ADC circuit (50) further comprises a digital output circuit (130) configured to generate an output signal z[n] of the ADC circuit (50) in response to the one-bit output signals of the comparator circuits (70.sub.j).

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

An input stage for an analog/digital converter, an analog/digital converter and a method for testing analog/digital converters with successive approximation are disclosed. At an input stage, an input signal is supplied via a first transistor arrangement of a sampling capacitor arrangement. The sampling capacitor arrangement can be optionally connected to ground or to a reference voltage by way of a second transistor arrangement and a switch apparatus.

Herein disclosed is an example analog-to-digital converter (ADC) and methods that may be performed by the ADC. The ADC may derive a first code that approximates a combination of an analog input value of the ADC and a dither value for the ADC sampled on a capacitor array. The ADC may further derive a second code to represent a residue of the combination with respect to the first code applied to the capacitor array. The ADC may combine the numerical value of the first code and the numerical value of the second code to produce a combined code applied to the capacitor array for deriving a digital output code. Combining the numerical value of the first code and the numerical value of the second code in the digital domain can provide for greater analog-to-digital (A/D) conversion linearity.

An analog-to-digital converter, including a sample/hold circuit; a reference voltage driver; a digital-to-analog converter; a comparator; and a logic circuit, wherein the reference voltage driver includes: a first voltage supplier circuit configured to output an external supply voltage provided from outside of the analog-to-digital converter; a second voltage supplier circuit configured to output a sampled reference voltage that is obtained during a sampling phase based on control signals received from the logic circuit; and a switching driver configured to electrically connect the first voltage supplier circuit to the digital-to-analog converter during a first conversion phase after the sampling phase based on the control signals received from the logic circuit, and to electrically connect the second voltage supplier circuit to the digital-to-analog converter during a second conversion phase based on the control signals received from the logic circuit.

A confined data communication system includes a reference generation circuit operable to produce one or more analog reference signals, an analog to digital converter circuit operable to process an analog signal to produce a digital representative signal, a digital filtering circuit operable to filter the digital representative signal to produce an affect value, a data processing module operable to interpret the affect value to produce processed output data, and a processing module operable to set frequency and waveform for each of the one or more analog reference signals, set digital filtering parameters for the digital filtering circuit, set a sampling rate for the analog to digital converter circuit, and set data interpretation parameters for the data processing module.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Describe is a buffer which comprises: a differential source follower coupled to a first input and a second input; first and second current steering devices coupled to the differential source follower; and a current source coupled to the first and second current steering devices. The buffer provides high supply noise rejection ratio (PSRR) together with high bandwidth.

A device is provided for time measurement of a clock-based signal comprising a sample stage comprising a switching device that is driven by a control signal and a capacitance (Cs), wherein the sample stage is arranged to transform an analog input signal in an analog output signal, the device further comprising an analog-to-digital converter to convert the analog output signal into a digital output signal, wherein the input signal applied to the sample stage is a reference signal and wherein the clock-based signal is applied to the control signal. Also, an according method is suggested.

Quantum repeater systems and apparatus for quantum communication. In one aspect, a system includes a quantum signal receiver configured to receive a quantum field signal; a quantum signal converter configured to: sample quantum analog signals from a quantum field signal received by the quantum signal receiver; encode sampled quantum analog signals as corresponding digital quantum information in one or more qudits, comprising applying a hybrid analog-digital encoding operation to each quantum analog signal and a qudit in an initial state; decode digital quantum information stored in the one or more qudits as a recovered quantum field signal, comprising applying a hybrid digital-analog decoding operation to each qudit and a quantum analog register in an initial state; a quantum memory comprising qudits and configured to store digital quantum information encoded by the quantum signal converter; and a quantum signal transmitter configured to transmit the recovered quantum field signal.