An integrated circuit includes a set of N unit analog-to-digital converters (ADCs) having a common architecture, and which provide an aggregate data rate. Moreover, the integrated circuit includes control logic that selects subsets of the set of N unit ADCs in order to realize sub-ADCs of different data rates that can each be an arbitrary integer multiple of an inverse of N times the aggregate data rate of the N unit ADCs. Furthermore, the control logic may dynamically select the subsets on the fly or on a frame-by-frame basis. This dynamically selection may occur at boot time and/or a runtime. Additionally, the given different data rate may correspond to one or more phases of a multi-phase clock in the integrated circuit, where the multiphase clock may include a number of phases corresponding to a number of possible subsets, and given selected subsets may not use all of the available phases.

An incremental analog-to-digital converter including a first-stage non-delay memorization element and other elements is disclosed. An ending time point of a second reset signal received by the first-stage non-delay memorization element is later than an ending time point of a first reset signal received by the other elements by at least one clock cycle, a reset duration of the first-stage non-delay memorization element is longer than a reset duration of the other element, so that the first-stage non-delay memorization element can be prevented from occurring overshoot or spike on an output thereof, and the incremental analog-to-digital converter can maintain a good signal-to-noise and distortion ratio under the condition that the internal elements has low swing limits.

An incremental analog-to-digital converter including a first-stage non-delay memorization element and other elements is disclosed. An ending time point of a second reset signal received by the first-stage non-delay memorization element is later than an ending time point of a first reset signal received by the other elements by at least one clock cycle, a reset duration of the first-stage non-delay memorization element is longer than a reset duration of the other element, so that the first-stage non-delay memorization element can be prevented from occurring overshoot or spike on an output thereof, and the incremental analog-to-digital converter can maintain a good signal-to-noise and distortion ratio under the condition that the internal elements has low swing limits.

A technique for generating analog waveforms includes combining a desired, in-band signal with a randomizing, out-of-band signal at an input of a DAC, operating the DAC to generate DAC output based on a combination of the desired signal and the randomizing signal, and filtering the DAC output to pass the desired signal while removing the randomizing signal.

An incremental analog-to-digital converter including a first-stage non-delay memorization element and other elements is disclosed. An ending time point of a second reset signal received by the first-stage non-delay memorization element is later than an ending time point of a first reset signal received by the other elements by at least one clock cycle, a reset duration of the first-stage non-delay memorization element is longer than a reset duration of the other element, so that the first-stage non-delay memorization element can be prevented from occurring overshoot or spike on an output thereof, and the incremental analog-to-digital converter can maintain a good signal-to-noise and distortion ratio under the condition that the internal elements has low swing limits.

An incremental analog-to-digital converter including a first-stage non-delay memorization element and other elements is disclosed. An ending time point of a second reset signal received by the first-stage non-delay memorization element is later than an ending time point of a first reset signal received by the other elements by at least one clock cycle, a reset duration of the first-stage non-delay memorization element is longer than a reset duration of the other element, so that the first-stage non-delay memorization element can be prevented from occurring overshoot or spike on an output thereof, and the incremental analog-to-digital converter can maintain a good signal-to-noise and distortion ratio under the condition that the internal elements has low swing limits.

An integrated circuit includes a set of N unit analog-to-digital converters (ADCs) having a common architecture, and which provide an aggregate data rate. Moreover, the integrated circuit includes control logic that selects subsets of the set of N unit ADCs in order to realize sub-ADCs of different data rates that can each be an arbitrary integer multiple of an inverse of N times the aggregate data rate of the N unit ADCs. Furthermore, the control logic may dynamically select the subsets on the fly or on a frame-by-frame basis. This dynamically selection may occur at boot time and/or a runtime. Additionally, the given different data rate may correspond to one or more phases of a multi-phase clock in the integrated circuit, where the multiphase clock may include a number of phases corresponding to a number of possible subsets, and given selected subsets may not use all of the available phases.

A rotation detector detecting rotation of a rotor, based on a signal produced according to rotation of the rotor, having a waveform according to a rotational cycle thereof, includes a signal obtaining unit to obtain two signals having phases different from each other; a vector operating unit to determine a vector according to a rotational angle of the rotor, based on the two signals; and a rotation detecting unit to detect rotation of the rotor, based on the vector. The two signals are produced from two elements located at positions farthest in a rotational angle of the rotor among plural rotation detecting elements located at positions different from each other.

An apparatus includes a processor, a Phase-Locked Loop Waveform Generator (PLLWG), a Voltage Controlled Oscillator (VCO), a demodulator, signal conditioning circuitry, and an Analog-to-Digital Converter (ADC). The processor generates control command signals, receives a digital data input signal, and performs spectrum analysis on the digital data input signal. The PLLWG is coupled to the processor, receives the control command signals, and generates a charge pump output signal based on the control command signals. The VCO is coupled to the PLLWG, receives a tuning signal based on the charge pump output signal, and outputs a VCO output signal based on the tuning signal. The demodulator receives an incoming modulated signal and the VCO output signal, and outputs an analog output signal based on the incoming modulated signal and the VCO output signal. The ADC converts the analog output signal into the digital data input signal.

An integrated circuit includes a set of N unit analog-to-digital converters (ADCs) having a common architecture, and which provide an aggregate data rate. Moreover, the integrated circuit includes control logic that selects subsets of the set of N unit ADCs in order to realize sub-ADCs of different data rates that can each be an arbitrary integer multiple of an inverse of N times the aggregate data rate of the N unit ADCs. Furthermore, the control logic may dynamically select the subsets on the fly or on a frame-by-frame basis. This dynamically selection may occur at boot time and/or a runtime. Additionally, the given different data rate may correspond to one or more phases of a multi-phase clock in the integrated circuit, where the multiphase clock may include a number of phases corresponding to a number of possible subsets, and given selected subsets may not use all of the available phases.