Aspects of the disclosure are directed to compensating for errors in in an analog-to-digital converter circuit (ADC). As may be implemented in accordance with one or more embodiments, an apparatus and/or method involves an ADC that converts an analog signal into a digital signal using an output from a digital-to-analog converter circuit (DAC). A compensation circuit generates a compensation output by, for respective signal portions provided to the DAC, generating a feedback signal based on an incompatibility between the conversion of the signal portions into an analog signal and the value of the signal portions provided to the DAC. A compensation output is generated based on the signal input to the DAC with a gain applied thereto, based on the feedback signal. Hereby, the digital inputs provided to the DACs are non-randomized.

There are provided a signal generation unit that generates a predetermined digital signal, a level conversion unit that converts a level of the digital signal generated by the signal generation unit, a DA converter that converts the digital signal of which the level is converted by the level conversion unit into an analog signal in a predetermined intermediate frequency bandwidth, and a control unit that creates correction data for correcting a linearity of a level of an output signal of the DA converter for all frequencies to be used, based on actual data which is data of a level of an actual output signal when a setting of the level of the output signal of the DA converter is changed at a predetermined level interval, at a predetermined frequency, and converts a level of an input signal of the DA converter with the correction data.

A calibration circuit, including: a signal generator circuit configured to generate a modulated analog input signal, which is based on a digital input word that is modulated; an Analog-to-Digital Converter (ADC) configured to convert an analog reference signal to a digital calibration word, wherein the analog reference signal is a low-pass-filtered version of the analog input signal generated by the signal generator circuit; and a feedback circuit configured to output the digital input word by adjusting the digital calibration word depending on a digital feedback signal, which is based on a modulated version of the analog reference signal, wherein the signal generator circuit, the ADC, and the feedback circuit are provided on a same chip.

A time constant calibration circuit and method. The circuit comprises a resistor, a capacitor, an amplifier, a first switch and a second switch. The resistance of the resistor and/or the capacitance of the capacitor is variable. A first terminal of the resistor, a first terminal of the capacitor and a first input of the amplifier are coupled to a common node, which is coupleable to a reference current source. A second input of the amplifier is coupleable to a reference voltage. An output of the amplifier is coupled to a second terminal of the resistor and a second terminal of the capacitor. The circuit can perform a calibration process comprising one or more calibration cycles in which the switches route a reference current through the resistor in a first phase and through the capacitor in a second phase. The resistance and/or the capacitance is adjusted between calibration cycles.

A time constant calibration circuit and method. The circuit comprises a resistor, a capacitor, an amplifier, a first switch and a second switch. The resistance of the resistor and/or the capacitance of the capacitor is variable. A first terminal of the resistor, a first terminal of the capacitor and a first input of the amplifier are coupled to a common node, which is coupleable to a reference current source. A second input of the amplifier is coupleable to a reference voltage. An output of the amplifier is coupled to a second terminal of the resistor and a second terminal of the capacitor. The circuit can perform a calibration process comprising one or more calibration cycles in which the switches route a reference current through the resistor in a first phase and through the capacitor in a second phase. The resistance and/or the capacitance is adjusted between calibration cycles.

A MASH type sigma delta AD converter includes a modulator, an analog filter filtering an extraction signal obtained by extracting a probe signal and an quantization error generated in a quantizer within a sigma delta modulator, a low speed AD converter performing an AD conversion of an output signal of the analog filter, a first adaptive filter searching for a transfer function of the sigma delta modulator, a second adaptive filter searching for a transfer function from an output of the modulator to the low speed AD converter via the analog filter, and a noise cancellation circuit cancelling the probe signal and the quantization error included in an output signal of the quantizer using the search results by the first and second adaptive filters.

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

Described is an apparatus which comprises: a first integrator to receive an input signal and to generate a first output; a second integrator to receive the first output or a version of the first output and to generate a second output; and an analog-to-digital converter (ADC) to quantize the second output into a digital representation, the ADC including a detection circuit to detect an overload condition in the second output.

A MASH type sigma delta AD converter includes a modulator, an analog filter filtering an extraction signal obtained by extracting a probe signal and an quantization error generated in a quantizer within a sigma delta modulator, a low speed AD converter performing an AD conversion of an output signal of the analog filter, a first adaptive filter searching for a transfer function of the sigma delta modulator, a second adaptive filter searching for a transfer function from an output of the modulator to the low speed AD converter via the analog filter, and a noise cancellation circuit cancelling the probe signal and the quantization error included in an output signal of the quantizer using the search results by the first and second adaptive filters.

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.