Disclosed are an analog-to-digital converter error shaping circuit and a successive approximation analog-to-digital converter. The analog-to-digital converter error shaping circuit includes a decentralized capacitor array, a data weighted average module, a mismatch error shaping module, a control logic generation circuit, a digital filter and a decimator. The decentralized capacitor array includes two symmetrically arranged capacitor array units, each capacitor array unit includes a first sub-capacitor array of a high segment bit and a second sub-capacitor array of a low segment bit. The data weighted average module is configured to eliminate correlation between the first sub-capacitor array and an input signal, and the mismatch error shaping module is configured to eliminate correlation between the second sub-capacitor array and the input signal.

Methods, systems, and devices for thermometer coding for driving non-binary signals are described. A set of drivers may be used to drive a signal line, with each of the drivers calibrated to have different individual drive strengths. To drive a signal line to successive voltages in accordance with a non-binary modulation scheme, additional individual drivers of the set may be used. The different drive strengths of the individual drivers of the set may scale in non-linear fashion, which may offset non-linearities associated with the individual drivers as additional individual drivers of the set are activated.

A dynamic element method includes the following operations: summing up most significant bits of a digital code in a previous period and a pointer signal in the previous period, in order to generate a first signal; outputting the first signal to be an adjusted pointer signal according to a clock signal; and decoding the adjusted pointer signal to be control signals, in which the control signals are configured to set corresponding relations of components of a first digital to analog converter circuits and the most significant bits, in order to utilize the components to convert the most significant bits.

A digital-to-analog conversion circuit includes a first digital-to-analog converter (DAC) and a second DAC. The first DAC includes a first current generation circuit (CGC) and a first current-to-voltage converter. The first CGC generates a first current based on a first digital code received through a first terminal to provide the first current to an output node. The second DAC includes a second CGC and a second current-to-voltage converter. The second CGC generates a second current based on a second digital code received through a second input terminal to provide the second current to the output node. The first current-to-voltage converter and the second current-to-voltage converter convert a sum of the first current and the second current to a an analog voltage corresponding to a sum of the first digital code and the second digital code, and output the analog voltage at the output node.

A PAM-4 receiver with jitter compensation clock and data recovery is provided. The receiver includes a first-order delay-locked loop (DLL) which employs a bang-bang phase detector (BBPD) and a voltage-controlled delay line (VCDL) circuit supporting 40 MHz jitter tracking bandwidth and static phase skew elimination. A second-order wideband phase-locked loop (WBPLL) using the ¼-rate reference clock provides multi-phase clock generation with low input-to-output latency. To suppress the consequent jitter transfer, a jitter compensation circuit (JCC) acquires the jitter transfer amplitude and frequency information by detecting the DLL loop filter voltage (VLF(s)) signal, and generates an inverted loop filter voltage signal, denoted as VLF.sub.INV(s). The VLF.sub.INV(S) modulates a group of complementary VCDLs (C-VCDLs) to attenuate the jitter transfer on both recovered clock and data. With the provided receiver, a jitter compensation ratio up to 60% can be supported from DC to 4 MHz, with a −3-dB corner frequency of 40 MHz.

A clock generator includes an input coupled to receive an input clock signal from a first clock source, and a noise rejection circuit configured to provide an output clock signal based on the input clock signal. The noise rejection circuit includes an event generator having a digital counter circuit. The event generator is configured to generate a first event signal based on a count value of the digital counter circuit, in which the noise rejection circuit is configured to produce an edge on the output clock signal in response to both the event signal and a state of the input clock signal.

A data weighted averaging (DWA) data word in a standard or normal form unary code format is first converted to a thermometer control word in an alternative or spatial form unary code format. The thermometer control word is then converted from the alternative or spatial form unary code format to output a corresponding binary word.

Methods, systems, and devices for thermometer coding for driving non-binary signals are described. A set of drivers may be used to drive a signal line, with each of the drivers calibrated to have different individual drive strengths. To drive a signal line to successive voltages in accordance with a non-binary modulation scheme, additional individual drivers of the set may be used. The different drive strengths of the individual drivers of the set may scale in non-linear fashion, which may offset non-linearities associated with the individual drivers as additional individual drivers of the set are activated.

The disclosure describes an implementation of a combinational thermometric-R2R that includes a thermometric DAC circuit to output the coarse output steps, an R2R circuit to control the fine output steps, and a resistor in series with the thermometric and R2R circuits. The techniques of this disclosure implement a fine resolution DAC, on the order of two nanoamps per bit, that operates at low current, yet maintains monotonicity throughout the DAC output range.

A digitally selectable power gate with thermometer-encoded upper bits may provide solutions for problems digital power gate-based regulators. These solutions may include the use of a fully binary power gate, either in structure or by local decoding of binary control signal to an addressable row-based power gate. This provides improved performance over a row-based code rotation, which is intended to avoid instantaneous overheating of power gate devices but may not mitigate aging effects. Another solution includes ganging a primary DLVR and one or more secondaries. The primary DLVR may include a voltage sense and active controller, which may forward its PG code to secondary instances. Therm and current sensor rotation may be performed locally at the secondaries and a current monitor data may be rolled up from all ganged DLVRs.