A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.

An image data generation apparatus includes circuitry configured to refer to image processing association information in which a plurality of image defect types is associated with a plurality of different image processing, respectively; apply, to image data, image processing selected from the plurality of different image processing in accordance with an image defect type included in the image data; and generate processed image data from the image data.

An image data generation apparatus includes circuitry configured to refer to image processing association information in which a plurality of image defect types is associated with a plurality of different image processing, respectively; apply, to image data, image processing selected from the plurality of different image processing in accordance with an image defect type included in the image data; and generate processed image data from the image data.

A photoelectric conversion device includes a generation circuit and a controller. The generation circuit generates an image signal according to an intensity of light being input. The controller controls the generation circuit to generate a dark-time image signal equivalent to an image signal generated by the generation circuit without exposure to external light.

A photoelectric conversion device includes a generation circuit and a controller. The generation circuit generates an image signal according to an intensity of light being input. The controller controls the generation circuit to generate a dark-time image signal equivalent to an image signal generated by the generation circuit without exposure to external light.