An image sensor is provided. The image sensor may include an active pixel electrically connected to a column line and configured to provide an output voltage to a pixel node and a bias circuit electrically connected between the pixel node and an earth terminal, and in which a first current flows through a first line electrically connected to the pixel node, wherein the bias circuit includes a first variable capacitor electrically connected to a power supply voltage, and a second variable capacitor electrically connected to the earth terminal, and the magnitude of the first current may be configured to vary based on a ratio of a capacitance of the first variable capacitor to a capacitance of the second variable capacitor. The output voltage may be configured to be adjusted based on the magnitude of the first current.

An image sensor compensates for noise. The image sensor includes a pixel array that includes a common monitor output line, a first monitoring pixel outputting a first monitoring signal, a second monitoring pixel outputting a second monitoring signal, and an active pixel configured to output a sensing signal based on an incident light. The image circuit also includes a binning circuit that receives the first and second monitoring signals through the common monitor output line and generates an average monitoring signal by performing binning on the first and second monitoring signals, and an analog-to-digital converter that detects an alternating current (AC) component of the average monitoring signal and couples the sampled AC component of the average monitoring signal to the sensing signal, thereby compensating for noise.

A solid-state imaging device is provided. The solid-state imaging device includes an imaging region having a plurality of pixels arranged on a semiconductor substrate, in which each of the pixels includes a photoelectric converting portion and a charge converting portion for converting a charge generated by photoelectric conversion into a pixel signal and blooming is suppressed by controlling a substrate voltage of the semiconductor substrate.

This invention provides an imaging apparatus comprising a storage storing correction values, a correction circuit which corrects captured image data based on the correction values, a first memory and a second memory, a transferring circuit which transfers the correction values in the storage to the correction circuit, a write circuit which writes the transferred correction values to either the first memory or the second memory, and a controller which controls, in a case where a transfer time of the correction values is longer than a time for image capture processing of one frame, so that, over an image capturing period of a plurality of frames, the write circuit writes new correction values to one of the first and second memory and the correction circuit corrects the captured image data using the current correction values in the other memory.

An image sensor compensates for noise. The image sensor includes a pixel array that includes a common monitor output line, a first monitoring pixel outputting a first monitoring signal, a second monitoring pixel outputting a second monitoring signal, and an active pixel configured to output a sensing signal based on an incident light. The image circuit also includes a binning circuit that receives the first and second monitoring signals through the common monitor output line and generates an average monitoring signal by performing binning on the first and second monitoring signals, and an analog-to-digital converter that detects an alternating current (AC) component of the average monitoring signal and couples the sampled AC component of the average monitoring signal to the sensing signal, thereby compensating for noise.

In described examples, a circuit includes an integrator. The integrator receives an input signal. A first sampling network is coupled to the integrator and generates a signal voltage. A second sampling network is coupled to the integrator and generates a pixel sampled noise voltage. The pixel sampled noise voltage generated in a previous cycle is subtracted from the signal voltage generated in a current cycle to generate a true signal voltage.

In described examples, a circuit includes an integrator. The integrator receives an input signal. A first sampling network is coupled to the integrator and generates a signal voltage. A second sampling network is coupled to the integrator and generates a pixel sampled noise voltage. The pixel sampled noise voltage generated in a previous cycle is subtracted from the signal voltage generated in a current cycle to generate a true signal voltage.

This invention provides an imaging apparatus comprising a storage storing correction values, a correction circuit which corrects captured image data based on the correction values, a first memory and a second memory, a transferring circuit which transfers the correction values in the storage to the correction circuit, a write circuit which writes the transferred correction values to either the first memory or the second memory, and a controller which controls, in a case where a transfer time of the correction values is longer than a time for image capture processing of one frame, so that, over an image capturing period of a plurality of frames, the write circuit writes new correction values to one of the first and second memory and the correction circuit corrects the captured image data using the current correction values in the other memory.

An image sensor compensates for noise. The image sensor includes a pixel array that includes a common monitor output line, a first monitoring pixel outputting a first monitoring signal, a second monitoring pixel outputting a second monitoring signal, and an active pixel configured to output a sensing signal based on an incident light. The image circuit also includes a binning circuit that receives the first and second monitoring signals through the common monitor output line and generates an average monitoring signal by performing binning on the first and second monitoring signals, and an analog-to-digital converter that detects an alternating current (AC) component of the average monitoring signal and couples the sampled AC component of the average monitoring signal to the sensing signal, thereby compensating for noise.

An image sensor is provided. The image sensor may include an active pixel electrically connected to a column line and configured to provide an output voltage to a pixel node and a bias circuit electrically connected between the pixel node and an earth terminal, and in which a first current flows through a first line electrically connected to the pixel node, wherein the bias circuit includes a first variable capacitor electrically connected to a power supply voltage, and a second variable capacitor electrically connected to the earth terminal, and the magnitude of the first current may be configured to vary based on a ratio of a capacitance of the first variable capacitor to a capacitance of the second variable capacitor. The output voltage may be configured to be adjusted based on the magnitude of the first current.