Patent classifications
H05B41/2813
Systems and methods for extending a lifespan of an excimer lamp
System and/or method generally relate to extending a lifespan of an excimer lamp. The system includes a ultra-violet (UV) light having a pair of dielectrics configured to separate electrodes. One of the electrodes includes a metal mesh. The system includes a power supply electrically coupled to the UV light and configured to deliver electrical power to the UV light. The system includes a temperature sensor operably coupled to the UV light. The temperature sensor is configured to generate a temperature signal indicative of a temperature of the UV light. The system includes at least one processor. The at least one processor is configured to determine a temperature of the UV light based on the temperature signal, and adjust the electrical power delivered to the UV light based on the temperature signal.
SYSTEMS AND METHODS FOR EXTENDING A LIFESPAN OF AN EXCIMER LAMP
System and/or method generally relate to extending a lifespan of an excimer lamp. The system includes a ultra-violet (UV) light having a pair of dielectrics configured to separate electrodes. One of the electrodes includes a metal mesh. The system includes a power supply electrically coupled to the UV light and configured to deliver electrical power to the UV light. The system includes a temperature sensor operably coupled to the UV light. The temperature sensor is configured to generate a temperature signal indicative of a temperature of the UV light. The system includes at least one processor. The at least one processor is configured to determine a temperature of the UV light based on the temperature signal, and adjust the electrical power delivered to the UV light based on the temperature signal.
Quick-action leakage detection protection circuit having regular self-checking function
A quick-action leakage detection protection circuit with a regular self-checking function is provided. The quick-action leakage detection protection circuit may include a power input end, a power load end, a power user end, twin induction coils for detecting leakage current and low resistance failure, a control chip, a trip coil in which an iron core is disposed, a reset button, a self-checking chip, and a self-checking silicon controlled rectifier. The reset button may be linked with a main circuit switch, an analog path switch, and a normally-open self-checking path switch. The main circuit switch may include a pair of dynamic contact levers extended from the power load end, a first pair of static contact ends extended from the power input end passing through the twin induction coils, and a second pair of static contact ends extended from the power user end. In some embodiments, a first end of the trip coil may be connected to a live line end of the power input end and to the live line of the power load end via the first normally-closed switch. And, a second end of the trip coil may be connected to a neutral line end of the power load end via a second normally-closed switch.
Electrical ballast and driving method thereof
An electrical ballast includes an inverter circuit and a detection circuit. The inverter circuit is configured to receive a dc voltage and provide an output voltage to a lighting module. The detection circuit is electrically coupled to the inverter circuit and a voltage source, and configured to detect an ac voltage signal in the inverter circuit, and pull down the voltage source from a supply level to an under voltage locking level to shut down the inverter circuit on the condition that the ac voltage signal is greater than a threshold value, and restart the inverter circuit after a delay period.
Systems and methods for extending a lifespan of an excimer lamp
System and/or method generally relate to extending a lifespan of an excimer lamp. The system includes a ultra-violet (UV) light having a pair of dielectrics configured to separate electrodes. One of the electrodes includes a metal mesh. The system includes a power supply electrically coupled to the UV light and configured to deliver electrical power to the UV light. The system includes a temperature sensor operably coupled to the UV light. The temperature sensor is configured to generate a temperature signal indicative of a temperature of the UV light. The system includes at least one processor. The at least one processor is configured to determine a temperature of the UV light based on the temperature signal, and adjust the electrical power delivered to the UV light based on the temperature signal.
QUICK-ACTION LEAKAGE DETECTION PROTECTION CIRCUIT HAVING REGULAR SELF-CHECKING FUNCTION
A quick-action leakage detection protection circuit with a regular self-checking function is provided. The quick-action leakage detection protection circuit may include a power input end, a power load end, a power user end, twin induction coils for detecting leakage current and low resistance failure, a control chip, a trip coil in which an iron core is disposed, a reset button, a self-checking chip, and a self-checking silicon controlled rectifier. The reset button may be linked with a main circuit switch, an analog path switch, and a normally-open self-checking path switch. The main circuit switch may include a pair of dynamic contact levers extended from the power load end, a first pair of static contact ends extended from the power input end passing through the twin induction coils, and a second pair of static contact ends extended from the power user end. In some embodiments, a first end of the trip coil may be connected to a live line end of the power input end and to the live line of the power load end via the first normally-closed switch. And, a second end of the trip coil may be connected to a neutral line end of the power load end via a second normally-closed switch.
Method for lighting high-pressure discharge lamp
A method for lighting a high-pressure discharge lamp that is configured to change a power to be supplied to the high-pressure discharge lamp in accordance with a luminance parameter of an image content is disclosed. In the method, halogen is encapsulated in an internal space of an arc tube part of the high-pressure discharge lamp with an excessive volume with respect to a capacity of the internal space such that a halogen cycle is established when part of mercury deposits without vaporizing, and the internal space is configured to be kept at a higher temperature than a blackening temperature that is lower than a deposition temperature of the mercury and causes remarkable blackening on an inner wall of the arc tube part.