Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

A disposable x-ray side marker (100) comprises a non-metallic material (108) having a sufficiently high linear attenuation coefficient to be radiographically visible. The material (108) may be mouldable, and may be or comprise gypsum. The material (108) may have an average atomic number greater than or equal to 11, and may have a linear attenuation coefficient greater than that of mammalian soft tissue.

An industrial X-ray imaging apparatus including: an X-ray source; an X-ray detector configured to detect X-rays emitted from the X-ray source; a stage which is disposed between the X-ray source and the X-ray detector and is configured to support a subject; and a shielding chamber configured to accommodate the X-ray source, the X-ray detector, and the stage, in which the shielding chamber includes a door for carrying in and out the subject, and a lock mechanism for prohibiting the door from changing to an open state, and in which the X-ray imaging apparatus further includes an unlocking control unit configured to control unlocking of the lock mechanism based on a leakage dose leaking from the shielding chamber to an outside.

In capturing an image of a grid by an image detector, a measurement pixel that is not in the position of a specific point having a maximum or minimum value of an output signal is referred to as a first measurement pixel, and a measurement pixel that is in the position of the specific point is referred to as a second measurement pixel. The disposition of the first and second measurement pixels are determined so as to satisfy the following condition: fG/fN≠odd number, wherein fG is a grid frequency and fN is a Nyquist frequency of pixels; and in shifting the grid C times by one pixel, the number of the first measurement pixels is larger than that of the second measurement pixels at any time in the range of a cycle C of a repetition pattern appearing in the image.

In capturing an image of a grid by an image detector, a measurement pixel that is not in the position of a specific point having a maximum or minimum value of an output signal is referred to as a first measurement pixel, and a measurement pixel that is in the position of the specific point is referred to as a second measurement pixel. The disposition of the first and second measurement pixels are determined so as to satisfy the following condition: fG/fN≠odd number, wherein fG is a grid frequency and fN is a Nyquist frequency of pixels; and in shifting the grid C times by one pixel, the number of the first measurement pixels is larger than that of the second measurement pixels at any time in the range of a cycle C of a repetition pattern appearing in the image.

An image detector is disposed behind a grid. The image detector has normal pixels and measurement pixels. Out of a group of measurement pixels based on which an average value of dose measurement signals is calculated, a [C/D] number of measurement pixels are disposed or chosen in a cycle Z=(R×C)±D. Wherein, C represents a cycle of a repetition pattern appearing in an arrangement direction of X-ray transparent layers and X-ray absorbing layers in an X-ray image of the grid, and is represented in units of the number of pixels. R represents a natural number of 0 or more. D represents an integer less than the cycle C. [C/D] represents a maximum integer equal to or less than C/D. Provided that at least the [C/D] number of measurement pixels are shifted C occasions by one pixel, if D=1, the average value of the dose measurement signals is invariable without any variations.

An image detector is disposed behind a grid. The image detector has normal pixels and measurement pixels. Out of a group of measurement pixels based on which an average value of dose measurement signals is calculated, a [C/D] number of measurement pixels are disposed or chosen in a cycle Z=(R×C)±D. Wherein, C represents a cycle of a repetition pattern appearing in an arrangement direction of X-ray transparent layers and X-ray absorbing layers in an X-ray image of the grid, and is represented in units of the number of pixels. R represents a natural number of 0 or more. D represents an integer less than the cycle C. [C/D] represents a maximum integer equal to or less than C/D. Provided that at least the [C/D] number of measurement pixels are shifted C occasions by one pixel, if D=1, the average value of the dose measurement signals is invariable without any variations.

Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.

Some embodiments of the present disclosure provide a method that includes colliding a laser with an electron beam to produce backscattered x-rays while the electron beam is traversing a circular arc. This backscattering process is inverse Compton scattering (ICS). ICS x-rays are emitted in the same direction as the electrons. Because this ICS direction is changing as a function of time, the position of the x-ray beam on a detector will change depending on the timing of electron/laser collision. This position change is easily detected and converted to a timing measurement sensitive at the femtosecond scale, converting a very difficult timing measurement of laser pulse, electron pulse, and x-ray pulse synchronization into a simple and robust position measurement.