Beam current variation system for a cyclotron, arranged in the inner center of the cyclotron, downstream from the ion source generating the charged particle beam, the system comprising a deflector system powered by a voltage and a collimator. The beam is dumped in the collimator, if the deflector system (10; 20, 21) is not powered, and the beam is switched on by powering the deflector system with a voltage.

A device for modulating the intensity of a charged particle beam emitted along an axis, comprises 4N consecutive deflection systems, with N=1 or 2, with the deflection systems being positioned along the axis of said particle beam, and being capable of deflecting the beam relative to the axis in the same direction, with alternating directions of deflection, for two consecutive systems, means for applying a force for deflecting the beam for each deflection system and for varying the applied force; two collimators each having a slot with an opening that increases in width from the center towards the periphery, located respectively between the first and second deflection systems and between the third and fourth deflection systems, with the opening of the slot of the first collimator facing towards one side of the emission axis of the beam, with the opening of the slot of the second collimator facing towards the opposite side of the emission axis of the beam.

A device for modulating the intensity of a charged particle beam emitted along an axis, comprises 4N consecutive deflection systems, with N=1 or 2, with the deflection systems being positioned along the axis of said particle beam, and being capable of deflecting the beam relative to the axis in the same direction, with alternating directions of deflection, for two consecutive systems, means for applying a force for deflecting the beam for each deflection system and for varying the applied force; two collimators each having a slot with an opening that increases in width from the center towards the periphery, located respectively between the first and second deflection systems and between the third and fourth deflection systems, with the opening of the slot of the first collimator facing towards one side of the emission axis of the beam, with the opening of the slot of the second collimator facing towards the opposite side of the emission axis of the beam.

The charged particle storage system includes: a storage ring circulating, by a perturbating device, charged particles injected from outside; a power source supplying an electric current to the perturbating device; and a charged particle beam generating device. The charged particle beam generating device includes a DC accelerator that generates a constant voltage to accelerate electrons and thereby generates a beam of the electrons. While a current having its current intensity changing in a sinusoidal wave is caused to flow through the perturbating device continuously for at least 10 s by a power source, an electron beam output from the charged particle beam generating device is injected to the storage ring continuously for at least 10 s. Thus, a current larger than that stored by the conventional resonance injection method can be stored in the storage ring, and an X-ray having higher intensity can be generated.