A downhole tool may include a voltage multiplier within a housing. The voltage multiplier may transform input power to the downhole tool from a first voltage to a second voltage higher than the first. The downhole tool may also include multiple shielding rings surrounding at least the voltage multiplier to reduce electric field stresses within the downhole tool. Additionally, the downhole tool may include an insulator located between the shielding rings and the housing.

A downhole tool may include a voltage multiplier within a housing. The voltage multiplier may transform input power to the downhole tool from a first voltage to a second voltage higher than the first. The downhole tool may also include multiple shielding rings surrounding at least the voltage multiplier to reduce electric field stresses within the downhole tool. Additionally, the downhole tool may include an insulator located between the shielding rings and the housing.

Embodiments of systems, devices, and methods relate to an ion beam source system. An ion source is configured to provide a negative ion beam to a tandem accelerator system downstream of the ion source, and a modulator system connected to an extraction electrode of the ion source is configured to bias the extraction electrode for a duration sufficient to maintain acceleration voltage stability of the tandem accelerator system.

To provide a functional membrane for ion beam transmission capable of enhancing ion beam transmittance and improving beam emittance. A functional membrane for ion beam transmission according to the present invention is used in a beam line device through which an ion beam traveling in one direction passes and has a channel. The axis of the channel is substantially parallel to the travel direction of the ion beam.

According to some embodiments, an electrostatic particle accelerator may include an assembly having a motor and support plate; an acceleration tube; one or more stage assemblies each having an alternator coupled to a common drive shaft, a power supply coupled to one of the plurality of electrodes, and an opening to receive a portion of the acceleration tube; a pressure vessel configured to enclose the acceleration tube when the pressure vessel is fastened to the support plate; and a circulator configured to pump high pressure gas into the pressure vessel. The acceleration tube can include an ion source, an extraction assembly, and a plurality of tube segments each having a plurality of electrodes and one or more power connectors attached to one of the electrodes.

According to some embodiments, an electrostatic particle accelerator may include an assembly having a motor and support plate; an acceleration tube; one or more stage assemblies each having an alternator coupled to a common drive shaft, a power supply coupled to one of the plurality of electrodes, and an opening to receive a portion of the acceleration tube; a pressure vessel configured to enclose the acceleration tube when the pressure vessel is fastened to the support plate; and a circulator configured to pump high pressure gas into the pressure vessel. The acceleration tube can include an ion source, an extraction assembly, and a plurality of tube segments each having a plurality of electrodes and one or more power connectors attached to one of the electrodes.

Embodiments of systems, devices, and methods relating to a beam system. An example beam system includes a charged particle source configured to generate a beam of charged particles, a pre-accelerator system configured to accelerate the beam, and an accelerator configured to accelerate the beam from the pre-accelerator system. The pre-accelerator system can cause the beam to converge as it is propagated from the source to an input aperture of the accelerator. The pre-accelerator system can further reduce or eliminate source disturbance or damage caused by backflow traveling from the accelerator toward the source.

Embodiments of systems, devices, and methods relating to a beam system. An example beam system includes a charged particle source configured to generate a beam of charged particles, a pre-accelerator system configured to accelerate the beam, and an accelerator configured to accelerate the beam from the pre-accelerator system. The pre-accelerator system can cause the beam to converge as it is propagated from the source to an input aperture of the accelerator. The pre-accelerator system can further reduce or eliminate source disturbance or damage caused by backflow traveling from the accelerator toward the source.

A downhole tool may include a voltage multiplier within a housing. The voltage multiplier may transform input power to the downhole tool from a first voltage to a second voltage higher than the first. The downhole tool may also include multiple shielding rings surrounding at least the voltage multiplier to reduce electric field stresses within the downhole tool. Additionally, the downhole tool may include an insulator located between the shielding rings and the housing.

A downhole tool may include a voltage multiplier within a housing. The voltage multiplier may transform input power to the downhole tool from a first voltage to a second voltage higher than the first. The downhole tool may also include multiple shielding rings surrounding at least the voltage multiplier to reduce electric field stresses within the downhole tool. Additionally, the downhole tool may include an insulator located between the shielding rings and the housing.