Method for fabricating an encapsulated electronic package using a supporting plate

11195812 · 2021-12-07

Assignee

Inventors

Cpc classification

International classification

Abstract

A method for fabricating an electronic package is provided. A plurality of packaging structures are provided, each of which having a carrier and at least one electronic component disposed on the carrier. The plurality of packaging structures are disposed on a supporting plate. An encapsulation layer is formed on the supporting plate and encapsulates the plurality of packaging structures. Even if there are various types of electronic packages of different specifications in the market, the molds that the encapsulation layer uses can still be developed for a supporting plate of a certain specification. Therefore, the fabrication cost of the electronic package is reduced.

Claims

1. A method for fabricating an electronic package, comprising: providing a plurality of packaging structures, each of which comprising: a carrier including a wiring layer and having a first surface and a second surface opposing the first surface; and at least one electronic component disposed on the first surface of the carrier and electrically connected to the wiring layer; placing the plurality of packaging structures on a supporting plate, with the second surfaces of any two neighboring ones of the carriers facing the supporting plate and spaced apart from each other on the supported plate; forming on the supporting plate an encapsulation layer encapsulating the plurality of packaging structures; and removing the supporting plate.

2. The method of claim 1, wherein the second surface of the carrier is bonded to the supporting plate via a bonding layer.

3. The method of claim 1, wherein the supporting plate is an adhesive tape or a metal plate.

4. The method of claim 1, wherein the supporting plate is rectangular or circular.

5. The method of claim 1, further comprising disposing a stiffener on an edge of the supporting plate.

6. The method of claim 1, wherein the electronic component is exposed from the encapsulation layer.

7. The method of claim 1, further comprising disposing a plurality of conductive elements on the second surface of the carrier.

8. The method of claim 1, further comprising performing a singulation process after removing the supporting plate.

9. The method of claim 8, wherein the encapsulation layer encapsulates a side surface of the carrier after performing the singulation process, and the side surface is adjacent to the first surface and the second surface of the carrier.

10. The method of claim 8, wherein the encapsulation layer does not encapsulate a side surface of the carrier after performing the singulation process, and the side surface is adjacent to the first surface and the second surface of the carrier.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a cross-sectional view of a semiconductor package according to prior art.

(2) FIGS. 2A to 2F are cross-sectional views illustrating a method for fabricating an electronic package according to the present disclosure.

(3) FIG. 2D′ is a cross-sectional view of another embodiment of FIG. 2D.

(4) FIGS. 2F′ and 2F″ are cross-sectional views of different embodiments of FIG. 2F.

DETAILED DESCRIPTION

(5) The following illustrative embodiments are provided to illustrate the present disclosure, these and other advantages and effects can be apparently understood by those in the art after reading the disclosure of this specification. The present disclosure can also be performed or applied by other different embodiments. The details of the specification may be on the basis of different points and applications, and numerous modifications and variations can be devised without departing from the spirit of the present disclosure.

(6) FIGS. 2A to 2F are cross-sectional views illustrating a method for fabricating an electronic package 2 according to the present disclosure.

(7) As shown in FIG. 2A, a plurality of packaging structures 2a are provided. Each of the packaging structures 2a has a carrier 20 and at least one electronic component 21. The carrier 20 has a first surface 20a and a second surface 20b opposing the first surface 20a. The electronic component 21 is disposed on the first surface 20a of the carrier 20 and electrically connected to the carrier 20.

(8) In an embodiment, the carrier 20 is a packaging substrate that has a core layer and a circuit structure, or a coreless circuit structure. For the circuit structure, a circuit layer (not shown), such as a fan out redistribution layer (RDL), is formed on a dielectric material. In an embodiment, the dielectric material is polybenzoxazole (PBO), polyimide (PI), prepreg (PP), etc. In another embodiment, the carrier 20 is a carrying unit, such as a lead-frame, a silicon interposer, etc., that carries an electronic component, such as a chip.

(9) In an embodiment, the electronic component 21 is an active element, such as a semiconductor chip, a passive element, such as a resistor, a capacitor and an inductor, or a combination thereof. In another embodiment, the electronic component 21 is a semiconductor chip and has an active surface 21a and an inactive surface 21b opposing the active surface 21a, a plurality of electrode pads (not shown) are disposed on the active surface 21a and electrically connected via the plurality of conductive bumps 22 in a flip-chip manner to a wiring layer of the carrier 20, and an underfill 23 encapsulates the conductive bumps 22. In yet another embodiment, the inactive surface 21b of the electronic component 21 is disposed on the first surface 20a of the carrier 20, and the electrode pads are electrically connected to the wiring layer in a wire bonding manner via a plurality of solder wires (not shown). In still another embodiment, the electronic component 21 is in direct contact with (e.g., electrode pads of a chip bonded to contact pads of a substrate) and electrically connected to the wiring layer. In further another embodiment, the electronic component 21 is electrically connected to the carrier 20 in other manners.

(10) As shown in FIG. 2B, the second surfaces 20b of the carriers 20 of the plurality of packaging structures 2a are disposed on the supporting plate 9, and any two neighboring ones of the plurality of packaging structures 2a are spaced apart at an interval t on the supporting plate 9.

(11) In an embodiment, the second surface 20b of the carrier 20 is bonded via a bonding layer 24 to the supporting plate 9. In another embodiment, the bonding layer 24 is adhesive, such as an adhesive tape or a release film.

(12) In an embodiment, the supporting plate 9 is an adhesive tape or a metal plate. In another embodiment, the supporting plate 9 is in a panel form or a strip form. In yet another embodiment, the supporting plate 9 is rectangular or circular.

(13) In an embodiment, a stiffener 8 is disposed on an edge of the supporting plate 9. In another embodiment, the stiffener 8 is a metal frame, a wall or a pillar.

(14) As shown in FIG. 2C, an encapsulation layer 25 is formed on the supporting plate 9 and encapsulates the packaging structures 2a.

(15) In an embodiment, the encapsulation layer 25 is a molding underfill (MUF), and is made of polyimide (PI), a dry film, epoxy or a molding compound. In another embodiment, the encapsulation layer 25 is formed by a liquid compound, injection, lamination or compression molding on the supporting plate 9.

(16) In an embodiment, the electronic component 21 is exposed from the encapsulation layer 25. In another embodiment, an upper surface of the encapsulation layer 25 is flush with the inactive surface 21b of the electronic component in a leveling process, and the inactive surface 21b of the electronic component is exposed from the encapsulation layer 25. In yet another embodiment, the leveling process removes a portion of the encapsulation layer 25 (as indicated by a dashed line in FIG. 2C) by grinding.

(17) As shown in FIG. 2D, the supporting plate 9 is removed, to expose a lower surface of the encapsulation layer 25 and a lower surface of the bonding layer 24 (or a bottom surface of the stiffener 8).

(18) In another embodiment, as shown in FIG. 2D′, the bonding layer 24 is removed so as to expose the second surface 20b of the carrier 20.

(19) As shown in FIG. 2E, following the fabrication step of FIG. 2D, a plurality of conductive elements 26 are formed on the second surface 20b of the carrier 20 and electrically connected to the wiring layer of the carrier 20.

(20) In an embodiment, the conductive elements 26 pass through the bonding layer 24 and electrically connected to the wiring layer of the carrier 20. In another embodiment, the conductive elements 26 are in the shape of a ball, such as a solder ball, are metal pillars, such as copper pillars or solder bumps, or are stud conductive elements fabricated by a wire bonder.

(21) As shown in FIG. 2F, a singulation process is performed along a cutting path S shown in FIG. 2E to obtain a plurality of electronic packages 2. In an embodiment, an electronic device (not shown), such as a circuit board, is disposed on the electronic package 2 via the conductive elements 26.

(22) In an embodiment, the encapsulation layer 25 encapsulates a lateral surface 20c of the carrier 20 after the singulation process is performed.

(23) Following the fabrication process of FIG. 2 D′, an electronic package 2′ shown in FIG. 2F′ is obtained, in which the conductive elements 26 are bonded to the second surface 20b of the carrier 20 and electrically connected to the wiring layer of the carrier 20.

(24) In an embodiment, the encapsulation layer 25 does not encapsulate the carrier 20, like the electronic package 2″ shown in FIG. 2F″. In another embodiment, a width D of the cutting path S is adjusted (as shown in FIG. 2E), a lateral surface of the encapsulation layer 25 is flush with the lateral surface 20c of the carrier 20, and the lateral surface 20c of the carrier 20 is exposed from the encapsulation layer 25.

(25) In the method for fabricating the electronic package according to the present disclosure, the plurality of packaging structures 2a are fabricated and disposed on the supporting plate 9, then the encapsulation layer 25 is formed, and a singulation process is performed. Therefore, a mold that forms the encapsulation layer 25 is developed based on the specification of the supporting plate 9, and the fabrication cost is greatly reduced.

(26) According to the method for fabricating the electronic packages 2, 2′ and 2″ of the present disclosure, through the design of the plurality of packaging structures 2a even if the electronic packages 2, 2′ and 2″ have different specifications, a mold that forms the encapsulation layer 25 can still be developed based on the specification of the supporting plate 9, without taking the specification of the electronic packages 2, 2′ and 2″ into consideration, and has a single specification. Compared with the prior art, the electronic package fabricated by the method according to the present disclosure has a reduced cost.

(27) The foregoing descriptions of the detailed embodiments are only illustrated to disclose the features and functions of the present disclosure and not restrictive of the scope of the present disclosure. It should be understood to those in the art that all modifications and variations according to the spirit and principle in the present disclosure should fall within the scope of the appended claims.