PERIPHERAL DESIGN CIRCUIT OF LIQUID CRYSTAL DISPLAY PANEL AND LIQUID CRYSTAL DISPLAY PANEL
20180053473 ยท 2018-02-22
Inventors
Cpc classification
G09G3/006
PHYSICS
H01L24/02
ELECTRICITY
H01L27/1214
ELECTRICITY
G09G2310/0297
PHYSICS
International classification
H01L27/12
ELECTRICITY
Abstract
A peripheral design circuit of a liquid crystal display (LCD) panel includes a demultiplexer, a switch test, a driver integrated circuit (driver IC) zone, and a fanout structure. The driver IC zone comprises an upper bonding pad, a lower bonding pad, and a driver IC. The upper bonding pad and the lower bonding pad are arranged opposite. The driver IC is connected to the upper bonding pad and the lower bonding pad. The fanout structure is connected to the lower bonding pad and the demultiplexer. The switch test is arranged between the upper bonding pad and the lower bonding pad. The driver IC covers the switch test. The switch test is connected to the lower bonding pad.
Claims
1. A peripheral design circuit of a liquid crystal display (LCD) panel, comprising a demultiplexer, a switch test, a driver integrated circuit (driver IC) zone, and a fanout structure, wherein the driver IC zone comprises an upper bonding pad, a lower bonding pad, and a driver IC; the upper bonding pad and the lower bonding pad are arranged opposite; the driver IC is connected to the upper bonding pad and the lower bonding pad; the fanout structure is connected to the lower bonding pad and the demultiplexer, wherein the switch test is arranged between the upper bonding pad and the lower bonding pad; the driver IC covers the switch test; the switch test is connected to the lower bonding pad, wherein the switch test comprises an odd signal transmittance line and an even transmittance line, and the switch test is configured to output alternating current signals with opposite polarities through the odd signal transmittance line and the even transmittance line, wherein the switch test comprises a testing control switch, and the testing control switch is configured to control the switch test to turn on and off.
2. The peripheral design circuit of claim 1, wherein the odd signal transmittance line and the even transmittance line output periodical pulse signals in a condition of synchronous phase inversion.
3. The peripheral design circuit of claim 1, wherein the testing control switch is an N-type metal-oxide-semiconductor transistor (NMOS transistor), the switch test supplies a signal at high voltage level, and the NMOS transistor is turned on to turn on the switch test.
4. The peripheral design circuit of claim 1, wherein the testing control switch is a P-type metal-oxide-semiconductor transistor (PMOS transistor), the switch test supplies a signal at low voltage level, and the PMOS transistor is turned on to turn on the switch test.
5. A peripheral design circuit of a liquid crystal display (LCD) panel, comprising a demultiplexer, a switch test, a driver integrated circuit (driver IC) zone, and a fanout structure, wherein the driver IC zone comprises an upper bonding pad, a lower bonding pad, and a driver IC; the upper bonding pad and the lower bonding pad are arranged opposite; the driver IC is connected to the upper bonding pad and the lower bonding pad; the fanout structure is connected to the lower bonding pad and the demultiplexer, wherein the switch test is arranged between the upper bonding pad and the lower bonding pad; the driver IC covers the switch test; the switch test is connected to the lower bonding pad.
6. The peripheral design circuit of claim 5, wherein the switch test comprises an odd signal transmittance line and an even transmittance line, and the switch test is configured to output alternating current signals with opposite polarities through the odd signal transmittance line and the even transmittance line.
7. The peripheral design circuit of claim 6, wherein the odd signal transmittance line and the even transmittance line output periodical pulse signals in a condition of synchronous phase inversion.
8. The peripheral design circuit of claim 5, wherein the switch test comprises a signal unit switch test, and the signal unit switch test is configured to output an alternating current signal with opposite polarities.
9. The peripheral design circuit of claim 5, wherein the switch test comprises a testing control switch, and the testing control switch is configured to control the switch test to turn on and off.
10. The peripheral design circuit of claim 9, wherein the testing control switch is an N-type metal-oxide-semiconductor transistor (NMOS transistor), the switch test supplies a signal at high voltage level, and the NMOS transistor is turned on to turn on the switch test.
11. The peripheral design circuit of claim 9, wherein the testing control switch is a P-type metal-oxide-semiconductor transistor (PMOS transistor), the switch test supplies a signal at low voltage level, and the PMOS transistor is turned on to turn on the switch test.
12. The peripheral design circuit of claim 5, wherein the demultiplexer comprises an R signal control switch, a G signal control switch, and a B signal control switch.
13. The peripheral design circuit of claim 12, wherein the R signal control switch, the G signal control switch, and the B signal control switch are NMOS transistors or PMOS transistors.
14. A liquid crystal display panel comprising a display zone and a non-display zone, wherein a peripheral design circuit as claimed in claim 1 is disposed on the non-display zone.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0018]
[0019]
[0020]
[0021]
[0022]
[0023]
[0024]
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0025] A peripheral design circuit of a liquid crystal display (LCD) panel and an LCD panel adopting the circuit are proposed by the present invention. The peripheral design circuit of the LCD panel and the LCD panel adopting the circuit are detailed with reference to the relative figures.
[0026]
[0027] The driver IC zone 22 comprises an upper bonding pad 24, a lower bonding pad 25, and a driver IC 22. The upper bonding pad 24 and the lower bonding pad 25 are arranged opposite. The driver IC 22 is connected to the upper bonding pad 24 and the lower bonding pad 25. The fanout structure 23 is connected to the lower bonding pad 25 and the demultiplexer 20.
[0028] The switch test 21 is arranged between the upper bonding pad 24 and the lower bonding pad 25. The driver IC 22 covers the switch test 21. The switch test 21 is connected to the lower bonding pad 25. The switch test 21 is connected to the fanout structure 23 in series through the lower bonding pad 25.
[0029] The switch test 21 comprises an odd signal transmittance line ODD and an even transmittance line EVEN. The odd signal transmittance line ODD and the even transmittance line EVEN are used to output alternating current (AC) signals with opposite polarities. Both of the odd signal transmittance line ODD and the even transmittance line EVEN output periodical pulse signals while the output periodical pulse signals are in a condition of synchronous phase inversion. The switch test 21 further comprises a testing control switch S. The testing control switch S is used to control the switch test 21 to turn on and off. The testing control switch S is an N-type MOS transistor (NMOS transistor) in this embodiment.
[0030] The demultiplexer 20 comprises an R signal control switch TC1, a G signal control switch TC2, and a B signal control switch TC3. The R signal control switch TC1, the G signal control switch TC2, and the B signal control switch TC3 are used to control a data signal to feed a red/green/blue (ROB) pixel unit. The R signal control switch TC1, the C signal control switch TC2, and the B signal control switch TC3 are all NMOS transistors in this embodiment.
[0031] The working procedure of the peripheral design circuit of the LCD panel is described as follows:
[0032] In the testing process, the testing control switch S is turned on. The signal is transmitted through the transmittance lines ODD/EVEN. The signal is transmitted to the fanout structure 23 and then to the demultiplexer 20 to drive the panel to show images. After the testing closes, the testing control switch S is turned off, and the driver IC 22 is transmitted to the fanout structure 23 and then to the demultiplexer 20 to drive the panel to show images normally.
[0033]
[0034] Since the switch test 21 is arranged between the upper bonding pad 24 and the lower bonding pad 25 in this embodiment, no space is occupied by the switch test 21. So it is beneficial to design the LCD panel with a narrow bezel adopting the embodiment.
[0035]
[0036]
[0037]
[0038]
[0039] The present disclosure is described in detail in accordance with the above contents with the specific preferred examples. However, this present disclosure is not limited to the specific examples. For the ordinary technical personnel of the technical field of the present disclosure, on the premise of keeping the conception of the present disclosure, the technical personnel can also make simple deductions or replacements, and all of which should be considered to belong to the protection scope of the present disclosure.