PROGRAMMABLE INTEGRATED CIRCUIT (IC) CONTAINING AN INTEGRATED OPTICAL TRANSDUCER FOR PROGRAMMING THE IC, AND A RELATED IC PROGRAMMING SYSTEM AND METHOD

20170214475 · 2017-07-27

    Inventors

    Cpc classification

    International classification

    Abstract

    A programmable integrated circuit (IC) comprising a single body of semiconductor is disclosed. The IC comprises at least one optical transducer as an integral part of the programmable integrated circuit on the same body of semiconductor, the optical transducer being operable to receive an optical input indicative of programming instructions and at least one storage element communicatively coupled to the optical transducer and being operable to store thereon the programming instructions or an adaptation thereof. The programming instructions received via the optical input are configured to direct the operation of the IC.

    Claims

    1. A programmable integrated circuit (IC) comprising a single body of semiconductor, the IC comprising: at least one optical transducer as an integral part of the programmable integrated circuit on the same body of semiconductor, the optical transducer being operable to receive an optical input indicative of programming instructions; and at least one storage element communicatively coupled to the optical transducer and being operable to store thereon the programming instructions or an adaptation thereof, wherein the programming instructions received via the optical input are configured to direct the operation of the IC.

    2. The IC as claimed in claim 1, wherein the storage element in an integral part of the same body of semiconductor as the IC.

    3. The IC as claimed in claim 1, wherein the storage element is external to the IC but connected thereto by a communication link or bus.

    4. The IC as claimed in claim 1, wherein the optical transducer is an optical detector or photodetector.

    5. The IC as claimed in claim 4, wherein the optical transducer additionally serves as an on-die light emitter.

    6. The IC as claimed in claim 5, wherein the optical transducer provides bi-directional communication capabilities.

    7. The IC as claimed in claim 1, wherein the body of semiconductor is predominantly silicon.

    8. The IC as claimed in claim 7, wherein the body of semiconductor is crystalline silicon.

    9. The IC as claimed in claim 7, which employs a CMOS, BiCMOS, or SOI process.

    10. The IC as claimed in claim 1, wherein the optical transducer and associated electrical circuitry are operable to extract electrical power from at least a portion of the optical input, thereby to power the electrical circuitry to support a programming event.

    11. The IC as claimed in claim 10, wherein the electrical circuity includes an energy harvesting component operable to harvest energy from optical input, rendering it unnecessary to supply the IC with additional external power during the programming event.

    12. The IC as claimed in claim 1, which includes a window containing a polymer over the optical transducer.

    13. The IC as claimed in claim 12, wherein the window is curved and serves as an optical element to manipulate the optical input.

    14. The IC as claimed in claim 1, which comprises a barrier to block the input optical signal from selected portions of the IC.

    15. An IC programming system which comprises: the IC as claimed in claim 1; and an external programming tool having at least one optical transducer (the external transducer) operable to interact with the optical transducer (the integral transducer) of the IC.

    16. The IC programming system as claimed in claim 15, wherein: the integral transducer is lower power or efficiency; and external transducer is higher power or efficiency to compensate for the lower power or efficiency of the integral transducer.

    17. The IC programming system as claimed in claim 15, which comprises a plurality of the ICs and one of the external programming tools which is operable to program the plurality of ICs in a batch.

    18. The IC programming system as claimed in claim 17, wherein the programming tool is operable to produce a single optical output which is receivable by each of the ICs as the optical input.

    19. The IC programming system as claimed in claim 15, wherein the IC is linked to a plurality of non-optically programmable ICs and in which the IC serves as a point of entry into a shared programming or debugging bus interface.

    20. A method of programming or interrogating a programmable IC comprising a single body of semiconductor, the method comprising: receiving, by at least one optical transducer as an integral part of the IC on the same body of semiconductor, an optical input indicative of programming instructions; and storing, on at least one storage element communicatively coupled to the optical transducer, the programming instructions or an adaptation thereof, wherein the programming instructions received via the optical input are configured to direct the operation of the IC.

    21. The method as claimed in claim 20, which comprises harvesting, by an energy harvesting component, energy from optical input, rendering it unnecessary to supply the IC with additional external power during a programming event.

    22. The method as claimed in claim 20, which comprises programming each IC in a batch of ICs by a single optical input received by each of the ICs.

    23. The method as claimed in claim 20, which comprises: linking the IC to a plurality of non-optically programmable ICs via a shared programming or debugging bus interface; and directing the optical input to the IC, wherein the optical input is then communicated via the shared programming or debugging bus interfaces to the non-optically programmable ICs.

    Description

    BRIEF DESCRIPTION OF DRAWINGS

    [0041] The disclosure will now be further described, by way of example, with reference to the accompanying diagrammatic drawings.

    [0042] In the drawings:

    [0043] FIG. 1 shows a schematic view of a PRIOR ART integrated circuit programming system;

    [0044] FIG. 2 shows a schematic view of an IC programming system, in accordance with the disclosure, including a programmable IC, also in accordance with the disclosure;

    [0045] FIG. 3 shows a schematic view of an IC package incorporating the IC of FIG. 2 and having an optical window;

    [0046] FIG. 4 shows a schematic view of the IC of FIG. 2 being programmed by placing a programming tool in close proximity;

    [0047] FIG. 5 shows a schematic view of the IC of FIG. 2 being programmed by placing a programming tool in medium proximity;

    [0048] FIG. 6 shows a schematic view of an embodiment of the IC of FIG. 2 including energy scavenging/harvesting;

    [0049] FIG. 7 shows a schematic view of a wafer containing plural ICs in accordance with the disclosure which can be batch-programmed;

    [0050] FIG. 8 shows a schematic view of a plurality of ICs of FIG. 2 arranged in a grid;

    [0051] FIG. 9 shows a schematic view of the IC of FIG. 2 connected to a shared programming or debugging bus interface; and

    [0052] FIG. 10 shows a schematic view of an embodiment of an IC, in accordance with the disclosure, which has a barrier to selectively block incident light.

    DETAILED DESCRIPTION OF EXAMPLE EMBODIMENT

    [0053] The following description of the disclosure is provided as an enabling teaching of the disclosure. Those skilled in the relevant art will recognise that many changes can be made to the embodiment described, while still attaining the beneficial results of the present disclosure. It will also be apparent that some of the desired benefits of the present disclosure can be attained by selecting some of the features of the present disclosure without utilising other features. Accordingly, those skilled in the art will recognise that modifications and adaptations to the present disclosure are possible and can even be desirable in certain circumstances, and are a part of the present disclosure. Thus, the following description is provided as illustrative of the principles of the present disclosure and not a limitation thereof.

    [0054] FIG. 2 illustrates an IC programming system 100, in accordance with the disclosure. The IC programming system 100 has a programmable IC 102, in accordance with the disclosure. The IC 102 has at least one optical transducer 104. In this embodiment, the IC 102 has multiple optical transducers 104 which are configured for bidirectional communication. (A unidirectional embodiment may also be practicable and is included in the scope of the disclosure.)

    [0055] The IC 102 has a storage element 106 which may be on-chip (digital or analogue) circuitry or MEMS (microelectromechanical systems) structure. In an alternative embodiment, the IC 102 may include off-chip memory 108 connected to the IC 102 by a comm. link or bus 108a. The IC 102 may optionally include additional circuitry 110, either on-chip or off-chip, e.g., energy harvesting circuitry.

    [0056] A program information source (e.g., a computer server or digital controller) 120 is connected via a communication interface 120a to a programming tool 122. The programming tool 122 has optical transducers 124 (referred to as the external transducer(s)) complemental to, but potentially different from, those of the IC 102 (referred to as the integral transducer(s)). The external transducers 124 and the integral transducer 104 are configured to establish an optical link 124a, containing an optical input indicative of programming instructions, between the programming tool 122 and the IC 102. The term programming instructions in the context of this specification also includes interrogation instructions to direct the IC 102 to respond accordingly. For example, a programming instruction may include an interrogation or debugging command which causes the IC 102 to respond by indicating its current state. Thus, it will be noted that the same programming tool 122 could also be employed as debugging tool for the purpose of determining the correct functioning of the IC 102. (The programming tool 122 may also be considered as an interrogator or debugging tool, depending on its specific implementation.)

    [0057] It will be appreciated that conventional (PRIOR ART) wired programming pins have been replaced by the optical transducers 104, 124 enabling optical programming/debugging. The need for electrical connection is thus removed; if space permits it, the old programming pins can be used as general I/O pins without the need for additional external circuitry and components. Alternatively, it might be plausible for the IC to become smaller by removing the electrical pins, resulting in a cost saving per IC die.

    [0058] FIG. 3 shows an IC package 200 incorporating the IC 102 as well as an optical window 202. The window 202 may be of a polymer or plastic material and may be in the form of an optical element, e.g., a curved lens, to direct the passage of light.

    [0059] FIGS. 4-5 show two examples of a programming tool being applied to the IC 102 which has been mounted to a printed circuit board (PCB) 400. In FIG. 4, the programming tool 122 is close to, even abutting, the IC 102 but the optical link 124a (not apparent in FIG. 4) is still optical. In FIG. 5, the programming tool 122 is handheld and is held a short distance, e.g., 5-20 cm, from the IC 102 to establish the optical link 124a.

    [0060] FIG. 6 shows an IC 600 in accordance with the disclosure which has energy scavenging/harvesting. The IC 600 has an energy harvesting component 602 render it unnecessary to supply the IC 600 with additional external power during the programming event. The energy harvesting component 602 is configured to harness/scavenge some of the power from the optical link 124a provided by the external transducer 124. The external transducer 124 is of higher power or efficiency to compensate for the lower power or efficiency of the integral transducer 104 and can supply sufficient power to enable the energy harvesting component 602 to provide the IC 600 with sufficient power to sustain the programming event.

    [0061] The IC 600 also includes some additional components, such as a digital I/O 604, an analogue I/O 606, a central processing unit (CPU) 608, one or more peripheral interfaces 610, and associated oscillators and control circuits 612.

    [0062] FIG. 7 shows a wafer 700 comprising a batch or plurality of ICs 702a-702c prior to separation by dicing. The ICs 702a-702c are arranged proximate each other, on the wafer 700, and they are thus all in a receiving zone of the optical output 124a produced by the programming tool 122. Thus, each of the ICs 702a-702c can be programmed in a batch in a single programming event simultaneously from a single programming tool 122. Once programmed, the ICs 702a-702c can be diced or separated and then used in accordance with their programming.

    [0063] FIG. 8 illustrates an arrangement for programming multiple ICs 802, as in FIG. 7. In FIG. 8, packaged or completed ICs 102 are ranged in a goods container or tray 800 including a series of cavities with the ICs 102 provided therein and with windows 802 provided over each cavity thereby to expose the integral transducer 104 of each IC 102. The programming tool 122 can generate the optical programming signal 124a to program each of the ICs in a batch simultaneously. This can be convenient because typical finished goods containers are designed to fit into, and work with, automatic pick and place instrumentation for high throughput printed circuit board assembly.

    [0064] FIG. 9 illustrates an application of the IC 102 to permit even non-optically programmable ICs (e.g., PRIOR ART ICs 16). The optically-programmable IC 102 (in accordance with the disclosure) is connected to the other electrically programmable ICs 16 as a first point of entry into a shared programming/debugging bus interface 902. In this example, all programmable devices 102, 16 can be programmed using the programmable tool 122 which optically interacts solely with the first point of entry device (i.e., the IC 102) sharing the programming/debugging bus 902.

    [0065] Different bus topologies may also be implemented. For example, in a star topology, each IC 102 may host its own optical front end and the programming tool 122 connects to each IC individually using fibres. This obviates the need for electrical connections between ICs and saves PCB space.

    [0066] FIG. 10 illustrates an IC 1000 which has a barrier in the form of a top metal layer 1002 (in a standard process) to block light from some portions 1004 of the IC 1000. By way of theory, integrated optical detectors work on the principle of absorbing incident light, in the form of photons, in order to create an electron-hole pair, measurable as an electrical current. Numerous active devices which form part of other integrated components, such as amplifiers, oscillators etc., whose function is not to absorb incident photons will however also absorb photons and create an electron-hole pair. This can produce unwanted circuit behaviour or noise.

    [0067] Additionally, non-volatile memory, e.g., an EPROM, is sensitive to ultraviolet light which enables the charge, typically stored on a floating gate, to leak and be lost. This can result in a complete erasure of the integrated memory. Although a silicon light emitter itself does not emit sufficient ultraviolet light in order to negatively affect integrated memories, other ambient light might under unique circumstances contain enough optical power to clear the on-chip memory through the optically transparent window.

    [0068] Accordingly, the IC 1000 shields active devices 1004 which are sensitive to the incident photons in order to ensure proper functionality and memory retention. Fortunately, integrated circuit processes have a well-defined back-end-of-line stack and the metal and inter-metal layers can therefore through design changes be available to shield the integrated memory 106 residing in the active layer 1006. The shield 1002 could also be of an active nature in order to protect against non-invasive attacks on the IC in an attempt to re-engineer or copy the internal software.

    [0069] (Although not ideal, additional layers not part of the standard processing steps could also be envisaged to be added on top of the semiconductor wafer to facilitate the shielding of the integrated memory 106 and active devices 1004 sensitive to the incident photons.)

    [0070] The Applicant believes that the disclosure as exemplified has numerous advantages in that the problem described in the BACKGROUND OF DISCLOSURE may be overcome or at least alleviated and further provides additional benefits and efficiencies as described in the example embodiments.

    A1: REFERENCES

    [0071] [1] A. Fang, H. Park, O. Cohen, R. Jones, M. Paniccia, and J. Bowers, Electrically pumped hybrid AlGalnAs-silicon evanescent laser, Opt. Express 14, 9203-9210, 2006. [0072] [2] S. Sayil, D. Kerns, and S. Kerns, All-silicon optical contactless testing of integrated circuits, International Journal of Electronics, vol. 89, no. 7, pp. 537-547, 2002. [0073] [3] A. R. Chen, A. I. Akinwande, and H.-S. Lee, CMOS-based microdisplay with calibrated back-plane, IEEE J. Solid-State Circuits, vol. 40, no. 12, pp. 2746-2755, December 2005. [0074] [4] P. J. Venter, A. C. Alberts, M. du Plessis, T.-H. Joubert, M. E. Goosen, C. Janse van Rensburg, P. Rademeyer and N. M. Faure, A CMOS microdisplay with integrated controller utilizing improved silicon hot carrier luminescent light sources, in Proc. SPIE 8643, Advances in Display Technologies III, 864309, 2013.