Enhancement resonator including non-spherical mirrors
09590382 ยท 2017-03-07
Assignee
- MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E. V. (Munich, DE)
- LUDWIG-MAXIMILIANS-UNIVERSITAET MUENCHEN (Munich, DE)
Inventors
- Ioachim Pupeza (Tuerkenfeld, DE)
- Henning Carstens (Munich, DE)
- Simon Holzberger (Munich, DE)
- Ernst Fill (Garching, DE)
- Ferenc Krausz (Garching, DE)
Cpc classification
H05G2/00
ELECTRICITY
H01S3/086
ELECTRICITY
H01S3/005
ELECTRICITY
G02F2203/15
PHYSICS
International classification
H01S3/00
ELECTRICITY
H01S3/086
ELECTRICITY
H01S3/08
ELECTRICITY
H05G2/00
ELECTRICITY
Abstract
An enhancement resonator (20) being configured for generating intra-resonator laser light (1) by coherent superposition of input laser light, comprises at least three resonator mirrors (21, 22, 23, 24) spanning a ring resonator path in one common resonator plane, said resonator path being free of a laser light amplifying medium, wherein the at least three resonator mirrors (21, 22, 23, 24) include at least two toroidal mirrors and/or at least one cylindrical mirror. Furthermore, a laser device (100) comprising the enhancement resonator (20) and a method of generating intra-resonator laser light (1) are described.
Claims
1. An enhancement resonator being configured for generating intra-resonator laser light by coherent superposition of input laser light, comprising: at least three resonator mirrors spanning a ring resonator path in one common resonator plane, said ring resonator path being free of a laser light amplifying medium, wherein the at least three resonator mirrors include at least one of at least two toroidal mirrors and at least one cylindrical mirror, and the at least three resonator mirrors are configured such that cross-sectional areas of the intra-resonator laser light perpendicular to an incident propagation direction thereof at reflecting surfaces of the resonator mirrors differ from each other no more than 10%.
2. The enhancement resonator according to claim 1, wherein the at least three resonator mirrors include the at least two toroidal mirrors and at least one plane mirror.
3. The enhancement resonator according to claim 2, comprising two toroidal mirrors and two plane mirrors having a bow tie configuration.
4. The enhancement resonator according to claim 2, comprising two toroidal mirrors and at least one plane mirror having a configuration such that angles of incidence are at least 30 on all mirrors.
5. The enhancement resonator according to claim 1, wherein the at least two toroidal mirrors have identical surface shapes and curvatures.
6. The enhancement resonator according to claim 1, wherein each one of the toroidal mirrors, for a given angle of incidence, has identical focal lengths in the resonator plane and in a plane perpendicular to the resonator plane.
7. The enhancement resonator according to claim 1, wherein the at least three resonator mirrors include the at least one cylindrical mirror and at least two spherical mirrors.
8. The enhancement resonator according to claim 7, comprising two cylindrical mirrors and two spherical mirrors having a bow tie configuration.
9. The enhancement resonator according to claim 7, wherein the two spherical mirrors and the two cylindrical mirrors have identical surface shapes and curvatures.
10. The enhancement resonator according to claim 1, wherein at least one of the at least two toroidal mirrors and the at least one cylindrical mirror include adaptive reflectors having deformable surfaces.
11. The enhancement resonator according to claim 1, wherein the at least three resonator mirrors are configured such that the cross-sectional areas are identical or differ from each other no more than 1%.
12. The enhancement resonator according to claim 1, wherein the at least three resonator mirrors are configured such that a cross-sectional area of the intra-resonator laser light perpendicular to a propagation direction thereof has a circular shape.
13. The enhancement resonator according to claim 1, wherein the at least three resonator mirrors are configured such that a cross-sectional area of the intra-resonator laser light perpendicular to an incident propagation direction thereof on reflecting surfaces of the resonator mirrors has an elliptic shape, wherein a larger main axis of the elliptic shape is parallel to the resonator plane.
14. The enhancement resonator according to claim 1, which comprises at least one of the features the resonator path is free of a refractive element arranged for beam-shaping of the intra-resonator laser light, further plane folding mirrors provide a folded configuration of the resonator path, and an output coupling device is provided, which is configured for coupling of radiation created by an interaction of the intra-resonator laser light with a target material or an electron bunch out of the enhancement resonator.
15. The enhancement resonator according to claim 14, wherein the output coupling device comprises one of the resonator mirrors having an aperture for output coupling the created radiation.
16. The enhancement resonator according to claim 1, wherein an angle of incidence of the resonator path on at least one of spherical and toroidal mirrors of the resonator mirrors is below 20.
17. A laser device, comprising: a laser source device arranged for providing input laser light, and an enhancement resonator according to claim 1, wherein the laser source device is arranged for coupling the input laser light into the enhancement resonator.
18. A method of generating intra-resonator laser light, comprising the steps of: coupling input laser light into an enhancement resonator, which comprises at least three resonator mirrors spanning a ring resonator path in one common resonator plane, said resonator path being free of a laser light amplifying medium, and coherent superposition of the input laser light in the enhancement resonator so that the intra-resonator laser light is created, wherein the at least three resonator mirrors include at least one of at least two toroidal mirrors and at least one cylindrical mirror, and the at least three resonator mirrors are configured such that cross-sectional areas of the intra-resonator laser light perpendicular to an incident propagation direction thereof at reflecting surfaces of the resonator mirrors differ from each other no more than 10%.
19. The method according to claim 18, wherein the resonator path is formed by the at least two toroidal mirrors and at least one plane mirror.
20. The method according to claim 18, wherein the resonator path is formed by the at least one cylindrical mirror and at least two spherical mirrors.
21. The method according to claim 18, wherein the resonator path is formed having a bow tie or a triangular configuration.
22. The method according to claim 18, wherein at least one of the at least two toroidal mirrors and the at least one cylindrical mirror include adaptive reflectors having deformable surfaces, the method further including the step of setting the deformable surfaces of the adaptive reflectors.
23. The method according to claim 18, wherein the at least three resonator mirrors are configured such that the cross-sectional areas are identical or differ from each other no more than 1%.
24. The method according to claim 18, further including the step of configuring the at least three resonator mirrors such that a cross-sectional area of the intra-resonator laser light perpendicular to a propagation direction thereof has a circular shape.
25. The method according to claim 18, further including the step of configuring the at least three resonator mirrors such that a cross-sectional area of the intra-resonator laser light perpendicular to an incident propagation direction thereof on reflecting surfaces of the resonator mirrors has an elliptical shape, wherein a larger main axis of the elliptical shape is parallel to the resonator plane.
26. The method according to claim 18, wherein the resonator path is folded using further plane folding mirrors.
27. The method according to claim 18, comprising the further steps of: providing a target material or an electron bunch at or nearby at least one focal position between two of the resonator mirrors, and subjecting the target material or the electron bunch to an interaction with the intra-resonator laser light at or nearby the at least one focal position.
28. The method according to claim 27, further comprising the step of output coupling of coherent radiation created by the interaction out of the enhancement resonator or collecting and guiding non-coherent radiation created by the interaction inside the enhancement resonator.
29. The method according to claim 28, wherein the coherent radiation is coupled out of the enhancement resonator by output coupling through an aperture in one of the resonator mirrors.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) Further features and advantages of the invention are described in the following with reference to the attached drawings, which show in:
(2)
(3)
(4)
(5)
PREFERRED EMBODIMENTS OF THE INVENTION
(6) Embodiments of the invention are described in the following with exemplary reference to enhancement resonators having four or three resonator mirrors (see
(7)
(8) The enhancement resonator 20 of
(9) The resonator mirrors 21 to 24 are e. g. highly reflecting dielectric mirrors as described e. g. by H. R. Bilger et al. (Origins of fundamental limits for reflection losses at multilayer dielectric mirrors, Appl. Opt., Vol. 33, No. 31, p. 7390-7396 (1994)). They comprise an input coupling mirror 23 (IC-mirror 23) and three highly reflecting resonator mirrors 21, 22 and 24 (HR-mirrors 21, 22 and 24). The substrate of the input coupling mirror 23 is transparent, and typically one side is provided with an anti-reflection coating optimized for the angle of incidence of the laser beam. The HR-mirrors 21, 22 and 24 have a higher reflectivity than the IC-mirror 23. The reflectivities of the mirrors are selected in dependency on the particular application of the invention.
(10) The reduced reflectivity of the IC mirror 23 is provided for setting the power enhancement factor and providing a test signal 4. As an example, the IC mirror 23 transmission can be equal to the complete round trip losses of the resonator (except for the input coupling mirror) due to scattering, absorption, transmission and interaction of the circulating light with a nonlinear medium, i.e. impedance matching. In the case of impedance matching, the power enhancement is maximized for a given round trip loss. The test signal 4 reflected at the IC mirror is sensed with a photodiode and guided to a control device (see
(11) While
(12) All of the resonator mirrors 21 to 24 can be shifted, rotated and/or inclined by mirror drive units (not shown) for adjusting the distances d and there between and/or angles of incidence on the mirror surfaces, resp. The distances d and refer to the spacing between the beam centers on the mirror surfaces, resp. As an example, distance d can be changed by a mirror drive unit (translation table) carrying resonator mirror 24 (see arrow 3).
(13)
(14) According to a further embodiment of the invention, as schematically illustrated in
(15)
(16) For obtaining a resonator focus 25 with a circular profile, the two toroidal mirrors have identical focal lengths in the sagittal and tangential plane of the resonator 20 for the chosen angle of incidence on the toroidal mirrors. To this end, the radii of curvature of the toroidal mirrors 21, 23 in the sagittal and tangential plane, R.sub.sag and R.sub.tan are selected in dependency on the angles of incidence according to R.sub.sag=2 f cos and R.sub.tan=2 f/cos (f: focal length). With a practical example, the radii may be R.sub.sag=158 mm and R.sub.tan=2280 mm.
(17) Preferably, all of the resonator mirrors 21 to 24 can be shifted for adjusting the distances d and . Optionally, resonator mirror 24 can be shifted only (see arrow 3). Furthermore, they can be rotated in the resonator plane and inclined relative to the resonator plane for adjusting angles of incidence on the mirror surfaces. For these adjustments, each of the resonator mirrors 21 to 24 is supported by a mirror drive unit and connected with an adjustment stage (not shown) as it is known from conventional resonators.
(18) The inventive method of generating high power laser light using the laser device 100 of
(19) For generating coherent or non-coherent light pulses in an XUV/X-Ray or THz frequency range, a target, like e. g. atomic or molecular gases (like noble gases, nitrogen or oxygen), or atomic and molecular clusters (van-der-Waals, metallic or ionic clusters), is supplied at or close to the focal position 25 between resonator mirrors 21 and 24. Due to the interaction of the intra-resonator laser light 1 with the target, coherent radiation in the XUV/X-Ray wavelength range is generated, which is coupled out of the enhancement resonator 20, e. g. through a gap between the mirrors 22 and 24 or aside them, through an aperture, e. g. a cylindrical and cone hole in mirror 22 (see
(20) In the following, the intensity regime is estimated which can be achievable with the astigmatism-compensated cavity of
(21) One prospect offered by the inventive resonator design is an increase of the peak intensity in the focus to values exceeding 10.sup.15 W/cm.sup.2 in the w.sub.0=25 m focus with w.sub.m=4 mm spots on all mirrors, with compressed 25 fs pulses and an intracavity average power of 125 kW. The same intensity can be obtained with 250 fs pulses at an average power exceeding 1 MW. This intensity corresponds to a cut-off wavelength of less than 2 nm via high-order harmonic generation in helium.
(22) Another prospect offered by the inventive resonator is that of increasing the focal volume at a given peak intensity, which can be achieved by using weaker focusing. A peak intensity of 2.8*10.sup.14 W/cm.sup.2, which allowed for the generation of 13 nm plateau harmonics in the past, can be achieved with 25 fs pulses at a power enhancement of 350 in a w.sub.0=52 m focus and with beam radii of w.sub.m=3.2 mm on the resonator mirrors. This setup allows for the inclusion of a micrometer sized aperture (85 m radius) in the mirror subsequent to the cavity focus while still working with the required power enhancement of 350 in an impedance matched configuration. The increase of the focal volume by roughly two orders of magnitude with respect to the setup presented by I. Pupeza et al. in Ultrafast Phenomena XVIII, Proceedings of the 18.sup.th International Conference, Lausanne, Switzerland, 2012 drastically increases the generated XUV photon flux due to the larger nonlinear interaction volume, improved phase matching and higher output coupling efficiency. Furthermore, the intensity regime of 10.sup.15 W/cm.sup.2 is suitable for inverse-Compton scattering.
(23) The illustrated inventive resonator cavities can be implemented with one of the following design variants. The resonator cavity can be configured such that cross-sectional areas of the intra-resonator laser light 1 perpendicular to the incident propagation direction thereof on the reflecting surfaces of the resonator mirrors 21 to 24 differ from each other no more than e. g. 1%. This yields the advantage of low adjustment sensitivity. Additionally, the resonator cavity can be configured such that the cross-sectional areas are circular on all reflecting surfaces of the resonator mirrors 21 to 24. This yields the advantage of enlarged beam diameters and enlarged focussing volumes, so that XUV or hard X-rays can be generated with improved efficiency. Alternatively, the resonator cavity can be configured such that the cross-sectional areas have large ellipticity on all reflecting surfaces of the resonator mirrors 21 to 24, yielding advantages for output coupling XUV or hard X-rays.
(24) Experimental and simulation results obtained with the inventive enhancement resonator 20 of
(25)
(26)
(27) As an example, the enhancement resonator 20 has the bow tie configuration of the second embodiment (
(28) The enhancement resonator 20 is arranged in a gas pressure tight container 40, in particular air pressure tight, being connected with a vacuum pump (not shown) and providing an environment of reduced air pressure. During operation of the laser device 100, a pressure of e. g about 10.sup.3 Pa to 10.sup.4 Pa is provided in the container. The air pressure tight container 40 includes wedged and/or anti-reflection coated windows 41, 42 for input coupling the laser light 2 and providing the reflected test signal 4 and e. g. XUV/X-Ray and/or THz radiation 5, respectively. The first window 41 is made of material being transparent in a wavelength range of the laser light 2, in particular in the wavelength range from UV via visible to IR-wavelengths, e. g. glass or plastic material. The second window 42 is transparent in a wavelength range of the X-Ray or THz radiation generated at the focal position 25 of the enhancement resonator 20. To this end, the second window 42 is made of e. g. beryllium or silicon. In particular with the generation of XUV and soft X-ray radiation, the second window can be replaced by a connection channel opening to a further vacuum device where the XUV or soft X-ray radiation is used for a particular application.
(29) The enhancement resonator 20 is arranged on a mechanical oscillation damping device 50 (schematically illustrated), which preferably comprises an active mechanical oscillation isolation, like a six degree of freedom compensating electro-magnetic and/or piezo electric drive with a control system which damps mechanical vibrations by counter propagating the complete enhancement resonator setup relative to the vibration oscillation by about the same amplitude (mechanical oscillation isolation is possible in the range from 0.7 Hz to 200 Hz) or a passive mechanical oscillation absorber.
(30) For generating hard X-ray radiation, a target is supplied by a target source device (not shown) at the focal position 25. In case of an electron bunch as target the electron beam of relativistic electrons is directed from an electron beam source (not shown) to the focal position 25 with a direction opposite to the propagation direction of the intra-resonator pulse 1 within the enhancement resonator. According to the direction of the intra-resonator laser pulse, the XUV/X-Ray radiation 5 is directed out of the container 40 through the second window 42.
(31) The control device 30 comprises an electronic circuitry being configured for controlling the laser source device 10 and the enhancement resonator 20 such that the laser source device 10 is stabilized to the enhancement resonator's 20 length and the carrier-envelope offset frequency of the circulating laser light pulse or to the continuous-wave frequency of the standing-wave inside the enhancement resonator 20 for a coherent addition of the laser light at the resonator mirror 21. This is realized by controlling the frequency comb parameters of the laser source device's laser oscillator repetition rate and carrier-envelope offset frequency or continuous-wave frequency, e. g. with a resonator mirror mounted on a linear stage inside the laser oscillator, a resonator mirror mounted on a piezo electric actuator inside the laser oscillator, oscillator pump photon flux control, a pair of fused silica wedges, and with an electro-optic modulator inside the laser oscillator. On the other hand, the adjustment devices (e. g. 21.1 to 24.1) provide a proper enhancement resonator mirror alignment to build up a stable resonator. By supplying the test signal 4 to the control device 30, a control loop is provided, wherein the resonator mirrors, e. g. adaptive reflectors, are adjusted in dependency on a measured beam diameter, beam overlap and/or other beam parameters.
(32) The features of the invention disclosed in the above description, the drawings and the claims can be of significance both individually as well as in combination for the realization of the invention in its various embodiments.