METHOD FOR PRODUCING A CYCLICALLY STABLE SILICON ANODE FOR SECONDARY BATTERIES, AND SILICON ANODE FOR SECONDARY BATTERIES
20230075928 · 2023-03-09
Inventors
- Rainer Adelung (Kiel, DE)
- Sandra Hansen (Osterroenfeld, DE)
- Joerg Bahr (Altenholz-Klausdorf, DE)
- Juergen Carstensen (Kiel, DE)
Cpc classification
H01M4/044
ELECTRICITY
Y02E60/10
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01M2004/021
ELECTRICITY
H01M10/0525
ELECTRICITY
H01M10/054
ELECTRICITY
International classification
H01M4/62
ELECTRICITY
Abstract
A method for producing a silicon anode for secondary batteries. Mesoporous silicon is used for the anode to provide space for volume expansion in the course of intercalation, especially of lithium ions. However, instead of coating a metal film with silicon, here metal is deposited onto a monocrystalline etched silicon wafer. It is essential that the silicon is monocrystalline and that the two flat sides of the wafer are (100)-oriented, i.e., perpendicular to the (100)-direction of the volumetric crystal.
Claims
1. A method for producing a silicon anode for secondary batteries, comprising: a. providing a monocrystalline silicon wafer with (100)-oriented front and rear flat sides; b. contacting the rear side of the wafer with a flat first electrode; c. introducing the front side of the wafer into an etching bath having a hydrofluoric acid-containing electrolyte and a second electrode; d. electrochemically etching mesopores of at least 4 micrometers pore depth into the front side of the silicon wafer by establishing a predetermined etching current density while e. generating a porosity between 40% and 80% in the mesoporous layer; f. generating a microporous release layer below the mesoporous layer by increasing the etching current density; g. placing the etched wafer in an electroplating bath; h. electrodepositing an elemental metal into the etched mesopores to a predetermined pore depth less than 2 micrometers; i. depositing a metal layer at least a few micrometers thick onto the etched front side of the wafer while producing electrically conductive and mechanically adherent contacts of the metal layer with the elemental metal in the mesopores; and j. lifting off the metal layer and the mesoporous, monocrystalline, (100)-oriented silicon layer partially filled with elemental metal in the mesopores while mechanically destroying the microporous release layer.
2. The method according to claim 1, wherein the monocrystalline silicon wafer is p-doped and has a resistivity of less than 10 mΩcm.
3. The method according to claim 1, wherein the mesopores are etched with pore depths between 4 and 16 micrometers.
4. The method according to claim 1, wherein the porosity of the mesoporous layer is between 70% and 75%.
5. A process according to claim 1, wherein one of the elemental metals copper or nickel is deposited into the mesopores.
6. The method according to claim 5, wherein the deposition of the elemental metal into the mesopores takes place to a pore depth of between a few 10 nanometers and several 100 nanometers.
7. The method according to claim 1, wherein the metal layer is formed 1-4 micrometers thick from an elemental metal other than the elemental metal deposited in the mesopores.
8. A silicon anode for secondary batteries characterized by a metal layer and a mesoporous, monocrystalline, (100)-oriented silicon layer partially filled with elemental metal in the mesopores, the elemental metal in the mesopores being in electrically conducting and mechanically adhering contact with the metal layer.
9. An anode in a secondary battery having an electrolyte containing alkali metal ions, wherein the alkali metal is at least one of lithium, sodium or potassium, and wherein the anode is the silicon anode of claim 8.
10. The method according to claim 1, wherein the monocrystalline silicon wafer is p-doped and has a resistivity of 7-9 mΩcm.
11. The method according to claim 1, wherein the monocrystalline silicon wafer is p-doped and has a resistivity of between 8 and 15 mΩcm.
12. The method according to claim 1, wherein the mesopores are etched with pore depths between 6 and 12 micrometers.
13. The method according to claim 5, wherein the deposition of the elemental metal into the mesopores takes place to a pore depth of a maximum of 3 times the diameter of the pores.
14. A method for producing a silicon anode for secondary batteries, comprising: a. providing a monocrystalline silicon wafer with (100)-oriented front and rear flat sides; b. contacting the rear side of the wafer with a flat first electrode; c. introducing the front side of the wafer into an etching bath having a hydrofluoric acid-containing electrolyte and a second electrode; d. electrochemically etching mesopores of at least 4 micrometers pore depth into the front side of the silicon wafer by establishing a predetermined etching current density while e. generating a porosity between 40% and 80% in the mesoporous layer; f. generating a microporous release layer below the mesoporous layer by increasing the etching current density; g. placing the etched wafer in an electroplating bath; h. electrodepositing an elemental metal into the etched mesopores to a predetermined pore depth less than 2 micrometers; i. depositing a metal layer onto the etched front side of the wafer while producing electrically conductive and mechanically adherent contacts of the metal layer with the elemental metal in the mesopores; and j. lifting off the metal layer and the mesoporous, monocrystalline, (100)-oriented silicon layer partially filled with elemental metal in the mesopores while mechanically destroying the microporous release layer.
15. The method according to claim 5, wherein the deposition of the elemental metal into the mesopores takes place to a pore depth of between 50 nanometers and 900 nanometers.
16. The method according to claim 1, wherein the metal layer is formed 1-4 micrometers thick from an elemental metal other than the elemental metal deposited in the mesopores.
17. The method according to claim 1, wherein in step i. a metal layer up to 4 micrometers thick is deposited onto the etched front side of the wafer.
Description
[0027] The invention is also explained in more detail below with reference to figures. Thereby show:
[0028]
[0029]
[0030]
[0031]
[0032]
[0033]
[0034]
[0035]
[0036] A monocrystalline Si wafer can be electrochemically etched by known methods to create different types of pores in the silicon. The electrochemist is familiar with the process steps a) to f) and knows how to determine the exact etching parameters (current density, etching time, electrolyte temperature and flow) if he wants to mesoporously etch a predetermined wafer batch with predetermined doping with an electrolyte composition of his choice. Only, for example, he can be guided by the publication DE 103 18 995 B4 and the sources cited therein. As already mentioned, a specific doping of the silicon is not mandatory. However, it is certainly advantageous for mesopore etching to use doped silicon. Such silicon is also generally less expensive than high-purity silicon.
[0037] The experiment shows that a p-doped silicon wafer—for example by boron—which has a resistivity of less than 10 mΩcm, preferably around 8 mΩcm, is an advantageous choice.
[0038] An etching device for large silicon wafers is known from U.S. Pat. No. 7,208,069 B2, which is also suitable for producing mesopores. For example, an aqueous solution containing 20 wt % hydrogen fluoride (HF) and 5 wt % ethanol and 1 wt % polyethylene glycol (PEG) can be used as the electrolyte; if necessary, 1 wt % sulfuric acid (H.sub.2 SO.sub.4) can be added in addition to or instead of PEG. The bath temperature is usually a constant 20° C., and the current density can be set up in a typical window between 50 and 100 mA/cm.sup.2, with larger values leading to greater porosity.
[0039] According to the invention, the total volume of the mesopores should be between 40% and 80% of the original silicon volume in the mesoporous etched layer. The reason for the width of the interval is explained further below. Especially for Si anodes for lithium-ion batteries, it is advantageous to set the porosity to a value between 70% and 75%.
[0040] The expert also knows—or he can easily determine by preliminary tests—how far and for how long he has to increase the etching current density in his setup in order to produce a microporous release layer with a sponge-like pore structure under the mesoporous layer. One can design the release or detachment layer to have only very thin, brittle pore walls that can be easily broken mechanically. As long as the pore walls are still intact, however, the mesoporous layer remains connected to the wafer and can be moved together with it.
[0041] According to the invention, the etched wafer is then placed in an electroplating bath containing an electrolyte with elemental metal ions. Preferably, copper or nickel ions are used for this purpose. Possible electrolytes are for example aqueous copper/nickel sulfate solutions (with a molarity of 0.25 M to 1.25 M) with additions of sulfuric acid (H.sub.2 SO.sub.4) and 1 wt. % PEG (M˜3360) preferably at pH between 1 and 2.7. The best results for nickel deposition are obtained with Watts solution: 200 g/l nickel sulfate (NiSO.sub.4), 45 g/l nickel chloride (NiCl.sub.2), 45 g/l boric acid (H.sub.3 BO.sub.3). Good results can also be achieved with the aid of nickel sulfamate Ni(SO.sub.3 NH.sub.2) of 30 g/l, which is added instead of NiSO.sub.4.
[0042] The electrolyte also penetrates the mesopores at least in an area close to the surface, and the mesopores are then partially filled with elemental metal by means of current flow and precipitating reduction of the ions. “Partially” here means that not the entire pore depth—which should be at least 4 micrometers—is filled with elemental metal. This is because deposition in the mesopores becomes difficult at pore depths beyond a few 100 nanometers because the electrolyte flow is too much impeded. For the purposes of the invention, metal deposition over a pore depth between a few 10 and several 100 nanometers is quite sufficient. The skilled person knows that he can influence the penetration depth of the electrolyte by, among other things, controlling the viscosity of the electrolyte.
[0043] Preferably, the metal deposition is continued until a metal layer at least a few micrometers thick has formed on the wafer surface. The metal layer and the elemental metal deposits in the mesopores are bonded together, which ensures the best electrically conductive and mechanically adherent contact. Alternatively, the metal layer can be formed from a different metal than that with which the mesopores have been filled. For example, the electrolyte can be changed or a different metallization process can be used to apply the metal layer. At the end of the manufacturing process, the metal layer must be able to freely support the silicon single crystal provided with mesopores, which adheres to the metal layer after said release layer has been destroyed separately from the wafer.
[0044] The release layer is very brittle and can be destroyed mechanically, for example by pulling the finished metal film and the mesoporous silicon single crystal off the wafer. Another possibility of mechanical destruction can be the irradiation of possibly pulsed and/or focused ultrasound into the release layer.
[0045] The result of the process is sketched in
[0046] The thickness of the silicon layer adhering to the metal film is determined by the choice of mesopore depth during the etching process and should be at least 4 micrometers according to the invention. Preferably, the mesoporous silicon layer is 4 to 16 micrometers thick, more preferably between 6 and 12 micrometers. The etching rate in the embodiment example described above is slightly more than 2 micrometers per minute.
[0047] At first glance,
[0048]
[0049] In the secondary battery, for example, the following two types of electrolytes are suitable:
[0050] a) a carbonate-based electrolyte. This consists of 1 M lithium hexafluorophosphate (LiPF.sub.6) dissolved in solvents ethylene carbonate (EC) and dimethyl carbonate (DMC) in a 1:1 ratio (commercially available).
[0051] b) an ether-based electrolyte. This can be produced as a solution of the salt lithium bis(trifluoromethanesulfonyl)imide (LiTFSi) in approximately a 1:2 ratio of dioxolane-1,3 (DOL) and dimethyl ether (DME).
[0052]
[0053] The discharged anode, stabilized after cycling, can be removed and inspected. Under the scanning electron microscope, the silicon side shows restructuring as shown in
[0054] It is important to note here that the structure shown in
[0055]
[0056] The investigations for several thicknesses of the silicon layer show that a cycle-stable silicon anode for secondary batteries can be realized with silicon layer thicknesses of at least 4 micrometers. The measurements further show that layer thicknesses between 4 and 16 micrometers, and especially between 6 and 12 micrometers, currently promise the best results—particularly efficient storage of lithium ions—and are therefore preferred.
[0057] Finally, it should be noted that silicon can also intercalate other alkali metals, especially sodium and potassium. Therefore, the silicon anode can also be inserted and cycled in a test cell with a sodium or potassium ion electrolyte and a metallic sodium or potassium cathode. For this purpose, for example, the aforementioned ether-based electrolytes are suitable, in which the salts sodium trifluoromethanesulfonimide (NaTFSi) for sodium batteries or potassium trifluoromethanesulfonimide (KTFSi) for potassium batteries are optionally dissolved.
[0058] In fact, the silicon anode according to the invention also proves suitable for use in sodium or potassium ion batteries. At least surprisingly stable charging cycles can be carried out, although some of these take even longer than with lithium.
[0059] However, because sodium or potassium cause a smaller increase in the volume of the silicon than lithium when the silicon is intercalated, it may be appropriate to design the silicon anode for this circumstance by providing a smaller porosity, in particular to a value from the interval of 40% to 60%.
[0060] For example,
[0061]
[0062]