LOCKING DUAL LEADFRAME FOR FLIP CHIP ON LEADFRAME PACKAGES
20170309595 · 2017-10-26
Inventors
- Lee Han Meng @ Eugene Lee (Johor, MY)
- Wei Fen Sueann Lim (Melaka, MY)
- Anis Fauzi Bin Abdul Aziz (Kegah, MY)
Cpc classification
H01L2224/73204
ELECTRICITY
H01L2224/32013
ELECTRICITY
H01L2224/83203
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/131
ELECTRICITY
H01L2224/73204
ELECTRICITY
H01L24/97
ELECTRICITY
H01L2224/92242
ELECTRICITY
Y10T29/49121
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01L2224/131
ELECTRICITY
H01L2224/2919
ELECTRICITY
H01L2224/92242
ELECTRICITY
H01L2224/2919
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L2224/32013
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2224/97
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2224/83192
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/83203
ELECTRICITY
H01L2224/97
ELECTRICITY
H01L24/73
ELECTRICITY
International classification
Abstract
A method of assembling a flip chip on a leadframe package. A locking dual leadframe (LDLF) includes a top metal frame portion including protruding features and a die pad and a bottom metal frame portion having apertures positioned lateral to the die pad. The protruding features and apertures are similarly sized and alignable. A flipped integrated circuit (IC) die having a bottomside and a topside including circuitry connected to bond pads having solder balls on the bond pads is mounted with its topside onto the top metal frame portion. The top metal frame portion is aligned to the bottom metal frame portion so that the protruding features are aligned to the apertures. The bottomside of the IC die is pressed with respect to a top surface of the bottom frame portion, wherein the protruding features penetrate into the apertures.
Claims
1. An integrated circuit package comprising: a locking dual lead frame including: a first metal frame; and a second metal frame attached to the first metal frame, the second metal frame including a plurality of planar levels, one of the plurality of planar levels including a die pad; a die on the die pad, the die in between the first metal frame and the second metal frame; under fill material between portions of the die and the first metal frame; and mold compound encapsulating portions of the die, the under fill material, and the locking dual lead frame.
2. The integrated circuit package of claim 1, wherein the first metal frame includes a plurality of leads.
3. The integrated circuit package of claim 1, wherein the first metal frame and the second metal frame both include pilot holes for aligning the first metal frame to the second metal frame.
4. The integrated circuit package of claim 1, wherein the die is electrically connected to the first metal frame and mechanically attached to the second metal frame.
5. The integrated circuit package of claim 1, wherein the die is electrically connected to the first metal frame via solder balls.
6. The integrated circuit package of claim 5, wherein the solder balls connect to a plurality of bond pads of the die.
7. The integrated circuit package of claim 1, wherein the first metal frame includes protruding features and the second metal frame includes apertures, the protruding features penetrated into the apertures, wherein the protruding features and the apertures are removed during singulation.
8. The integrated circuit package of claim 7, wherein the apertures include a longitudinal hole and the protruding features include a linear frame.
9. The integrated circuit package of claim 7, wherein the apertures include a circular hole and the protruding features include a button shape.
10. The integrated circuit package of claim 7, wherein the apertures include a longitudinal hole and the protruding features include a U shape with side necking.
11. The integrated circuit package of claim 1, wherein plurality of planar levels is connected by a plurality of portions that are at an angle with respect to the plurality of planar levels.
12. An integrated circuit package comprising: a locking dual lead frame including: a first metal frame including a plurality of leads; and a second metal frame attached to the first metal frame, the second metal frame including a plurality of planar levels connected by a plurality of portions that are at an angle with respect to the plurality of planar levels, one of the plurality of planar levels including a die pad; a die on the die pad, the die in between the first metal frame and the second metal frame; under fill material between portions of the die and the first metal frame; and mold compound encapsulating portions of the die, the under fill material, and the locking dual lead frame.
13. The integrated circuit package of claim 12, wherein the plurality of planar levels includes at least three planar levels.
14. The integrated circuit package of claim 12, wherein a portion of the second metal frame is exposed from the integrated circuit package.
15. The integrated circuit package of claim 12, wherein the die is electrically connected to the first metal frame and mechanically attached to the second metal frame.
16. The integrated circuit package of claim 12, wherein the die is electrically connected to the first metal frame via solder balls.
17. The integrated circuit package of claim 12, wherein the first metal frame and the first metal frame are between 7 and 9 mm in thickness.
18. The integrated circuit package of claim 12, wherein the integrated circuit package is a flip chip integrated circuit package.
19. The integrated circuit package of claim 12, wherein the first metal frame includes protruding features and the second metal frame includes apertures, the protruding features penetrated into the apertures, wherein the protruding features and the apertures are removed during singulation.
20. The integrated circuit package of claim 19, wherein the apertures include one of a circular hole and a longitudinal hole, and the protruding features includes one of a U shape with side necking, a linear frame, and a button shape.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0006] Reference will now be made to the accompanying drawings, which are not necessarily drawn to scale, wherein:
[0007]
[0008]
[0009]
[0010]
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[0012]
[0013]
DETAILED DESCRIPTION
[0014] Example embodiments are described with reference to the drawings, wherein like reference numerals are used to designate similar or equivalent elements. Illustrated ordering of acts or events should not be considered as limiting, as some acts or events may occur in different order and/or concurrently with other acts or events. Furthermore, some illustrated acts or events may not be required to implement a methodology in accordance with this disclosure.
[0015]
[0016] The protruding features are generally part of top metal frame portion which can be formed through a metal stamping process, so that the protruding feature are an integral part of the top metal leadframe portion. The protruding features are generally slightly smaller in area as compared to the apertures to permit fitting therethrough and longer than a thickness of the bottom metal frame portion. In one particular embodiment the top metal frame portion and bottom metal frame portion are both about 7 to 9 mm thick, and the protruding features are about 20 mm long.
[0017] Step 102 comprises mounting a flipped integrated circuit (IC) die having a bottomside and a topside including circuitry (including transistor(s)) connected to bond pads having solder balls on the bond pads with the topside down onto the die pad area of the top metal frame portion. Step 103 comprises aligning the top metal frame portion to the bottom metal frame portion so that the protruding features are aligned to the apertures. As described below (see pilot holes 319 in
[0018] Step 104 comprises pressing the bottomside of the IC die onto a top surface of the bottom metal frame portion having a die attach material thereon, wherein the protruding features penetrate into the apertures. A mechanical press can be used for the pressing along with optional heating. Subsequent assembly steps generally include reflowing the solder, molding with a mold material, then singulating the leadframe sheets into individual packaged devices. Singulation cuts around mold material, where the disclosed locking features are generally beyond the mold material and are thus removed by the singulation (e.g., see flip chip on leadframe package 600 in
[0019]
[0020] An integrated circuit (IC) die 215 has a bottomside and a topside including circuitry 223 connected to bond pads 216 having solder balls 219 on the bond pads 216 mounted flipped with its topside onto the top metal frame portion 210. A die attach material (e.g., an epoxy material) 218 is between the bottomside of the IC die 215 and the bottom metal frame portion 220 for securing the IC die 215 to the bottom metal frame portion 220. Underfill 237 is also shown.
[0021] The top metal frame portion 210 is aligned to the bottom metal frame portion 220 so that the protruding features 225 are aligned to the apertures 220a. The protruding features 225 are sufficiently long to penetrate into, and generally through the full thickness of the apertures 225a. A mold compound (e.g., an epoxy) 230 encapsulates the flip chip on leadframe package 200 except for the bottom of the bottom metal frame portion 220 being exposed to enable an electrical and/or enhanced thermal contact to be made.
[0022]
[0023]
[0024] Pilot holes 319 are shown for aligning the top metal frame portion and a bottom metal frame portion. The circular holes 320a on bottom frame portion enable the button shaped protruding features 325 including necking to lock together as shown in
[0025]
[0026]
[0027]
[0028] Advantages of disclosed embodiments include the protrusion features on the top metal frame portion with necking locking together to secure the top and bottom metal frame portions together during assembly. Disclosed leadframe locking avoid leadframes from moving in the X and Y direction (along the plane of the leadframes) during assembly processing, and helps ensure no separation between the top and bottom metal frame portions in the Z direction. Disclosed leadframes having mated metal frames portions are rigid and stable ensuring essentially no misalignment of leadframes from subsequent assembly processes, and thus a significant reduction in rejected devices for lack of solder ball attachment to the wire bond pads of the leadframe causing electrical opens.
[0029] Disclosed embodiments can be integrated into a variety of assembly flows to form a variety of different semiconductor integrated circuit (IC) devices and related products. The assembly can comprise single semiconductor die or multiple semiconductor die, such as package-on-package (PoP) configurations comprising a plurality of stacked semiconductor die. The semiconductor die may include various elements therein and/or layers thereon, including barrier layers, dielectric layers, device structures, active elements and passive elements including source regions, drain regions, bit lines, bases, emitters, collectors, conductive lines, conductive vias, etc. Moreover, the semiconductor die can be formed from a variety of processes including bipolar, CMOS, BiCMOS and MEMS. Those skilled in the art to which this disclosure relates will appreciate that many other embodiments and variations of embodiments are possible within the scope of the claimed invention, and further additions, deletions, substitutions and modifications may be made to the described embodiments without departing from the scope of this disclosure.