C23C14/34

Method for producing a substrate, which is coated with an alkali metal, by means of a promoter layer, and a coated substrate

The present invention relates to a method for producing a substrate (2) which is coated with an alkali metal (1), in which method a promoter layer (3) which is composed of a material which reacts with the alkali metal (1) by at least partial chemical reduction of the promoter layer (3) is applied to a surface of the substrate (2) and a surface of the promoter layer (3) is acted on by an alkali metal (1) and then the alkali metal (1) is converted into the solid phase and a coating containing the alkali metal is formed.

Resistance-area (RA) control in layers deposited in physical vapor deposition chamber

Methods for depositing a dielectric oxide layer atop one or more substrates disposed in or processed through a PVD chamber are provided herein. In some embodiments, such a method includes: sputtering source material from a target assembly onto a first substrate while the source material is at a first erosion state and while providing a first amount of RF power to the target assembly to deposit a dielectric oxide layer onto a first substrate having a desired resistance-area; and subsequently sputtering source material from the target assembly onto a second substrate while the source material is at a second erosion state and while providing a second amount of RF power to the target assembly, wherein the second amount of RF power is lower than the first amount of RF power by a predetermined amount calculated to maintain the desired resistance-area.

Advanced sputter targets for ion generation
11542594 · 2023-01-03 · ·

An advanced sputter target is disclosed. The advanced sputter target comprises two components, a porous carrier, and a metal material disposed within that porous carrier. The porous carrier is designed to be a high porosity, open cell structure such that molten material may flow through the carrier. The porous carrier also provides structural support for the metal material. The cell sizes of the porous carrier are dimensioned such that the capillary action and surface tension prohibits the metal material from spilling, dripping, or otherwise exiting the porous carrier. In some embodiments, the porous carrier is an open cell foam, a weave of strands or stacked meshes.

Physical vapor deposition system and processes
11542595 · 2023-01-03 · ·

A physical vapor deposition (PVD) chamber and a method of operation thereof are disclosed. Chambers and methods are described that provide a chamber comprising an upper shield with two holes that are positioned to permit alternate sputtering from two targets.

METHOD OF MANUFACTURING SOLID STATE BATTERY CATHODES FOR USE IN BATTERIES
20220411913 · 2022-12-29 · ·

A method of manufacturing a battery cathode for a solid state battery is provided. The method includes generating a plasma remote from one or more targets suitable for forming cathodes, such as LiCoO.sub.2, exposing the plasma target or targets to the plasma, thereby generating sputtered material from the target or targets, and depositing sputtered material on a first portion of a substrate, thereby forming crystalline material, such as LiCoO.sub.2 on the first portion of the substrate.

METHOD OF MANUFACTURING SOLID STATE BATTERY CATHODES FOR USE IN BATTERIES
20220411913 · 2022-12-29 · ·

A method of manufacturing a battery cathode for a solid state battery is provided. The method includes generating a plasma remote from one or more targets suitable for forming cathodes, such as LiCoO.sub.2, exposing the plasma target or targets to the plasma, thereby generating sputtered material from the target or targets, and depositing sputtered material on a first portion of a substrate, thereby forming crystalline material, such as LiCoO.sub.2 on the first portion of the substrate.

SHIELDING MECHANISM AND THIN-FILM-DEPOSITION EQUIPMENT USING THE SAME
20220415633 · 2022-12-29 ·

The present disclosure provides a shielding mechanism and a thin-film-deposition equipment using the same, wherein the shielding mechanism includes two shield members and a driver. The driver includes a motor and a shaft seal. The motor interconnects the two shield members via the shaft seal, and such that to drive the two shield members to sway in opposite directions and to switch between an open state and a shielding state. Furthermore, each of the two shield members is formed with at least one cavity, for reducing weights thereof and loading of the motor and the driver.

SHIELDING MECHANISM AND THIN-FILM-DEPOSITION EQUIPMENT USING THE SAME
20220415633 · 2022-12-29 ·

The present disclosure provides a shielding mechanism and a thin-film-deposition equipment using the same, wherein the shielding mechanism includes two shield members and a driver. The driver includes a motor and a shaft seal. The motor interconnects the two shield members via the shaft seal, and such that to drive the two shield members to sway in opposite directions and to switch between an open state and a shielding state. Furthermore, each of the two shield members is formed with at least one cavity, for reducing weights thereof and loading of the motor and the driver.

Oxide Semiconductor Sputtering Target And Method Of Fabricating Thin-Film Transistor Using Same

An oxide semiconductor sputtering target used in a sputtering process to deposit an active layer of a TFT. The oxide semiconductor sputtering target is formed from a material based on a composition of In, Sn, Ga, Zn, and O. The material contains gallium oxide, tin oxide, zinc oxide, and indium oxide. The In, Sn, Ga, and Zn contents are in ranges of 60% to 80%, 0.5% to 8%, 5% to 15%, and 10% to 30% by weight with respect to the weight of In+Sn+Ga+Zn, respectively. A method of fabricating a TFT includes depositing an active layer using the oxide semiconductor sputtering target. Such a TFT is used in a liquid crystal display (LCD), an organic light-emitting display, an electroluminescence display, and the like.

CLEANING OF SIN WITH CCP PLASMA OR RPS CLEAN

A physical vapor deposition processing chamber is described. The processing chamber includes a target backing plate in a top portion of the processing chamber, a substrate support in a bottom portion of the processing chamber, a deposition ring positioned at an outer periphery of the substrate support and a shield. The substrate support has a support surface spaced a distance from the target backing plate to form a process cavity. The shield forms an outer bound of the process cavity. In-chamber cleaning methods are also described. In an embodiment, the method includes closing a bottom gas flow path of a processing chamber to a process cavity, flowing an inert gas from the bottom gas flow path, flowing a reactant into the process cavity through an opening in the shield, and evacuating the reaction gas from the process cavity.