A method and device for providing a multi-modal capacitive sensor, including a plurality of sensor electrodes, in an electronic device is provided. In a first mode, the capacitive sensor is configured to capture an image of a biometric object. In a second mode, the capacitive sensor is configured to provide presence detection functionality. In the second mode, the capacitive sensor includes at least one first electrode and at least one second electrode selected from a plurality of sensor electrodes. When operating in the second mode, the at least one first electrode is configured to receive a transmit signal, and the at least one second electrode is configured to receive a resulting signal capacitively coupled from the at least one first electrode. Based on the resulting signal, a processing system of the electronic device determines whether a biometric object to be imaged is present in the sensing area.

A microwave (MW) system includes an object support adapted to support an object, a MW transmitter, a MW receiver, an outer rotation unit, an inner rotation unit, a controller and a computation processor. The outer rotation unit includes an outer ring, having a ring shape, with an outer ring mount, upon which one of either an antenna of the MW transmitter or an antenna of the MW receiver is mounted. The inner rotation unit comprises an inner ring, having a ring shape, with an inner ring mount, upon which the other of an antenna of the MW transmitter or an antenna of the MW receiver is mounted. The controller is configured to independently control both the rotation of the inner ring and the outer ring. The computation processor is configured to receive data including MW data representative of MW scattered field detected by the MW receiver.

A voltage-controlled oscillator gain measurement system includes a voltage-controlled oscillator, a voltage detector, and a processor. The voltage-controlled oscillator, which is configured in a phase-locked loop circuit, generates an output signal with an output frequency according to a control signal. The control signal is generated according to the output signal divided by a scaling number. The voltage detector is configured to measure a voltage difference of the control signal. The processor adjusts the scaling number to generate an output frequency difference of the output signal, and obtains a reciprocal gain of the voltage-controlled oscillator by dividing the voltage difference by the output frequency difference.

A voltage-controlled oscillator gain measurement system includes a voltage-controlled oscillator, a voltage detector, and a processor. The voltage-controlled oscillator, which is configured in a phase-locked loop circuit, generates an output signal with an output frequency according to a control signal. The control signal is generated according to the output signal divided by a scaling number. The voltage detector is configured to measure a voltage difference of the control signal. The processor adjusts the scaling number to generate an output frequency difference of the output signal, and obtains a reciprocal gain of the voltage-controlled oscillator by dividing the voltage difference by the output frequency difference.

A method for determining the propagation delay of each path in an integrated circuit is provided herein. The method includes determining, in a worst-based mode, whether a propagation delay of a selected path exceeds a timing requirement; determining, in a path-based mode, whether the propagation delay of a selected path exceeds the timing requirement; and when the selected path exceeds the timing requirement in the path-based mode, lowering the cell delay of each cell in the selected path.

An electromagnetic wave measurement system may include: a reference receiving device; a plurality of auxiliary receiving devices; and a control device connected to the reference receiving device and the plurality of auxiliary receiving devices, wherein the reference receiving device has a wider dynamic range than the plurality of auxiliary receiving devices, the control device collects a frequency-specific measurement value from each of the reference receiving device and the plurality of auxiliary receiving devices, and the frequency-specific measurement value of each of the auxiliary receiving devices is calibrated based on the frequency-specific measurement value of the reference receiving device.

The present invention provides a general four-port on-wafer high frequency de-embedding method. The method comprises: for each on-wafer de-embedding dummy, building a model considering the distributive nature of high frequency characteristics of the on-wafer de-embedding dummy; obtaining the intrinsic Y-parameter admittance matrix of said N on-wafer de-embedding dummies by calculation or simulation by using said models; and solving the equation set which the corresponding measurement and calculation or simulation data of said on-wafer de-embedding dummies satisfy for the elements of the related admittance matrices of the parasitic four-port network to be stripped in de-embedding and model parameters of models on which said calculation or simulation is based.

The present invention provides a general four-port on-wafer high frequency de-embedding method. The method comprises: for each on-wafer de-embedding dummy, building a model considering the distributive nature of high frequency characteristics of the on-wafer de-embedding dummy; obtaining the intrinsic Y-parameter admittance matrix of said N on-wafer de-embedding dummies by calculation or simulation by using said models; and solving the equation set which the corresponding measurement and calculation or simulation data of said on-wafer de-embedding dummies satisfy for the elements of the related admittance matrices of the parasitic four-port network to be stripped in de-embedding and model parameters of models on which said calculation or simulation is based.

A method for obtaining improved resolution pulsed radio frequency (RF) measurements with phase coherence for a device under test (DUT) using a vector network analyzer (VNA) includes generating a pulsed RF test signal, transmitting the pulsed RF test signal to the DUT and receiving a signal from the DUT at the VNA in response to the pulsed RF test signal. An intermediate frequency (IF) signal is generated using a local oscillator (LO) signal. A phase of the LO signal is shifted by a prescribed amount while generating the IF signal. The IF signal is then sampled over multiple pulses and measurements are constructed from the measurements. A discrete Fourier transform (DFT) is then applied to the constructed measurements.

A method for obtaining improved resolution pulsed radio frequency (RF) measurements with phase coherence for a device under test (DUT) using a vector network analyzer (VNA) includes generating a pulsed RF test signal, transmitting the pulsed RF test signal to the DUT and receiving a signal from the DUT at the VNA in response to the pulsed RF test signal. An intermediate frequency (IF) signal is generated using a local oscillator (LO) signal. A phase of the LO signal is shifted by a prescribed amount while generating the IF signal. The IF signal is then sampled over multiple pulses and measurements are constructed from the measurements. A discrete Fourier transform (DFT) is then applied to the constructed measurements.