G01N2223/624

SETTING METHOD, INSPECTION METHOD, DEFECT EVALUATION DEVICE AND STRUCTURE MANUFACTURING METHOD

A setting method for setting at least a part of a region in which a structure of a specimen exists as a target region, for an evaluation of an internal structure of the specimen includes setting an arbitrary position from the region in which the structure of the specimen exists, and setting the target region based on the set position.

Virtual barricade for radiation inspection of predefined paths

A method of operating a radiation inspection system includes identifying a regulatory region along a predetermined path where public access is restricted based upon criteria other than radiation exposure, measuring a radiation exposure level from a radiation source of the radiation inspection system within the regulatory region, irradiating a target within the regulatory region using the radiation source and without erecting a physical barricade, and determining a restricted area around the radiation source. The restricted area corresponds to an area where a radiation exposure rate exceeds a predetermined threshold. The radiation exposure rate may be determined by the radiation exposure level from the radiation source and a speed of the radiation inspection system. The method may include operating the radiation inspection system to dynamically adjust the restricted area so that it does not extend beyond the regulatory region. The radiation inspection system may be moveable along the predetermined path.

DEVICE AND METHOD FOR DETERMINING THE MICROSTRUCTURE OF A METAL PRODUCT, AND METALLURGICAL INSTALLATION

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

MEASURING X-RAY CT APPARATUS AND PRODUCTION WORK PIECE MEASUREMENT METHOD
20190277780 · 2019-09-12 · ·

When measuring a mass-produced work piece using a measuring X-ray CT apparatus, which is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the present invention assigns values to volume data for a predetermined work piece and stores the same as master data; obtains volume data for a mass-produced work piece under identical conditions to the predetermined work piece; measures the volume data and obtains an X-ray CT measured value for the mass-produced work piece; and corrects the X-ray CT measured value for the mass-produced work piece using the master data.

Device and method for the contactless determination of at least one property of a metal product

A device for the contactless determination of at least one property of a metal product during the metallurgical production of the metal product comprises a housing and at least one measuring device comprising a transmitting unit and a receiving unit. An electromagnetic field is generated by the transmitting unit and directed onto the metal product, thereby inducing a physical interaction in the material of the metal product, and a remaining and/or resulting part of this physical interaction is subsequently received by the receiving unit. At least one component of the measuring device comprising the transmitting unit and/or the receiving unit can be moved relative to the housing or the metal product moving therein, in order to thereby set or selectively change a predetermined distance to the metal product for the transmitting unit and/or the receiving unit.

ANALYSIS DEVICE
20190145918 · 2019-05-16 · ·

An analyzer capable of having a pressure value converge to a set vacuum value P in a short time is provided. An analyzer includes a sample chamber in which a sample is placed, an analysis chamber including an X-ray tube and a detector, a gate valve switching between a connecting state where the inside of the sample chamber and the inside of the analysis chamber are connected together and a disconnecting state where the insides of the chambers and are disconnected from each other, a vacuum pump and a pressure regulatory valve connected to the inside of the sample chamber and the inside of the analysis chamber, and a control unit controlling the degree of opening of the pressure regulatory valve to set the internal pressure of the sample chamber and the internal pressure of the analysis chamber at respective set pressure values in the connecting state.

Techniques for Using Oxide Thickness Measurements for Predicting Crack Formation and Growth History in High-Temperature Metallic Components

A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALLOYS BASED THEREON

The invention relates to the field of analytical chemistry and physical methods of analysis, and can be used to determine the hafnium content in metallic zirconium and alloys based thereon. The problem addressed by the proposed invention is to separate the overlapping lines of zirconium in the second order of reflection and hafnium. The proposed method includes plotting a calibration curve for the dependence of the fluorescence intensity of lines of hafnium on its concentration in samples with established hafnium content, preparing samples to a template, the dimensions of which correspond to the sample receptacle of a spectrometer, collimating the emission with a fine collimator with an angular divergence of 14-17 degrees, and separating the spectral range of the hafnium line using an LiF220 crystal analyzer so as to establish thresholds of an amplitude discriminator in a narrow range sufficient for cutting off impulses with high voltage generated by more high-energy zirconium quanta.

Deep Water Radiography
20180120240 · 2018-05-03 ·

An apparatus having a submersible, hollow, closed container and an x-ray imaging system radiation source disposed within that container. The submersible container is configured to withstand at least 10 atmospheric pressure (atm) and hence to withstand being submerged at least 100 meters (m) in a liquid (such as an open body of water) without undergoing permanent deformation. The x-ray imaging system radiation source intern is configured to selectively direct x-rays towards an object under inspection that is external to the submersible container. Detector components can be similarly placed within the aforementioned container or within one or more additional such containers.

Component residual stress testing platform based on neutron diffraction and experimental method thereof

A component residual stress testing platform based on neutron diffraction and experimental method thereof are provided, the testing platform includes a component support, a rotating mainshaft, a first thrust cylindrical roller bearing, a first cylindrical roller bearing, a bearing spacing sleeve, a second cylindrical roller bearing, a sleeve, and a first fixed baffle. The rotating mainshaft is disposed on the component support. The first thrust cylindrical roller bearing, the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing are sleeved on the rotating mainshaft, the sleeve is sleeved outside the first cylindrical roller bearing, the bearing spacing sleeve and the second cylindrical roller bearing, a component to be tested is sleeved on the sleeve. The testing platform can support, move, tilt and rotate the component to be tested in a process of a residual stress testing.