A device capable of simultaneous independent motion measurement of multiple probes in an atomic force microscope includes at least two cantilever arms arranged in parallel. The end of each cantilever arm is provided with a needle tip. The surface of each cantilever arm is provided with a grating structure with a periodic distribution rule for reflecting laser irradiated on the grating structure and receiving the laser through reflected light detectors. The discrimination and motion measurement includes the steps of irradiating the measurement laser of different wavelengths on the back surfaces of multiple probes through the same light path at the same time, adopting the grating structures of different feature sizes as physical labels of the multiple probes and reflecting high-order reflected light of the laser of different wavelengths by the grating structures at different angles to separate the light path.

An atomic force microscope has dual probes composed of a hinge structure, two cantilever beams and needle tips arranged on free ends of the cantilever beams. The hinge structure is a U-shaped body having two ends respectively extended with a first cantilever beam and a second cantilever beam. The free end of the first cantilever beam and the free end of the second cantilever beam are respectively provided with a first needle tip and a second needle tip. The integrated dual probes is operated by the driving function of the probe clamp. Therefore, only a set of motion control and measurement system of the atomic force microscope is required to realize the rapid in-situ switching function of the dual probes.

An atomic force microscope has dual probes composed of a hinge structure, two cantilever beams and needle tips arranged on free ends of the cantilever beams. The hinge structure is a U-shaped body having two ends respectively extended with a first cantilever beam and a second cantilever beam. The free end of the first cantilever beam and the free end of the second cantilever beam are respectively provided with a first needle tip and a second needle tip. The integrated dual probes is operated by the driving function of the probe clamp. Therefore, only a set of motion control and measurement system of the atomic force microscope is required to realize the rapid in-situ switching function of the dual probes.

A system and method of operating an atomic force microscope (AFM) that includes providing relative scanning motion between a probe of the AFM and a sample in a slow scan direction of a data scan to generate a reference image (plane) of a region of interest. Then, relative scanning motion between the probe and the sample is provided in a fast scan direction of a final data scan to generate a data image. By mapping the data image against the reference image in real-time during the supplying step, the preferred embodiments generate a final drift corrected data image without post-image acquisition processing.

A system and method of operating an atomic force microscope (AFM) that includes providing relative scanning motion between a probe of the AFM and a sample in a slow scan direction of a data scan to generate a reference image (plane) of a region of interest. Then, relative scanning motion between the probe and the sample is provided in a fast scan direction of a final data scan to generate a data image. By mapping the data image against the reference image in real-time during the supplying step, the preferred embodiments generate a final drift corrected data image without post-image acquisition processing.

The invention relates to a probe cassette for storing, transporting and handling one or more probe devices for a probe based system, the cassette including: a cassette body having at least one probe receptacle arranged to accommodate a probe device, a lid connectable to the cassette body, and a clamping unit configured to retain the probe device at the receptacle by exerting a clamping force on said probe device when the lid is in a closed position, wherein the clamping unit includes an adjustment member for adjusting the clamping force, wherein the clamping unit is selectively operable from a first position, in which the clamping force is insufficient to provide clamping, to a plurality of second positions, in which the clamping force is sufficient to an extent at which movement of the probe device at the receptacle is prevented.

The invention relates to a probe cassette for storing, transporting and handling one or more probe devices for a probe based system, the cassette including: a cassette body having at least one probe receptacle arranged to accommodate a probe device, a lid connectable to the cassette body, and a clamping unit configured to retain the probe device at the receptacle by exerting a clamping force on said probe device when the lid is in a closed position, wherein the clamping unit includes an adjustment member for adjusting the clamping force, wherein the clamping unit is selectively operable from a first position, in which the clamping force is insufficient to provide clamping, to a plurality of second positions, in which the clamping force is sufficient to an extent at which movement of the probe device at the receptacle is prevented.

The present disclosure provides a method and system for quantifying a degree of blending of virgin and aged asphalt in HRAM. The method includes the following steps: first, constructing a relational equation between the microscale modulus of recycled asphalt in a fully blended state and the content of the aged asphalt; measuring the microscale modulus of the recycled asphalt, the microscale modulus of the aged asphalt, the microscale modulus of the virgin asphalt, and the content of the aged asphalt in the HRAM in situ; inputting the dates above into the relational equation to obtain the microscale modulus of the recycled asphalt in the fully blended state; and based on the microscale modulus of the recycled asphalt measured in situ and the microscale modulus of the recycled asphalt in the fully blended state, obtaining the degree of blending of the virgin and aged asphalt in the HRAM.

The present disclosure provides a method and system for quantifying a degree of blending of virgin and aged asphalt in HRAM. The method includes the following steps: first, constructing a relational equation between the microscale modulus of recycled asphalt in a fully blended state and the content of the aged asphalt; measuring the microscale modulus of the recycled asphalt, the microscale modulus of the aged asphalt, the microscale modulus of the virgin asphalt, and the content of the aged asphalt in the HRAM in situ; inputting the dates above into the relational equation to obtain the microscale modulus of the recycled asphalt in the fully blended state; and based on the microscale modulus of the recycled asphalt measured in situ and the microscale modulus of the recycled asphalt in the fully blended state, obtaining the degree of blending of the virgin and aged asphalt in the HRAM.

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.