Patent classifications
G01R27/32
NOISE-INDEPENDENT LOSS CHARACTERIZATION OF NETWORKS
An S-parameter of a reference impedance is determined and converted to a desired mode of operation. Example modes of operation include a single-ended input output mode, a differential input output mode, and a common input output mode. The complex values of the impedance at each port as a function of frequency can be computed using the novel closed-form quadratic S-parameter equation which utilizes the concept of matched networks by setting the reflections and re-reflections to zero through S-parameter renormalization. Using the S-parameter renormalization, the insertion loss corresponding to zero reflections and re-reflections is calculated. Based on the determination of the matching impedance used to reduce the reflections and re-reflections to zero, a parameter of a circuit comprising the network may be modified to reduce noise.
SYSTEM AND METHOD FOR CHANNEL OPTIMIZATION USING VIA STUBS
Embodiments described herein relate to a method for modifying transmission line characteristics. The method may include: making a first determination of a null frequency of an input signal to a transmission line; performing an analysis to make a second determination of a wavelength of the input signal using, at least in part, the null frequency; making a third determination, based on the analysis, of a half wavelength of the input signal; calculating, based on the half wavelength, a total stub length; and adding a trace to a stub associated with a via, wherein the stub and the trace are a length that is at least a portion of the half wavelength of the input signal.
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
A calibration method includes: acquiring eight error models obtained after a preliminary calibration of a Terahertz frequency band system; based on the eight error models, determining a first mathematical model according to a first S parameter related to a first calibration piece, the first mathematical model comprising parallel crosstalk terms between probes, and determining a second mathematical model according to a second S parameter related to a second calibration piece, the second mathematical model comprising series crosstalk terms between the probes; determining a third mathematical model according to a third S parameter related to a measured piece; and solving and obtaining a Z parameter of the measured piece based on the first mathematical model, the second mathematical model and the third mathematical model, and acquiring an S parameter of the measured piece according to the Z parameter of the measured piece.
METHOD AND SYSTEM FOR SIDEBAND CORRECTED NOISE-POWER MEASUREMENT
A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.
METHOD AND SYSTEM FOR SIDEBAND CORRECTED NOISE-POWER MEASUREMENT
A method and a measurement system for determining the noise power of a device under test especially the exact noise power is provided. The measurement method comprises determining a sideband gain of a measurement system using a calibration unit, connecting a device under test to the measurement system, measuring a noise power of the device under test with a receiver and correcting the measured noise power with the determined system gain including a sideband gain.
PRE-SCREENING AND TUNING HETEROJUNCTIONS FOR TOPOLOGICAL QUANTUM COMPUTER
A method to evaluate a semiconductor-superconductor heterojunction for use in a qubit register of a topological quantum computer includes (a) measuring one or both of a radio-frequency (RF) junction admittance of the semiconductor-superconductor heterojunction and a sub-RF conductance including a non-local conductance of the semiconductor-superconductor heterojunction, to obtain mapping data and refinement data; (b) finding by analysis of the mapping data one or more regions of a parameter space consistent with an unbroken topological phase of the semiconductor-superconductor heterojunction; and (c) finding by analysis of the refinement data a boundary of the unbroken topological phase in the parameter space and a topological gap of the semiconductor-superconductor heterojunction for at least one of the one or more regions of the parameter space.
SELF-CALIBRATING TRANSMISSION LINE RESONATOR OSCILLATING DRIVER APPARATUS
A self-calibrating transmission line resonator oscillating driver apparatus, including: a first output driver module configured to transmit a first forward signal along a transmission line; a second output driver module configured to transmit a second forward signal along the transmission line; a first reflection detection module configured to detect a first return signal of the first forward signal reflected along the transmission line; and a second reflection detection module configured to detect a second return signal of the second forward signal reflected along the transmission line; wherein, when the first reflection detection module detects the first return signal of the first forward signal reflected along the second direction of the transmission line, providing a signal to i) change a power state of the first output driver module to an off-power state and to ii) change a power state of the second output driver module to an on-power state.
SELF-CALIBRATING TRANSMISSION LINE RESONATOR OSCILLATING DRIVER APPARATUS
A self-calibrating transmission line resonator oscillating driver apparatus, including: a first output driver module configured to transmit a first forward signal along a transmission line; a second output driver module configured to transmit a second forward signal along the transmission line; a first reflection detection module configured to detect a first return signal of the first forward signal reflected along the transmission line; and a second reflection detection module configured to detect a second return signal of the second forward signal reflected along the transmission line; wherein, when the first reflection detection module detects the first return signal of the first forward signal reflected along the second direction of the transmission line, providing a signal to i) change a power state of the first output driver module to an off-power state and to ii) change a power state of the second output driver module to an on-power state.
Optimizing design and performance for printed circuit boards
A printed circuit board (PCB) includes a plurality of layers disposed at different depths of the PCB, circuit components disposed at different layers of the PCB, and a plurality of temperature measurement sensors located at one or more layers of the PCB, where each temperature measurement sensor is associated with a corresponding circuit component. A measured temperature is obtained at an embedded temperature measurement sensor located at an embedded layer within the PCB, and the measured temperature is correlated with an electrical property of an embedded circuit component located at the same embedded layer within the PCB as the embedded temperature measurement sensor. A plurality of moisture measurement sensors can also be located at one or more layers of the PCB to facilitate a measured moisture with an electrical property of an embedded circuit component.
Device and method for detecting intention to lock or unlock a motor vehicle opening element
A device for detecting a user's intention to lock or unlock a motor vehicle opening element, this device being integrated into a handle, including: an inductive sensor that includes an LC resonant circuit consisting at least of a coil and a main capacitor; a handle target; a microcontroller equipped with a unit for measuring the resonant frequency of the LC resonant circuit; an adjustment device for adjusting the value of the total capacitance of the LC resonant circuit, this adjustment device providing at least two different total capacitance values for the LC resonant circuit.