A device for detecting a user's intention to lock or unlock a motor vehicle opening element, this device being integrated into a handle, including: an inductive sensor that includes an LC resonant circuit consisting at least of a coil and a main capacitor; a handle target; a microcontroller equipped with a unit for measuring the resonant frequency of the LC resonant circuit; an adjustment device for adjusting the value of the total capacitance of the LC resonant circuit, this adjustment device providing at least two different total capacitance values for the LC resonant circuit.

A method for emulating a reactive source impedance for a generator connected to a load. The method comprises adjusting an output of the generator, wherein, in response to adjustment of the output, a first measured value M1 calculated with respect to a weighted sum of voltage v, current i and derivatives of the voltage v and the current i tends to a first setpoint S1 for M1. The method also includes receiving a second setpoint S2 for a second measured value M2 and adjusting S1 to adjust the second measured value M2 of a conventional measure of generator output towards the second setpoint S2 for M2, wherein holding M1 constant emulates a desired source impedance of the generator.

A method for emulating a reactive source impedance for a generator connected to a load. The method comprises adjusting an output of the generator, wherein, in response to adjustment of the output, a first measured value M1 calculated with respect to a weighted sum of voltage v, current i and derivatives of the voltage v and the current i tends to a first setpoint S1 for M1. The method also includes receiving a second setpoint S2 for a second measured value M2 and adjusting S1 to adjust the second measured value M2 of a conventional measure of generator output towards the second setpoint S2 for M2, wherein holding M1 constant emulates a desired source impedance of the generator.

The disclosure provides a calibration method, a system and a device of an on-wafer S parameter of a vector network analyzer. The method comprises the steps of: acquiring a first parameter of a first crosstalk calibration piece measured by the vector network analyzer; obtaining a main crosstalk error term based on the first parameter of the first crosstalk calibration piece and a calibration parameter of the first crosstalk calibration piece; acquiring a second parameter of a second crosstalk calibration piece measured by the vector network analyzer based on the main crosstalk error term; and obtaining a secondary crosstalk error term based on the second parameter of the second crosstalk calibration piece and a calibration parameter of the second crosstalk calibration piece, wherein the main crosstalk error term and the secondary crosstalk error term are used for calibrating the vector network analyzer.

The present application provides two-port on-wafer calibration piece circuit models and a method for determining parameters. The method includes: measuring a single-port on-wafer calibration piece circuit model corresponding to a first frequency band to obtain a first S parameter; calculating, according to the first S parameter, an intrinsic capacitance value of a two-port on-wafer calibration piece circuit model corresponding to the single-port on-wafer calibration piece circuit model; measuring the two-port on-wafer calibration piece circuit model corresponding to the terahertz frequency band to obtain a second S parameter; and calculating a parasitic capacitance value and a parasitic resistance value of the two-port on-wafer calibration piece circuit model according to the second S parameter and the intrinsic capacitance value.

Embodiments herein provide a test apparatus and system for a millimeter wave reflection test to measure propagation of millimeter wave signal through a material at various incident angles. In one example, the test apparatus may include a mechanized arch over a base plate, the mechanized arch including antenna carriers coupled to the mechanized arch and configured to hold respective antennas. A motor assembly moves the antenna carriers along the mechanized arch while maintaining the antenna carriers at symmetrical (equal and opposite) angles with respect to the base plate.

A method includes: constructing an on-wafer calibration piece model set that includes one or more on-wafer calibration piece models, where each of the one or more on-wafer calibration piece models has a corresponding on-wafer calibration piece; selecting an on-wafer calibration piece model from the on-wafer calibration piece model set; measuring the on-wafer calibration piece utilizing an on-wafer S parameter measurement system that is calibrated using a multi-thread TRL calibration method in a Terahertz frequency band, to obtain an S parameter of the on-wafer calibration piece; and calculating a plurality of different parameters that represent crosstalk of calibration pieces in the on-wafer calibration piece model, according to an admittance calculated according to the S parameter and an admittance formula corresponding to the on-wafer calibration piece model.

A load-pull tuner is disclosed herein. The tuner comprises a transmission line network and dielectrics positionable above the transmission line network. The transmission line network comprising a main transmission line and two stubs connected to the main transmission line, the two stubs being transmission lines. The main transmission line and the two stubs being tunable transmission lines. The load-pull tuner directly connect to a Ground-Signal-Ground (GSG) probe. The load-pull tuner may be used at higher reflection coefficients for phased-array system characterization.

A load-pull tuner is disclosed herein. The tuner comprises a transmission line network and dielectrics positionable above the transmission line network. The transmission line network comprising a main transmission line and two stubs connected to the main transmission line, the two stubs being transmission lines. The main transmission line and the two stubs being tunable transmission lines. The load-pull tuner directly connect to a Ground-Signal-Ground (GSG) probe. The load-pull tuner may be used at higher reflection coefficients for phased-array system characterization.

A series tee splitter comprises a primary electromagnetic transmission line and a secondary electromagnetic transmission line that is placed in a series path with the primary electromagnetic transmission line, wherein a load is attached to the end of the secondary electromagnetic transmission line and a network analyzer is connected to opposite ends of the primary electromagnetic transmission line to measure a load impedance. This configuration increases the high impedance measurement limit of the network analyzer normally seen for reflection measurements. The series tee splitter can be electrically small to provide broadband impedance information.