A detector that detects or oscillates an electromagnetic wave, the detector including a plurality of antennas having a rectifying element, wherein the plurality of arranged antennas at least include: a first antenna having a first resonant frequency; and a second antenna having a second resonant frequency that differs from the first resonant frequency.

The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.

The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.

Embodiments described herein relate to a method for modifying transmission line characteristics. The method may include: making a first determination of a null frequency of an input signal to a transmission line; performing an analysis to make a second determination of a wavelength of the input signal using, at least in part, the null frequency; making a third determination, based on the analysis, of a half wavelength of the input signal; calculating, based on the half wavelength, a total stub length; and adding a trace to a stub associated with a via, wherein the stub and the trace are a length that is at least a portion of the half wavelength of the input signal.

A waveguide low profile slide-screw impedance tuner for seamless on-wafer integration uses rotating metallic tuning probe. This ensures high resolution in the area where the probe penetration is maximum (high GAMMA), a smooth increase of depth (basic anti-electrical discharge—“Corona” form) and compensation for the negative phase trajectory at higher GAMMA, native to traditional vertically moving stub-probes in waveguide tuners. Also, using rotating disc-probes simplifies the tuner mechanics, eliminates the cumbersome precise vertical axis and gear and flattens the tuner profile for best direct connection with wafer-probes.

A waveguide low profile slide-screw impedance tuner for seamless on-wafer integration uses rotating metallic tuning probe. This ensures high resolution in the area where the probe penetration is maximum (high GAMMA), a smooth increase of depth (basic anti-electrical discharge—“Corona” form) and compensation for the negative phase trajectory at higher GAMMA, native to traditional vertically moving stub-probes in waveguide tuners. Also, using rotating disc-probes simplifies the tuner mechanics, eliminates the cumbersome precise vertical axis and gear and flattens the tuner profile for best direct connection with wafer-probes.

A tuner system for conducting measurements on a Device Under Test (DUT) includes at least one passive tuner, and calibration data for the at least one passive tuner including a set of s-parameters at a set of calibration frequencies. A measurement on the DUT is done at a measurement frequency at which the at least one passive tuner is not calibrated. The tuner s-parameters at the measurement frequency are determined by interpolation between or extrapolation from the s-parameters at calibration frequencies.

A tuner system for conducting measurements on a Device Under Test (DUT) includes at least one passive tuner, and calibration data for the at least one passive tuner including a set of s-parameters at a set of calibration frequencies. A measurement on the DUT is done at a measurement frequency at which the at least one passive tuner is not calibrated. The tuner s-parameters at the measurement frequency are determined by interpolation between or extrapolation from the s-parameters at calibration frequencies.

A device for detecting a user's intention to lock or unlock a motor vehicle opening element, this device being integrated into a handle, including: an inductive sensor that includes an LC resonant circuit consisting at least of a coil and a main capacitor; a handle target; a microcontroller equipped with a unit for measuring the resonant frequency of the LC resonant circuit; an adjustment device for adjusting the value of the total capacitance of the LC resonant circuit, this adjustment device providing at least two different total capacitance values for the LC resonant circuit.

A method for controlling a generator connected to a load involving obtaining a first measured value (M1) related to a forward power calculated with respect to reference impedance (Z.sub.c). The method involves adjusting an output of the generator in order that M1 tends to a first setpoint. The method further involves adjusting the first setpoint in order to adjust a second measured value (M2) of a conventional measure of generator output towards a second setpoint, where wherein the forward power calculated with respect to the reference impedance (Z.sub.c) is equal to: $\frac{{.Math.v+Z_{c}i.Math.}^2}{2\sqrt{\mathrm{real}\left(Z_c\right)}}$
where v is a voltage at a reference point, which may be between the generator and load input, and i is a current flowing relative to the load (e.g., current toward the load or a negative value of current toward the generator) at the reference point.