Patent classifications
G01N21/3563
PERMITTIVITY MEASURING DEVICE AND THICKNESS MEASURING DEVICE
An object permittivity measurement apparatus according to the present disclosure includes: a light wave distance measurement device configured to measure reciprocating time t of a light wave with which an object is irradiated and that is reflected and returned from the object, and calculate a distance L to the object using the following equation (1),
L=ct/2 (1)
c: light speed;
an electromagnetic wave phase measurement device configured to measure a rotated phase φ of an electromagnetic wave having a frequency f with which the object is irradiated and that is reflected and returned from the object; and
a permittivity calculation circuit configured to calculate permittivity ε of a foreign material on an object surface using the following equation (2),
φ=4πLf/c+4π(ε).sup.1/2df/c (2)
d: a thickness of the foreign material on the object surface.
PERMITTIVITY MEASURING DEVICE AND THICKNESS MEASURING DEVICE
An object permittivity measurement apparatus according to the present disclosure includes: a light wave distance measurement device configured to measure reciprocating time t of a light wave with which an object is irradiated and that is reflected and returned from the object, and calculate a distance L to the object using the following equation (1),
L=ct/2 (1)
c: light speed;
an electromagnetic wave phase measurement device configured to measure a rotated phase φ of an electromagnetic wave having a frequency f with which the object is irradiated and that is reflected and returned from the object; and
a permittivity calculation circuit configured to calculate permittivity ε of a foreign material on an object surface using the following equation (2),
φ=4πLf/c+4π(ε).sup.1/2df/c (2)
d: a thickness of the foreign material on the object surface.
DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE WITH A LWIR IMAGING SYSTEM
A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.
DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE WITH A LWIR IMAGING SYSTEM
A method and an LWIR imaging system for detecting an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of a substrate or within a substrate are described. The method comprises the steps of i) providing an LWIR imaging system, the LWIR imaging system comprising a) an infrared light emitting source (A) that emits over the whole range of 8 to 14 micrometers, b) an LWIR detecting device (B) and c) a ToF distance sensor (C), ii) providing a substrate comprising an amorphous and/or crystalline structure of phosphate and/or sulphate salts on the surface of the substrate or within the substrate, ii) irradiating the provided substrate with the infrared light emitting source and iii) detecting, with the LWIR detecting device and using and/or based on the TOF distance sensor, the intensity of electromagnetic radiation scattered, emitted and/or reflected by the substrate and the amorphous and/or crystalline structure of phosphate and/or sulphate salts.
Methods and Systems for Detecting Water Status in Plants Using Terahertz Radiation
Methods and systems for determining water status in plant tissue are provided. A number of systems are capable of using terahertz signals to generate signals measuring total water content in plant tissue, including plant leaves. Using these signals, methods are capable of determining water status variables, including water mass per leaf area, relative water content, and leaf water potential, which can aid in agricultural, ecological, and environmental health, such as dehydration and droughst stress of plants.
Methods and Systems for Detecting Water Status in Plants Using Terahertz Radiation
Methods and systems for determining water status in plant tissue are provided. A number of systems are capable of using terahertz signals to generate signals measuring total water content in plant tissue, including plant leaves. Using these signals, methods are capable of determining water status variables, including water mass per leaf area, relative water content, and leaf water potential, which can aid in agricultural, ecological, and environmental health, such as dehydration and droughst stress of plants.
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
Methods and apparatus for obtaining extremely high sensitivity chemical composition maps with spatial resolution down to a few nanometers. In some embodiments these chemical composition maps are created using a combination of three techniques: (1) Illuminating the sample with IR radiation than is tuned to an absorption band in the sample; and (2) Optimizing a mechanical coupling efficiency that is tuned to a specific target material; (3) Optimizing a resonant detection that is tuned to a specific target material. With the combination of these steps it is possible to obtain (1) Chemical composition maps based on unique IR absorption; (2) spatial resolution that is enhanced by extremely short-range tip-sample interactions; and (3) resonant amplification tuned to a specific target material. In other embodiments it is possible to take advantage of any two of these steps and still achieve a substantial improvement in spatial resolution and/or sensitivity.
Grazing angle probe mount for quantum cascade lasers
A simple optical layout for a grazing angle probe mount that allows coupling to a mid-infrared (MIR), laser-based spectrometer is provided. The assembly enables doing reflectance measurements at high incident angles. In the case of optically thin films and deposits on MIR reflective substrates, a double pass effect, accompanied by absorption by the chemicals or biological samples deposited in an Infrared Reflection-Absorption Infrared Spectroscopy (IRRAS) modality is achieved. The optical system includes a probe that allows the passage of MIR light through the same sampling area twice. Initially, the infrared beam produces a spot on the surface, and then the light is returned in back reflection to the sample surface producing a new little slightly larger spot onto the selfsame position.
Grazing angle probe mount for quantum cascade lasers
A simple optical layout for a grazing angle probe mount that allows coupling to a mid-infrared (MIR), laser-based spectrometer is provided. The assembly enables doing reflectance measurements at high incident angles. In the case of optically thin films and deposits on MIR reflective substrates, a double pass effect, accompanied by absorption by the chemicals or biological samples deposited in an Infrared Reflection-Absorption Infrared Spectroscopy (IRRAS) modality is achieved. The optical system includes a probe that allows the passage of MIR light through the same sampling area twice. Initially, the infrared beam produces a spot on the surface, and then the light is returned in back reflection to the sample surface producing a new little slightly larger spot onto the selfsame position.