Patent classifications
H03M1/121
Analog-to-digital converter having quantization error duplicate mechanism
The present invention provides an ADC including a first switched capacitor array, a second switched capacitor array, a third switched capacitor array, an integrator and a quantizer. The first switched capacitor array is configured to sample the input signal to generate a first sampled signal. The second switched capacitor array is configured to sample the input signal to generate a second sampled signal and generate a first quantization error. The third switched capacitor array is configured to sample the input signal to generate a third sampled signal and generate a second quantization error. The integrator is configured to receive the first quantization error and the second quantization error in a time-interleaving manner, and integrate the first/second quantization error to generate an integrated quantization error. The quantizer is configured to quantize the first sampled signal by using the integrated quantization error as a reference voltage to generate a digital output signal.
Analog to digital converting system, time-skew calibration method, and related computer program product
An analog-to-digital converting system includes multiple stages of analog-to-digital converters (ADCs) and a skew calibration circuit. The multiple stages of ADCs are configured to sample a test signal according to multiple interleaved clock signals, respectively, so as to respectively generate multiple stages of quantized outputs. The analog-to-digital converting system has a sampling frequency resulting from operations of the multiple stages of ADCs. The test signal has a first frequency and the sampling frequency is N times the first frequency, and N is an odd number larger than 1. The skew calibration circuit is configured to sequentially analysis, for every N stages, the multiple stages of quantized outputs to generate multiple digital codes. The skew calibration circuit is further configured to calibrate a time skew of the analog-to-digital converting system according to a comparison result between the multiple digital codes and a reference code.
ADC slicer reconfiguration for different channel insertion loss
A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the insertion loss mode of the receiver. For example, different portions of a plurality of time-interleaved successive approximation (SAR) ADC slices included in at least one sub-ADC of each time-interleaved ADC may be enabled depending on which of a plurality of insertion loss modes is selected for operation of the receiver.
Time-interleaved sub-ranging analog-to-digital converter
A sub-ranging analog-to-digital converter (ADC) includes a coarse ADC and a fine ADC that receives a set of coarse signals from the coarse ADC. The fine ADC includes multiple digital-to-analog converters (DACs) and multiple converters such that a number of converters is less than a number of DACs. The DACs and the converters function in a partial time-interleaved manner where each DAC receives an analog input signal in different non-overlapping durations of a clock signal and generates a corresponding analog output signal. At least one of the converters is coupled with at least two DACs, and each converter is configured to receive the corresponding analog output signals and perform conversion operation to generate digital signals in non-overlapping durations of the clock signal, respectively. The durations for performing conversion operation of at least two of the converters overlap partially.
ADC RECONFIGURATION FOR DIFFERENT DATA RATES
A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the data rate of the receiver. For example, more portions of each time-interleaved ADC may be enabled to support a higher data rate of the receiver and less portions of the ADCs may be used to support a lower data rate of the receiver.
Laser distance measuring module with INL error compensation
A distance measuring method and an electronic laser distance measuring module, in particular for use in a distance measuring apparatus, especially configured as a laser tracker, tachymeter, laser scanner, or profiler, for fast signal detection with an analog-to-digital converter, wherein conversion errors that arise in the context of a signal digitization, in particular timing, gain and offset errors of the ADC, are compensated for by means of variation of the sampling instants.
ANALOG-TO-DIGITAL CONVERTER HAVING QUANTIZATION ERROR DUPLICATE MECHANISM
The present invention provides an ADC including a first switched capacitor array, a second switched capacitor array, a third switched capacitor array, an integrator and a quantizer. The first switched capacitor array is configured to sample the input signal to generate a first sampled signal. The second switched capacitor array is configured to sample the input signal to generate a second sampled signal and generate a first quantization error. The third switched capacitor array is configured to sample the input signal to generate a third sampled signal and generate a second quantization error. The integrator is configured to receive the first quantization error and the second quantization error in a time-interleaving manner, and integrate the first/second quantization error to generate an integrated quantization error. The quantizer is configured to quantize the first sampled signal by using the integrated quantization error as a reference voltage to generate a digital output signal.
Digital sampling to control resonator frequency and phase in a LINAC
A system for measuring and controlling the phase of an incoming analog waveform is disclosed. The system comprises an analog to digital converter to convert the incoming analog waveform to a digital representation. The system also includes a clock delay generator, which allows a programmable amount of delay to be introduced into the sample clock for the ADC. The system further comprises a controller to manipulate the delay used by the clock delay generator and store the outputs from the ADC. The controller can then use the digitized representation to determine the frequency of the incoming analog waveform, its phase drift and its phase relative to a master clock. The controller can then modify the output of a RF generator in response to these determinations.
ADC reconfiguration for different data rates
A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the data rate of the receiver. For example, more portions of each time-interleaved ADC may be enabled to support a higher data rate of the receiver and less portions of the ADCs may be used to support a lower data rate of the receiver.
Time-interleaved analog-to-digital converter device and associated control method
The present invention provides a time-interleaved analog-to-digital converter device, wherein the time-interleaved analog-to-digital converter device includes a random number generator, a plurality of ADCs and an output circuit. The random number generator is configured to generate a random number sequence. The plurality of ADCs are configured to receive an analog input signal to generate a plurality of digital signals, respectively, and each ADC is further configured to generate a selection signal according to the random number sequence. The output circuit is configured to select one of the digital signals according to the selection signals generated by the ADCs, to generate a digital output signal.