According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.

Systems, apparatuses, and methods for implementing a low-power, single-pin retention flip-flop with a balloon latch are described. A flip-flop is connected to a retention latch to store a value of the flip-flop during a reduced power state. A single retention pin is used to turn on the retention latch. During normal mode, the retention latch is pre-charged and a change in the value stored by the flip-flop does not cause the retention latch to toggle. This helps to reduce the power consumed by the circuit during normal mode (i.e., non-retention mode). When the retention signal becomes active, the retention latch gets triggered and the value stored by the flip-flop is written into the retention latch. Later, if the flip-flop is powered down and then powered back up while the circuit is in retention mode, the value in the retention latch gets written back into the flip-flop.

An apparatus includes a comparator. The comparator includes first and second pregain stages, and a switch network coupled to the first and second pregain stages. A plurality of switches in the switch network are operable to provide a feedback path around at least one of the first and second pregain stages. The comparator further includes a latch coupled to the second pregain stage.

A circuit for generating a protection signal and a protection apparatus are provided. The circuit includes: a first flip flop, wherein the first flip flop is configured for receiving an enabling signal and an external signal input to the first flip flop and outputting a first level according to the enabling signal and the external signal; a second flip flop, wherein the second flip flop is in connection with the first flip flop and the second flip flop is configured for outputting a protection signal according to the first level and the external signal; and a feedback device, wherein the feedback device is connected between an output terminal of the second flip flop and an input terminal of the first flip flop and the feedback device is configured for outputting the enabling signal.

A system is provided, comprising: a plurality of flip-flops that are configured to receive a reset signal, each of the plurality of flip-flops having a respective output port, and each of the plurality of flip-flops being configured to assume a respective default state when the reset signal is set to a predetermined value; and a reset monitor circuit that is coupled to the respective output port of each of the plurality of flip-flops, the reset monitor circuit being configured to generate a status signal indicating whether each of the flip-flops has assumed the flip-flop's respective default state after the reset signal is set to the predetermined value, wherein assuming a respective default state by each of the plurality of flip-flops results in a predetermined bit string being stored in the plurality of flip-flops.

A system is provided, comprising: a plurality of flip-flops that are configured to receive a reset signal, each of the plurality of flip-flops having a respective output port, and each of the plurality of flip-flops being configured to assume a respective default state when the reset signal is set to a predetermined value; and a reset monitor circuit that is coupled to the respective output port of each of the plurality of flip-flops, the reset monitor circuit being configured to generate a status signal indicating whether each of the flip-flops has assumed the flip-flop's respective default state after the reset signal is set to the predetermined value, wherein assuming a respective default state by each of the plurality of flip-flops results in a predetermined bit string being stored in the plurality of flip-flops.

A sequential circuit with timing event detection is disclosed. The sequential circuit has an input that is asserted to the output during the second clock phase of a two phase clock signal. A timing event detector is coupled to the sequential element input to assert a timing event signal if a transition occurs at the sequential element input during the second clock phase but not to assert during the first clock phase.

A high-voltage level shifter circuit that is capable of level shifting a signal from a low-voltage rail to a high-voltage rail for effective gate driving of a top power switch, with a short propagation delay and a high common-mode transient immunity (CMTI). The high CMTI high-voltage level shifter circuit can include a differential input and isolation stage, a high dv/dt sensor and cancellation stage, at least one differential and common-mode gain stage, and an output buffer stage.

A clocked comparator includes a first clocked transconductance amplifier configured to receive a first voltage signal and output a first current signal to an internal node in accordance with a clock; a clocked regenerative load configured to enable a second voltage signal at the internal node to self-regenerate in accordance with the clock; a SR (set-reset) latch configured to receive the second voltage signal at the internal node and output a third voltage signal; and a second clocked transconductance amplifier configured to receive the third voltage signal and output a second current signal to the internal node.

A latch is provided. The latch includes a plurality of storage nodes including a plurality of data storage nodes configured to store a data bit having one of two states and a plurality of complementary data storage nodes configured to store a complement of the data bit. The latch includes a plurality of supply voltage multi-dependency stages respectively corresponding to the plurality of storage nodes. Each supply voltage multi-dependency stage has an output coupled to a storage node and at least two control inputs respectively coupled to at least two other storage nodes of the plurality of storage nodes. The supply voltage multi-dependency stage is configured to cause a state of the data bit stored in the storage node to change from a first state to a second state in response a change in both states of two data bits respectively stored in the at least two other storage nodes.