To provide a semiconductor device with improved reliability by suppressing a degree at which heat generated by a semiconductor element is transferred through a heat radiation plate to a bonding portion between a metal electrode and an insulating substrate. The semiconductor device includes a heat radiation plate, at least one insulating substrate, a semiconductor element, and a metal electrode. The at least one insulating substrate is bonded on one main surface of the heat radiation plate, the semiconductor element is bonded on the one main surface via any of the at least one insulating substrate, the metal electrode is bonded on the one main surface via any of the at least one insulating substrate. The heat radiation plate has, in a region between a region where the semiconductor element is bonded and a region where the metal electrode is bonded, a narrowed portion.

A semiconductor structure includes at least a first chip, the first chip comprising a semiconductor substrate and an active layer formed on an upper surface of the substrate, one or more lateral metal-oxide semiconductor devices being formed in the active layer of the first chip. The semiconductor structure further includes at least a first integrated capacitor disposed on a back-side of the semiconductor substrate of the first chip. The first integrated capacitor includes a first conductive layer in electrical connection with the back-side of the substrate, an insulating layer formed on at least a portion of an upper surface of the first conductive layer, and a second conductive layer formed on at least a portion of an upper surface of the insulating layer.

A semiconductor package is provided. The semiconductor package includes: a first redistribution substrate; a semiconductor chip provided on the first redistribution substrate; a molding layer provided on the first redistribution substrate and the semiconductor chip; and a second redistribution substrate provided on the molding layer. The second redistribution substrate includes: redistribution patterns spaced apart from one another; a first dummy conductive pattern spaced apart from the redistribution patterns; an insulating layer provided on the first dummy conductive pattern; and a marking metal layer provided on the insulating layer and spaced apart from the first dummy conductive pattern. Sidewalls of the marking metal layer overlap the first dummy conductive pattern along a vertical direction perpendicular to an upper surface of the first redistribution substrate.

A semiconductor memory package includes a substrate, a first stack of memory dies, and a second stack of memory dies. The substrate includes a top layer and a bottom layer. The first stack of memory dies is electrically coupled to the top layer of the substrate and includes a controller and a first number of memory dies. The second stack of memory dies is electrically coupled to the top layer of the substrate and includes a second number of memory dies greater than the first number of memory dies. An upper surface of the first stack of memory dies and an upper surface of the second stack of memory dies are substantially coplanar.

Provided are a power module and a manufacturing method thereof. The power module includes an insulating substrate, a first, a second and a third conductive layers, a first thermal interface material layer, a first and a second chips and a thermal conductive layer. The insulating substrate has a first and a second surfaces opposite to each other. The first and the second conductive layers are disposed on the first surface, and electrically separated from each other. The first thermal interface material layer is disposed on the first conductive layer. The third conductive layer is disposed on the first thermal interface material layer. The first chip is disposed on the third conductive layer and electrically connected to the third conductive layer. The second chip is disposed on the second conductive layer and electrically connected to the second conductive layer. The thermal conductive layer is disposed on the second surface.

Apparatuses relating generally to a microelectronic package having protection from interference are disclosed. In an apparatus thereof, a substrate has an upper surface and a lower surface opposite the upper surface and has a ground plane. A first microelectronic device is coupled to the upper surface of the substrate. Wire bond wires are coupled to the ground plane for conducting the interference thereto and extending away from the upper surface of the substrate. A first portion of the wire bond wires is positioned to provide a shielding region for the first microelectronic device with respect to the interference. A second portion of the wire bond wires is not positioned to provide the shielding region. A second microelectronic device is coupled to the substrate and located outside of the shielding region. A conductive surface is over the first portion of the wire bond wires for covering the shielding region.

Embodiments include systems in packages (SiPs) and a method of forming the SiPs. A SiP includes a package substrate and a first modularized sub-package over the package substrate, where the first modularized sub-package includes a plurality of electrical components, a first mold layer, and a redistribution layer. The SiP also includes a stack of dies over the package substrate, where the first modularized sub-package is disposed between the stack of dies. The SiP further includes a plurality of interconnects coupled to the stack of dies, the first modularized sub-package, and the package substrate, wherein the redistribution layer of the first modularized sub-package couples the stack of dies to the package substrate with the plurality of interconnects. The SiP may enable the redistribution layer of the first modularized sub-package to couple the electrical components to the stacked dies and the package substrate without a solder interconnect.

A stacked memory POP structure and method are disclosed. The POP structure includes a first package unit of three-dimensional memory chip package and a system-in-package (SiP) package unit of two-dimensional fan-out peripheral circuit. The first package unit includes: memory chips laminated in a stepped configuration; wire bonding structures; and a first encapsulating layer. The SiP package unit includes: a first rewiring layer; a peripheral circuit chip a second rewiring layer bonded to the peripheral circuit chip; metal connection pillars electrically connected with the first rewiring layer and the second rewiring layer; a second encapsulating layer, which encapsulates the peripheral circuit chip and the metal connection pillars; and metal bumps on the first rewiring layer. The wire bonding structures are wire-bonded to the second rewiring layer to connect the memory chips to the second rewiring layer, thereby achieving attachment between the first package unit and the SiP package unit.

A method for forming a contact connection between a chip-and a conductor material formed on a non-conductive substrate, the chip being arranged on the substrate or on another conductor material track, a sinter paste consisting of at least 40% silver or copper being applied to respective chip contact surfaces of the chip and the conductor material track, a contact conductor being immersed in the sinter paste on the chip contact surface and in the sinter paste on the conductor material track, and the contact connection being formed by sintering the sinter paste by means of laser energy.

A chip package includes a carrier board, a chip, a light transmissive sheet, a supporting element, and a molding material. The chip is located on the carrier board and has a sensing area. The light transmissive sheet is located above the supporting element and covers the sensing area of the chip. The supporting element is located between the light transmissive sheet and the chip, and surrounds the sensing area of the chip. The molding material is located on the carrier board and surrounds the chip and the light transmissive sheet. A top surface of the molding material is lower than a top surface of the light transmissive sheet.