A semiconductor device is disclosed that includes a first region of a first conductivity type that includes a drain, a region of a second conductivity type abutting the first region in a lateral direction and a vertical direction to form an interface between the first conductivity type and the second conductivity type, wherein the drain region is spaced apart from the interface. A source region of the first conductivity type abuts the second region in the lateral direction and vertical directions. A control gate structure includes a conductive layer that is spaced apart from the drain region by a first dimension in the lateral direction. A shallow trench isolation (STI) region having a second dimension in the lateral direction is disposed at a location of the first region between the source and drain regions, wherein the second dimension is less than one-half of the first dimension.

There is disclosed a method for manufacturing a MOSFET with lateral channel in SiC, said MOSFET comprising simultaneously formed n type regions comprising an access region and a JFET region defining the length of the MOS channel, and wherein the access region and the JFET region are formed by ion implantation by using one masking step. The design is self-aligning so that the length of the MOS channel is defined by simultaneous creating n-type regions on both sides of the channel using one masking step. Any misalignment in the mask is moved to other less critical positions in the device. The risk of punch-through is decreased compared to the prior art. The current distribution becomes more homogenous. The short-circuit capability increases. There is lower Drain-Source specific on-resistance due to a reduced MOS channel resistance. There is a lower JFET resistance due to the possibility to increase the JFET region doping concentration.

A semiconductor product comprising: a first semiconductor electrode, a second semiconductor electrode and an interconnecting semiconductor electrode defining a third semiconductor electrode; a first switch, between the first semiconductor electrode and the third semiconductor electrode, provided by a first vertical insulated-gate field-effect-transistor; and a second switch, between the second semiconductor electrode and the third semiconductor electrode, provided by a second vertical insulated-gate field-effect-transistor, wherein the interconnecting semiconductor electrode interconnects the first vertical insulated gate field-effect-transistor and the second vertical insulated gate field-effect-transistor.

Techniques are disclosed for forming column IV transistor devices having source/drain regions with high concentrations of germanium, and exhibiting reduced parasitic resistance relative to conventional devices. In some example embodiments, the source/drain regions each includes a thin p-type silicon or germanium or SiGe deposition with the remainder of the source/drain material deposition being p-type germanium or a germanium alloy (e.g., germanium:tin or other suitable strain inducer, and having a germanium content of at least 80 atomic % and 20 atomic % or less other components). In some cases, evidence of strain relaxation may be observed in the germanium rich cap layer, including misfit dislocations and/or threading dislocations and/or twins. Numerous transistor configurations can be used, including both planar and non-planar transistor structures (e.g., FinFETs and nanowire transistors), as well as strained and unstrained channel structures.

A semiconductor device includes a semiconductor substrate, a body region disposed in the semiconductor substrate and having a first conductivity type, a composite source region disposed in the semiconductor substrate adjacent the body region and having a second conductivity type, and a gate structure supported by the semiconductor substrate and having a side adjacent the composite source region. The composite source region includes a plurality of first constituent source regions disposed along the side of the gate structure and having the second conductivity type, and a second constituent source region disposed along the side of the gate structure and between two first constituent source regions of the plurality of first constituent source regions, the second constituent source region having the second conductivity type. The second constituent source region has a different dopant concentration level than the plurality of first constituent source regions.

Embodiments of a transistor control device for controlling a bi-directional power transistor are disclosed. In an embodiment, a transistor control device for controlling a bi-directional power transistor includes a resistor connectable to a body terminal of the bi-directional power transistor and a transistor body switch circuit connectable to the resistor, to a drain terminal of the bi-directional power transistor, and to a source terminal of the bi-directional power transistor. The transistor body switch circuit includes switch devices and alternating current (AC) capacitive voltage dividers connected to control terminals of the switch devices. The AC capacitive voltage dividers are configured to control the switch devices to switch a voltage of the body terminal of the bi-directional power transistor as a function of a voltage between the drain terminal of the bi-directional power transistor and the source terminal of the bi-directional power transistor.

A device is described herein. The device comprises a unit cell of a silicon carbide (SiC) substrate. The unit cell comprises: a trench in a well region having a second conduction type. The well region is in contact with a region having a first conduction type to form a p-n junction. A width of the trench is less than 1.0 micrometers (μm). A width of the unit cell is one of less than and equal to 5.0 micrometers (μm). The device comprises a source region comprising the first conduction type. The device further comprises a metal oxide semiconductor field effect transistor component. The device described herein comprises a reduced unit cell pitch and reduced channel resistance without any compromise in channel length. The device comprises an ILD opening greater than or equal to width of the trench.

A wide gap semiconductor device has: a drift layer 12 using wide gap semiconductor material being a first conductivity type; a plurality of well regions 20 being a second conductivity type and formed in the drift layer 12; a polysilicon layer 150 provided on the well regions 20 and on the drift layer 12 between the well regions 20; an interlayer insulating film 65 provided on the polysilicon layer 150; a gate pad 120 provided on the interlayer insulating film 65; and a source pad 110 electrically connected to the polysilicon layer 150.

Disclosed is an LDMOS device comprising a drift region formed by a selected area of a doped layer of a first conductivity type on a semiconductor substrate, a gate structure comprising a gate dielectric layer and a gate conductive layer which are sequentially formed on a surface of the doped layer of the first conductivity type, a doped self-aligned channel region of a second conductivity type, and a doped layer formed by tilted ion implantation with a first side face of the gate structure as a self-alignment condition. A method for manufacturing an LDMOS device is further disclosed. The channel length is not affected by lithography and thus can be minimized to fulfill an ultralow specific-on-resistance, and the distribution uniformity of the channel length can be improved, so that the performance uniformity of the device is improved.

A semiconductor device according to an embodiment includes a cell region, a gate connection region, and a cell end region between the cell region and the gate connection region. The cell region includes, an n-type first SiC region, a p-type second SiC region, a n-type third SiC region, a p-type fourth SiC region, a gate insulating film, a gate electrode, a first electrode contacting with the first and fourth SiC regions, a second electrode. The gate connection region includes a p-type fifth SiC region between the third SiC region and a field insulating film and having a peak p-type impurity concentration of 1×10.sup.18 cm.sup.−3 or more. The cell end region includes a p-type sixth SiC region connected to the fifth SiC region, a p-type seventh SiC region having a higher p-type impurity concentration than the sixth SiC region, the first electrode contacting with the sixth and seventh SiC regions.