H01L2224/45014

SPATIAL POWER-COMBINING DEVICES WITH REDUCED SIZE
20220368291 · 2022-11-17 ·

Spatial power-combining devices with reduced dimensions are disclosed. Spatial power-combining devices are provided that employ a hybrid structure including both a planar splitter/combiner and an antipodal antenna array. Planar splitters may be arranged to divide an input signal while antipodal antenna arrays may be arranged to combine amplified signals. In other applications, the order may be reversed such that antipodal antenna arrays are arranged to divide an input signal while a planar combiner is arranged to combine amplified signals. Advantages of such spatial power-combining devices include reduced size and weight while maintaining suitable performance for operation in desired frequency bands.

Semiconductor device having low on resistance

A semiconductor device includes a header, a semiconductor chip fixed to the header constituting a MOSFET, and a sealing body of insulating resin which covers the semiconductor chip, the header and the like, and further includes a drain lead contiguously formed with the header and projects from one side surface of the sealing body, and a source lead and a gate lead which project in parallel from one side surface of the sealing body, and wires which are positioned in the inside of the sealing body and connect electrodes on an upper surface of the semiconductor chip and the source lead and the gate lead, with a gate electrode pad arranged at a position from the gate lead and the source lead farther than a source electrode pad.

Semiconductor device having low on resistance

A semiconductor device includes a header, a semiconductor chip fixed to the header constituting a MOSFET, and a sealing body of insulating resin which covers the semiconductor chip, the header and the like, and further includes a drain lead contiguously formed with the header and projects from one side surface of the sealing body, and a source lead and a gate lead which project in parallel from one side surface of the sealing body, and wires which are positioned in the inside of the sealing body and connect electrodes on an upper surface of the semiconductor chip and the source lead and the gate lead, with a gate electrode pad arranged at a position from the gate lead and the source lead farther than a source electrode pad.

MICROELECTRONIC PACKAGES HAVING STACKED DIE AND WIRE BOND INTERCONNECTS
20170294410 · 2017-10-12 ·

A microelectronic package includes at least one microelectronic element having a front surface defining a plane, the plane of each microelectronic element parallel to the plane of any other microelectronic element. An encapsulation region overlying edge surfaces of each microelectronic element has first and second major surfaces substantially parallel to the plane of each microelectronic element and peripheral surfaces between the major surfaces. Wire bonds are electrically coupled with one or more first package contacts at the first major surface of the encapsulation region, each wire bond having a portion contacted and surrounded by the encapsulation region. Second package contacts at an interconnect surface being one or more of the second major surface and the peripheral surfaces include portions of the wire bonds at such surface, and/or electrically conductive structure electrically coupled with the wire bonds.

MICROELECTRONIC PACKAGES HAVING STACKED DIE AND WIRE BOND INTERCONNECTS
20170294410 · 2017-10-12 ·

A microelectronic package includes at least one microelectronic element having a front surface defining a plane, the plane of each microelectronic element parallel to the plane of any other microelectronic element. An encapsulation region overlying edge surfaces of each microelectronic element has first and second major surfaces substantially parallel to the plane of each microelectronic element and peripheral surfaces between the major surfaces. Wire bonds are electrically coupled with one or more first package contacts at the first major surface of the encapsulation region, each wire bond having a portion contacted and surrounded by the encapsulation region. Second package contacts at an interconnect surface being one or more of the second major surface and the peripheral surfaces include portions of the wire bonds at such surface, and/or electrically conductive structure electrically coupled with the wire bonds.

ROBUST LOW INDUCTANCE POWER MODULE PACKAGE
20170294373 · 2017-10-12 ·

A method and system for a power module is provided. The power module includes a first substrate including a first conductive substrate having a first plurality of power semiconductor switches arranged thereon, and at least one second conductive substrate electrically coupled to the first conductive substrate. A first terminal is electrically coupled to the first conductive substrate. The power module also includes a second substrate including a third conductive substrate having a second plurality of power semiconductor switches arranged thereon, and at least one fourth conductive substrate electrically coupled to the third conductive substrate. The third conductive substrate is electrically coupled to the second conductive substrate. A second terminal is electrically coupled to the fourth conductive substrate.

ROBUST LOW INDUCTANCE POWER MODULE PACKAGE
20170294373 · 2017-10-12 ·

A method and system for a power module is provided. The power module includes a first substrate including a first conductive substrate having a first plurality of power semiconductor switches arranged thereon, and at least one second conductive substrate electrically coupled to the first conductive substrate. A first terminal is electrically coupled to the first conductive substrate. The power module also includes a second substrate including a third conductive substrate having a second plurality of power semiconductor switches arranged thereon, and at least one fourth conductive substrate electrically coupled to the third conductive substrate. The third conductive substrate is electrically coupled to the second conductive substrate. A second terminal is electrically coupled to the fourth conductive substrate.

Method for creating a connection between metallic moulded bodies and a power semiconductor which is used to bond to thick wires or strips

The invention relates to a method for connecting a power semi-conductor chip having upper-sided potential surfaces to thick wires or strips, consisting of the following steps: Providing a metal molded body corresponding to the shape of the upper-sided potential surfaces, applying a connecting layer to the upper-sided potential surfaces or to the metal molded bodies, and applying the metal molded bodies and adding a material fit, electrically conductive compound to the potential surfaces prior to the joining of the thick wire bonds to the non-added upper side of the molded body.

Method for creating a connection between metallic moulded bodies and a power semiconductor which is used to bond to thick wires or strips

The invention relates to a method for connecting a power semi-conductor chip having upper-sided potential surfaces to thick wires or strips, consisting of the following steps: Providing a metal molded body corresponding to the shape of the upper-sided potential surfaces, applying a connecting layer to the upper-sided potential surfaces or to the metal molded bodies, and applying the metal molded bodies and adding a material fit, electrically conductive compound to the potential surfaces prior to the joining of the thick wire bonds to the non-added upper side of the molded body.

Half Bridge Circuit, Method of Operating a Half Bridge Circuit and a Half Bridge Circuit Package
20170288654 · 2017-10-05 ·

A half bridge circuit includes an input connection configured to supply an electric input, an output connection configured to supply an electric output to a load to be connected to the output connection, a switch and a diode arranged between the input connection and the output connection and a voltage limiting inductance arranged in series between the switch and the diode. The voltage limiting inductance is configured to limit, upon switching the switch, a maximum voltage across the switch to below a breakdown voltage of the switch. A corresponding method of operating the half bridge circuit and package are also described.