The present invention provides a method for treating a substrate, which can remove transition metal-containing substances on a substrate with high efficiency while inhibiting cerium from remaining on the surface of the treated substrate. Furthermore, the present invention provides a method for manufacturing a semiconductor device including the method for treating a substrate, and a kit for treating a substrate that is applicable to the method for treating a substrate. The method for treating a substrate according to an embodiment of the present invention includes a step A of removing a transition metal-containing substance on a substrate by using a chemical solution, which includes a cerium compound and one or more pH adjusters selected from the group consisting of nitric acid, perchloric acid, ammonia, and sulfuric acid, for the substrate having the transition metal-containing substance, and a step B of performing a rinsing treatment on the substrate obtained by the step A by using one or more rinsing solutions selected from the group consisting of a solution including hydrogen peroxide and an acidic aqueous solution which is other than hydrofluoric acid, nitric acid, an aqueous perchloric acid solution, an aqueous oxalic acid solution, and a mixed aqueous solution of these and does not include hydrogen peroxide after the step A.

The present invention provides a method for treating a substrate, which can remove transition metal-containing substances on a substrate with high efficiency while inhibiting cerium from remaining on the surface of the treated substrate. Furthermore, the present invention provides a method for manufacturing a semiconductor device including the method for treating a substrate, and a kit for treating a substrate that is applicable to the method for treating a substrate. The method for treating a substrate according to an embodiment of the present invention includes a step A of removing a transition metal-containing substance on a substrate by using a chemical solution, which includes a cerium compound and one or more pH adjusters selected from the group consisting of nitric acid, perchloric acid, ammonia, and sulfuric acid, for the substrate having the transition metal-containing substance, and a step B of performing a rinsing treatment on the substrate obtained by the step A by using one or more rinsing solutions selected from the group consisting of a solution including hydrogen peroxide and an acidic aqueous solution which is other than hydrofluoric acid, nitric acid, an aqueous perchloric acid solution, an aqueous oxalic acid solution, and a mixed aqueous solution of these and does not include hydrogen peroxide after the step A.

Compositions and methods for etching cobalt chromium alloys are disclosed. The compositions generally include at least two mineral acids, certain component metals of the alloy to be etched, and optionally iron (Fe). For example, when etching a cobalt chromium molybdenum alloy, the component metals may include chromium (Cr), molybdenum (Mo), and optionally, cobalt (Co). The at least two mineral acids may include hydrochloric acid (HCl), nitric acid (HNO.sub.3), and hydrofluoric acid (HF). The methods provide for etching an entire surface of a substrate or etching a surface of a substrate in a pattern using selective coating patterns and/or coating removal. Thus, unlimited patterns, as well as etch depths and variations in etch depths are achievable using the compositions and methods disclosed. Moreover, the compositions and methods provide cobalt chrome surfaces having very low surface roughness (Ra) that are useful in the aerospace industry.

Compositions and methods for etching cobalt chromium alloys are disclosed. The compositions generally include at least two mineral acids, certain component metals of the alloy to be etched, and optionally iron (Fe). For example, when etching a cobalt chromium molybdenum alloy, the component metals may include chromium (Cr), molybdenum (Mo), and optionally, cobalt (Co). The at least two mineral acids may include hydrochloric acid (HCl), nitric acid (HNO.sub.3), and hydrofluoric acid (HF). The methods provide for etching an entire surface of a substrate or etching a surface of a substrate in a pattern using selective coating patterns and/or coating removal. Thus, unlimited patterns, as well as etch depths and variations in etch depths are achievable using the compositions and methods disclosed. Moreover, the compositions and methods provide cobalt chrome surfaces having very low surface roughness (Ra) that are useful in the aerospace industry.

An etching gas composition includes at least two C.sub.3 or C.sub.4 organic fluorine compounds and niobium fluoride, and the at least two C.sub.3 or C.sub.4 organic fluorine compounds are isomers.

An etching gas composition includes at least two C.sub.3 or C.sub.4 organic fluorine compounds and niobium fluoride, and the at least two C.sub.3 or C.sub.4 organic fluorine compounds are isomers.

An etchant composition may include: a peroxosulfate; a cyclic amine compound; a first amphoteric compound including a carboxyl group; and a second amphoteric compound including a sulfone group, wherein the second amphoteric compound may be different from the first amphoteric compound.

An etchant composition may include: a peroxosulfate; a cyclic amine compound; a first amphoteric compound including a carboxyl group; and a second amphoteric compound including a sulfone group, wherein the second amphoteric compound may be different from the first amphoteric compound.

An electroless etching process. The process produces nanostructured semiconductors in which an oxidant (Ox.sub.1) is deposited as a metal on a semiconductor surface and used as a catalytic agent to facilitate reaction between a semiconductor and a second oxidant (Ox.sub.2). Ox.sub.2 is used to initiate etching by injecting holes into the semiconductor valence band as facilitated by the catalytic action of the deposited metal. The extent of reaction is controlled by the amount of Ox.sub.2 added; the reaction rate is controlled by the injection rate of Ox.sub.2. The process produces high specific surface area and/or hierarchically structured porous Si with higher and controllable yield. In addition, the ability is demonstrated to vary the pore size distribution of mesoporous silicon including producing hierarchically structured mesoporous silicon with more than one peak in the pore size distribution. In principle, the process applies to any semiconductor onto which metal can be deposited galvanically.

An electroless etching process. The process produces nanostructured semiconductors in which an oxidant (Ox.sub.1) is deposited as a metal on a semiconductor surface and used as a catalytic agent to facilitate reaction between a semiconductor and a second oxidant (Ox.sub.2). Ox.sub.2 is used to initiate etching by injecting holes into the semiconductor valence band as facilitated by the catalytic action of the deposited metal. The extent of reaction is controlled by the amount of Ox.sub.2 added; the reaction rate is controlled by the injection rate of Ox.sub.2. The process produces high specific surface area and/or hierarchically structured porous Si with higher and controllable yield. In addition, the ability is demonstrated to vary the pore size distribution of mesoporous silicon including producing hierarchically structured mesoporous silicon with more than one peak in the pore size distribution. In principle, the process applies to any semiconductor onto which metal can be deposited galvanically.