Modulation-encoded light, using different spectral bin coded light components, can illuminate a stationary or moving (relative) target object or scene. Response signal processing can use information about the respective different time-varying modulation functions, to decode to recover information about a respective response parameter affected by the target object or scene. Electrical or optical modulation encoding can be used. LED-based spectroscopic analysis of a composition of a target (e.g., SpO2, glucose, etc.) can be performed; such can optionally include decoding of encoded optical modulation functions. Baffles or apertures or optics can be used, such as to constrain light provided by particular LEDs. Coded light illumination can be used with a focal plane array light imager receiving response light for inspecting a moving semiconductor or other target. Encoding can use orthogonal functions, such as an RGB illumination sequence, or a sequence of combinations of spectrally contiguous or non-contiguous colors.

According to some embodiments there is provided a method for structured light scanning of an intra-oral scene, comprising: projecting onto the intra-oral scene a color-coded pattern comprising an arrangement of entities having edges between them; each entity comprising a different narrow band of wavelengths; and detecting the projected pattern as a plurality of pixels in an acquired image of the scene using at least two narrowband filters, wherein for each pixel of at least 95% of the pixels of an entity of interest comprising a first band of wavelengths, a contribution of light from a second band of wavelengths of an adjacent entity is less than 10%. Some embodiments relate to a scanner system for structured light scanning of an intra-oral scene.

A position detection system detects a position of an object by using a plurality of frames, each of the plurality of frames being divided into a plurality of subframes. The position detection system includes: a projector configured to project a plurality of gray code patterns having different gray code values in an order of ascending and then descending or descending and then ascending of the different gray code values, each of the plurality of gray code patterns corresponding to a corresponding one of the plurality of subframes, each of the different gray code values being a power of two; an imaging device configured to generate a captured image by, for each of the plurality of subframes, imaging the object on which the plurality of gray code patterns are projected; a controller configured to estimate the position of the object based on the captured image.

The present application discloses a three-dimensional scanner and a three-dimensional scanning method. The three-dimensional scanner includes: an image projection device, configured to project light onto a target object, wherein the light includes predetermined light projected in the form of a color-coded stripe that is formed by coding stripes of at least two colors; and an image acquisition device, configured to acquire light modulated by the target object so as to obtain at least one stripe image in the case where light is projected onto the target object by the image projection device, wherein the obtained stripe image is taken as a coding image to determine respective stripe sequences and as a reconstruction image to perform three-dimensional reconstruction on the target object.

The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes a first light source configured to irradiate first pattern lights to the object, first image sensors configured to capture first reflected lights generated by reflecting the first pattern lights from the object, a second light source configured to sequentially irradiate second pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the second pattern lights, a second image sensor configured to capture second reflected lights generated by reflecting the second pattern lights from the partial region, and a processor configured to determine the first three-dimensional shape of the object based on the first reflected lights and the second reflected lights.

A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a second grid pattern based on a second light onto a target object in such a way that the first grid pattern and the second grid pattern intersect each other, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the second grid pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and performing a phase analysis of a grid image with respect to at least one of the first picked-up image and the second picked-up image and calculating height information of the target object.

According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Modulation-encoded light, using different spectral bin coded light components, can illuminate a stationary or moving (relative) target object or scene. Response signal processing can use information about the respective different time-varying modulation functions, to decode to recover information about a respective response parameter affected by the target object or scene. Electrical or optical modulation encoding can be used. LED-based spectroscopic analysis of a composition of a target (e.g., SpO2, glucose, etc.) can be performed; such can optionally include decoding of encoded optical modulation functions. Baffles or apertures or optics can be used, such as to constrain light provided by particular LEDs. Coded light illumination can be used with a focal plane array light imager receiving response light for inspecting a moving semiconductor or other target. Encoding can use orthogonal functions, such as an RGB illumination sequence, or a sequence of combinations of spectrally contiguous or non-contiguous colors.

A projection unit configured to project a stripe pattern whose luminance changes periodically and a reference position pattern indicating a position of one period of a plurality of periods of the stripe pattern as a reference position; an image capturing unit configured to capture images of a measurement-target object; a control unit configured to control the projection unit and the image capturing unit, to acquire a captured image of the stripe pattern by performing control so that the image capturing unit captures images of the measurement-target object under a plurality of exposure conditions, and to acquire a captured image of the reference position pattern by performing control so that the image capturing unit captures images of the measurement-target object under exposure condition; and a shape calculation unit configured to calculate a three-dimensional shape object based on a captured image of the stripe pattern and the reference position pattern are included.

To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.