Aspects of the present disclosure relate to systems and methods for active depth sensing. An example apparatus configured to perform active depth sensing includes a projector. The projector is configured to emit a first distribution of light during a first time and emit a second distribution of light different from the first distribution of light during a second time. A set of final depth values of one or more objects in a scene is based on one or more reflections of the first distribution of light and one or more reflections of the second distribution of light. The projector may include a laser array, and the apparatus may be configured to switch between a first plurality of lasers of the laser array to emit light during the first time and a second plurality of laser to emit light during the second time.

A method and apparatus for a structured light measuring device, having a preferable VCSEL array in its previous illuminated cross plane, using the laser array to be projected through said device's objective and collect the reflected beams through the same objective lens. A motorized stage is attached to the objective focusing, enabling back and forth focusing on different external planes. A software algorithm running on a computer device will analyze the reflected laser beam and find its central point and further translate it to angular deviations, similar to Autocollimation principles. Furthermore, this could be displayed as a cross on the user GUI for better user interface. The focusing function has the capability to focus the laser array at various planes, and analyze if the reflected beam is at its best focal point or deviates. By moving the focal point back and forth, a 3-D reconstruction can be achieved, preferable for lenses and calculating the center location relative to the device's line of sight.

Provided is a structured light projector including a light source configured to emit light, and a nanostructure array configured to form a dot pattern based on the light emitted by the light source, the nanostructure array including a plurality of super cells each respectively including a plurality of nanostructures, wherein each of the plurality of super cells includes a first sub cell that includes a plurality of first nanostructures having a first shape distribution and a second sub cell that includes a plurality of second nanostructures having a second shape distribution.

An arrangement of a 3D measurement device according to the invention comprises an image source in order to produce consecutive images on a surface of an object, a camera to take pictures of the surface, and a processor unit in order to compare the pictures of the camera with said images. The arrangement comprises also a first area and a second area on the images. The arrangement further comprises at least one double detector in order to detect the illuminated first area and the illuminated second area, and a drive unit in order to trigger at least one camera. The drive unit is arranged to trigger the camera if the double detector indicates that a state of the first area changes and a state of the second area changes.

Provided is a projection system that sets an arbitrary three-dimensional shape as a projection target and properly corrects geometric distortion of a projected image even when a user's viewpoint is not fixed. A projection unit of the projector apparatus projects a test image for first adjustment. A three-dimensional shape measurement unit measures the three-dimensional shape of the projection target. An image capturing apparatus captures the test image for first adjustment projected by the projection unit to obtain a captured image for first adjustment. A projected image adjustment unit (1) performs first adjustment processing for correcting an image such that geometric image distortion viewed from an imaging point, at which the captured image for first adjustment has been captured, is reduced, based on a captured image for first adjustment obtained by the image capturing apparatus, and (2) performs second adjustment processing for correcting the image such that the geometric image distortion is reduced based on a state in which the image adjusted by the first adjustment processing is projected by the projection unit.

There are included a probe that can be arranged in an imaging field of view, a horizontal drive section for causing the probe to contact a side surface of a workpiece on a stage, a display section for displaying a model image, a contact position designation section for receiving designation of contact target position information in the model image, a characteristic amount information setting section for setting characteristic amount information, a measurement setting information storage section for storing a plurality of pieces of contact target position information and the characteristic amount information, and a measurement control section for identifying a position and an attitude of the workpiece from a workpiece image by using the characteristic amount information, for identifying a plurality of contact target positions on the side surface of the workpiece where the probe should contact, based on the identified position and the identified attitude of the workpiece.

The present disclosure relates to structured illumination. The teachings thereof may be embodied in devices for reconstruction of a three-dimensional surface of an object by means of a structured illumination for projection of measurement patterns onto the object. For example, a device may include: a projector unit for diffractive projection of a measurement pattern comprising a plurality of measurement points onto the surface; an acquisition unit for acquiring the measurement pattern from the surface; and a computer unit for reconstruction of the surface from a respective distortion of the measurement pattern. All possible positions of measurement elements are contained in the measurement pattern in repeating groups, in which a respective combination of measurement points represents a respective location in the measurement pattern.

The distance image acquisition apparatus (10) includes a projection unit (12) which projects a first pattern of structured light distributed in a two-dimensional manner with respect to a subject within a distance measurement region, a light modulation unit (22) which spatially modulates the first pattern projected from the projection unit (12), an imaging unit (14) which is provided in parallel with and apart from the projection unit (12) by a baseline length, and captures an image including the first pattern reflected from the subject within the distance measurement region, a pattern extraction unit (20A) which extracts the first pattern spatially modulated by the light modulation unit (22) from the image captured by the imaging unit (14), and a distance image acquisition unit (20B) which acquires a distance image indicating a distance of the subject within the distance measurement region based on the first pattern.

A light source for structured light, comprising a plurality of light source elements arranged in an array, wherein the light source elements are configured to be driven in the following two modes:—a calibration mode, wherein only a part of light source elements are adapted to be driven; and—a normal mode, wherein the rest of the light source elements are adapted to be driven.

A borescope includes an electronic image capture unit having two image capture sensors as a borescope lens at an end of a shaft that is designed for being inserted into a borescope opening, a position and alignment of the image capture sensors in relation to one another being suitable for ascertaining three-dimension (3D) information using triangulation; and a pattern projector configured to project a pattern into a common recording region of the image capture sensors. The pattern projector includes: a fundamentally optically imaging light-guide bundle, which is made up of statistically distributed optical fibers having differing transmittances, to whose input surface a light source is coupled and whose output surface is aligned with the region captured by the image capture sensors.