A method comprises the steps of: (a) Obtaining a measured X-ray spectrum for the coated sample, for determining characteristics for the sample and for a coating material; (b) Determining a simulated X-ray spectrum for the sample based on an initial sample composition; (c) Determining an adapted sample composition that improves a match between the characteristics of the sample and an adapted simulated X ray spectrum; (d) Determining an adapted coating thickness for the coating material based on the adapted sample composition and characteristics of the coating; and (e) Repeating the steps (b) to (d) using the adapted sample composition and the adapted coating thickness of the coating material instead of the initial values, wherein the coating thickness is used for determining an absorption of X-rays.

A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

The invention concerns a method for measuring the dimensions of empty glass containers (2) consisting in: selecting at least one region to be inspected of the container, transporting the containers, positioning, on either side of the region to be inspected, at least one focus of an X-ray generator tube and image sensors, acquiring, using image sensors, for each container during its displacement, at least three radiographic images of the inspected region, analyzing the at least three radiographic images so as to determine the three-dimensional coordinates of a set of points to deduce at least one inner diameter of the neck and/or one thickness of the body.

Systems and methods for creating a digital twin of an infrastructure component. The digital twin is a computerized, three-dimensional model of the component, typically a pipe, created after manufacture but before installation. The digital twin can be saved on a computer-readable storage medium for later retrieval, and can be loaded into three-dimensional modeling software for manipulation and viewing from various angles and perspectives. The twin is created from a plurality of imaging systems capturing different surfaces or different aspects, whose measurements are mapped to a uniform coordinate system to generate a three-dimensional model. Other data may also be added to or stored with the digital twin, such as manufacturing specifications, photographic data, and current or historical inspection data. The digital twin may be viewed on a mobile device programmed to receive, display, and allow the user to view and manipulate the digital twin.

A measurement apparatus includes an x-ray sensor including an x-ray source having a high voltage power supply for emitting an x-ray spectrum and an x-ray detector for providing a measured x-ray signal value responsive to the x-rays received after transmission through a coated substrate including a sheet material having a coating material thereon. A second sensor is a beta gauge or infrared sensor for providing a second sensor signal that includes data for determining a total weight per unit area of the coated substrate or of the sheet material A computing device receives the measured x-ray signal value and the second sensor signal configured to implement an x-ray based calculation that utilizes absorption coefficients for the coating material and sheet material, the measured x-ray signal value, the x-ray spectrum, and the weight measure as a calculation constraint, for computing at least the weight per unit area of the coating material.

An X-ray imaging method includes the following steps: (a) performing a first object imaging and obtaining a first object intensity signal by detecting an X-ray passing through a first object; (b) performing baseline imaging process, obtaining a baseline intensity signal by detecting the X-ray when the first object is not in a FOV; and; (c) obtaining the first thickness of the first object by performing operations on the first object intensity signal, the baseline intensity signal, and the first attenuation coefficient of the first object.

Embodiments relate to using an active reflected wave detector to classify the state of a person in an environment and optionally respond accordingly. In one embodiment there is provided a computer implemented method of determining a state of a person comprising: receiving an output of an active reflected wave detector; classifying a state of the person as being in a safe supported state based on the output using measurements of reflections associated with the person, wherein said classifying is based at least on: a height metric associated with at least one reflection from the person conveyed in the output of the active reflected wave detector; and a plurality of velocity magnitude measurements of the person corresponding to different times, each of said velocity magnitude measurements determined using the reflections associated with the person conveyed in the output of the active reflected wave detector.

A measurement method comprises acquiring, using image sensors (Cji) for each object during its displacement, at least three radiographic images of the region to be inspected. The images are obtained from at least three radiographic projections of the region to be inspected, the directions of projection (Dji) of which are different from each other. A computer system is provided with an a priori geometric model of the region to be inspected for the series of objects. Using the computer system and considering a constant attenuation coefficient and, from the a priori geometric model, at least three radiographic images of the region to be inspected, a digital geometric model of the region to be inspected is determined. For each object of the series, from the digital geometric model of the region to be inspected, at least one linear dimension measurement of the region to be inspected is determined.

Aspects of the invention include a non-destructive bond line thickness measurement of thermal interface material on silicon packages. A non-limiting example computer-implemented method includes receiving a chip mounted on a laminate and depositing a high-density material on the chip. The computer-implemented method deposits a thermal interface material on the chip and lids the chip, and the laminate with a lid. The computer-implemented method X-rays the lid, the chip, and the laminate to produce an X-ray and measures, using a processor, from the X-ray a bond line thickness of the TIM as a distance from a bottom of the lid to a top surface of the high-density material.

A semiconductor review tool receives absolute Z-height values for the semiconductor wafer, such as a semiconductor wafer with a beveled edge. The absolute Z-height values can be determined by a semiconductor inspection tool. The semiconductor review tool reviews the semiconductor wafer within a Z-height based on the absolute Z-height values. Focus can be adjusted to within the Z-height.