Patent classifications
G01B15/04
Additive manufacturing system with x-ray backscatter imaging system and method of inspecting a structure during additive manufacturing of the structure
A method of inspecting a structure during additive manufacturing of the structure and additive manufacturing systems are presented. An additive manufacturing system comprises additive manufacturing equipment comprising a casing and an additive manufacturing head configured to form a plurality of layers of a structure within the casing; and an x-ray backscatter imaging system configured to send an x-ray beam into a structure formed within the additive manufacturing equipment and detect scattered x-rays for imaging and analysis of the structure during fabrication.
A FOOD PROCESSING SYSTEM FOR PROCESSING AND BATCHING FOOD ITEMS
A food processing system and a method for processing and batching food items conveyed by a conveyor means where the batches fulfil at least one target criteria including at least one weight target, including a first weight determining means for determining the weight of incoming food items, a batching system, a food item separation device positioned downstream in relation to the first weight determining means and upstream in relation to the batching system, and a control system for controlling the batching system and the food item separation device. The controlling including, repeatedly: monitoring the weight of the incoming food items, determining, based on the weight of the incoming food items, a prospect indicator indicating the prospect to meet the target criteria for the batches such that each batch fulfils the at least one target criteria, and comparing if the prospect indicator fulfils a pre-defined criteria.
A FOOD PROCESSING SYSTEM FOR PROCESSING AND BATCHING FOOD ITEMS
A food processing system and a method for processing and batching food items conveyed by a conveyor means where the batches fulfil at least one target criteria including at least one weight target, including a first weight determining means for determining the weight of incoming food items, a batching system, a food item separation device positioned downstream in relation to the first weight determining means and upstream in relation to the batching system, and a control system for controlling the batching system and the food item separation device. The controlling including, repeatedly: monitoring the weight of the incoming food items, determining, based on the weight of the incoming food items, a prospect indicator indicating the prospect to meet the target criteria for the batches such that each batch fulfils the at least one target criteria, and comparing if the prospect indicator fulfils a pre-defined criteria.
Pattern Measurement Apparatus and Flaw Inspection Apparatus
The purpose of the present invention is to provide a pattern measurement apparatus that appropriately assesses patterns formed by patterning methods for forming patterns that do not exist on photomasks. In order to achieve this purpose, the present invention provides a pattern measurement apparatus comprising a processor that measures the dimensions of patterns formed on a sample by using data acquired by irradiating the sample with a beam, wherein the processor extracts pattern coordinate information on the basis of the data acquired by irradiating the sample with a beam, and uses the coordinate information to generate measurement reference data used when performing dimension measurements of the pattern.
Pattern Measurement Apparatus and Flaw Inspection Apparatus
The purpose of the present invention is to provide a pattern measurement apparatus that appropriately assesses patterns formed by patterning methods for forming patterns that do not exist on photomasks. In order to achieve this purpose, the present invention provides a pattern measurement apparatus comprising a processor that measures the dimensions of patterns formed on a sample by using data acquired by irradiating the sample with a beam, wherein the processor extracts pattern coordinate information on the basis of the data acquired by irradiating the sample with a beam, and uses the coordinate information to generate measurement reference data used when performing dimension measurements of the pattern.
SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD
The invention provides a sample observation system including a scanning electron microscope and a calculator. The calculator: (1) acquires a plurality of images captured by the scanning electron microscope; (2) acquires, from the plurality of images, a learning defect image including a defect portion and a learning reference image not including the defect portion; (3) calculates estimation processing parameters by using the learning defect image and the learning reference image; (4) acquires an inspection defect image including a defect portion; and (5) estimates a pseudo reference image by using the estimation processing parameters and the inspection defect image.
Method and system for utilizing radio-opaque fillers in multiple layers of golf balls
A golf ball comprising layers that have from 0.05% to 70% by weight of a radio-opaque filler, and wherein the concentration of the radio-opaque filler is measurably different in each layer is disclosed herein. The radio-opaque filler is preferably a compound based on barium, bismuth, tungsten, iodine, or reduced iron.
Method and system for utilizing radio-opaque fillers in multiple layers of golf balls
A golf ball comprising layers that have from 0.05% to 70% by weight of a radio-opaque filler, and wherein the concentration of the radio-opaque filler is measurably different in each layer is disclosed herein. The radio-opaque filler is preferably a compound based on barium, bismuth, tungsten, iodine, or reduced iron.
METHOD AND APPARATUS FOR DETERMINING THE GEOMETRICAL DIMENSIONS OF A WHEEL
Method and related apparatus for determining the geometrical dimensions of a wheel, or at least one part of a wheel, with particular reference to vehicle wheels, in the context of a wheel maintenance process. This method uses contactless sensors which comprise a scanning radar system, preferably a millimeter-wave radar system, to scan the wheel, or at least one part of the wheel, quickly and accurately, moving said contactless sensors along a trajectory lying in at least one plane which is perpendicular to a central axis of the wheel.
APPARATUS FOR ESTIMATING OBSTACLE SHAPE AND METHOD THEREOF
An obstacle shape estimating apparatus and a method thereof, includes: a processor configured to receive a the sensing signal from at least one ultrasonic sensor at a predetermined cycle, to generate positions of one or more obstacles according to distance values of an ultrasonic sensor by estimating the distance values of the ultrasonic sensor based on a sensing signal, and to generate obstacle shape information according to positions of remaining obstacles after deleting a position of an obstacle corresponding to a virtual distance value and a position of an obstacle which does not satisfy a validation condition among the positions of the one or more obstacles; and a storage configured to store data and an algorithm driven by the processor, and the obstacle shape information generated by the processor.