Patent classifications
G01C19/5712
MEMS Vibrating Ring Resonator with Deformable Inner Ring-Shaped Spring Supports
A Microelectromechanical systems (MEMS) based ring resonator includes an outer ring which is supported in resilient deformable movement relative to one or more peripherally disposed electrodes by a symmetrically positioned array of radially extending inner spring supports. The inner spring supports extend radially from a central anchor post or support to the inner circumferential edge of the outer ring. The innerspring supports are configured to deformation or regulate movement in outer ring driving and sensing modes.
MICROMECHANICAL RATE-OF-ROTATION SENSOR SET-UP, RATE-OF-ROTATION SENSOR ARRAY AND CORRESPONDING MANUFACTURING METHOD
A micromechanical rate-of-rotation sensor set-up, including a first rate-of-rotation sensor device capable of being driven rotationally by a driving device via a drive frame device, so as to oscillate about a first axis, and is for measuring a first outer rate of rotation about a second axis and a second outer rate of rotation about a third axis; and a second rate-of-rotation sensor device capable of being driven by the driving device via the drive frame device, so as to oscillate linearly along the second axis, and is for measuring a third outer rate of rotation about the first axis. The first rate-of-rotation sensor device is connected to the second rate-of-rotation sensor device by the drive frame device. The drive frame device includes a first and second drive frame, which may be driven by the driving device in phase opposition, along the third axis, in an oscillatory manner.
MICROMECHANICAL RATE-OF-ROTATION SENSOR SET-UP, RATE-OF-ROTATION SENSOR ARRAY AND CORRESPONDING MANUFACTURING METHOD
A micromechanical rate-of-rotation sensor set-up, including a first rate-of-rotation sensor device capable of being driven rotationally by a driving device via a drive frame device, so as to oscillate about a first axis, and is for measuring a first outer rate of rotation about a second axis and a second outer rate of rotation about a third axis; and a second rate-of-rotation sensor device capable of being driven by the driving device via the drive frame device, so as to oscillate linearly along the second axis, and is for measuring a third outer rate of rotation about the first axis. The first rate-of-rotation sensor device is connected to the second rate-of-rotation sensor device by the drive frame device. The drive frame device includes a first and second drive frame, which may be driven by the driving device in phase opposition, along the third axis, in an oscillatory manner.
THREE-AXIS MICROELECTROMECHANICAL SYSTEM (MEMS) GYROSCOPE
A three-axis microelectromechanical system (MEMS) gyroscope includes four proof masses, where the proof masses are connected by spring beams and/or rigid beams; a first proof mass is configured to move in an X-axis direction; a second proof mass is configured to rotate around an X-direction axis, a Y-direction axis, and a Z-direction axis, and when the first proof mass moves in the X-axis direction, the second proof mass is driven to rotate around the Z-direction axis; a third proof mass is configured to move in the X-axis direction and a Y-axis direction, and when the first proof mass moves in the X-axis direction, the third proof mass is driven to move in the Y-axis direction; a fourth proof mass is configured to move in the X-axis direction, and when the third proof mass moves in the X-axis direction, the fourth proof mass is driven to move in the X-axis direction.
THREE-AXIS MICROELECTROMECHANICAL SYSTEM (MEMS) GYROSCOPE
A three-axis microelectromechanical system (MEMS) gyroscope includes four proof masses, where the proof masses are connected by spring beams and/or rigid beams; a first proof mass is configured to move in an X-axis direction; a second proof mass is configured to rotate around an X-direction axis, a Y-direction axis, and a Z-direction axis, and when the first proof mass moves in the X-axis direction, the second proof mass is driven to rotate around the Z-direction axis; a third proof mass is configured to move in the X-axis direction and a Y-axis direction, and when the first proof mass moves in the X-axis direction, the third proof mass is driven to move in the Y-axis direction; a fourth proof mass is configured to move in the X-axis direction, and when the third proof mass moves in the X-axis direction, the fourth proof mass is driven to move in the X-axis direction.
COMPENSATING A TEMPERATURE-DEPENDENT QUADRATURE-INDUCED ZERO RATE OFFSET FOR A MICROELECTROMECHANICAL GYROSCOPE
A sensor system. The sensor system includes: an analog processing arrangement comprising: a drive circuit which generates an analog drive signal to drive an oscillating element of a microelectromechanical gyroscope; a detection circuit configured to generate analog rotation-rate and quadrature signals from a signal detected by the gyroscope; an analog-to-digital converter(s) configured to convert the analog rotation-rate and quadrature signals into digital rotation-rate and quadrature signals; a compensation circuit, which, in a measurement operating mode of the sensor system, compensates a quadrature effect on the analog quadrature signal using at least one quadrature compensation value; and a digital processing arrangement comprising a digital processing circuit, which, in the measurement operating mode of the sensor system, is configured to compensate a temperature-dependent quadrature-induced zero rate offset ZRO of the digital rotation-rate signal using at least one ZRO compensation value and temperature information.
COMPENSATING A TEMPERATURE-DEPENDENT QUADRATURE-INDUCED ZERO RATE OFFSET FOR A MICROELECTROMECHANICAL GYROSCOPE
A sensor system. The sensor system includes: an analog processing arrangement comprising: a drive circuit which generates an analog drive signal to drive an oscillating element of a microelectromechanical gyroscope; a detection circuit configured to generate analog rotation-rate and quadrature signals from a signal detected by the gyroscope; an analog-to-digital converter(s) configured to convert the analog rotation-rate and quadrature signals into digital rotation-rate and quadrature signals; a compensation circuit, which, in a measurement operating mode of the sensor system, compensates a quadrature effect on the analog quadrature signal using at least one quadrature compensation value; and a digital processing arrangement comprising a digital processing circuit, which, in the measurement operating mode of the sensor system, is configured to compensate a temperature-dependent quadrature-induced zero rate offset ZRO of the digital rotation-rate signal using at least one ZRO compensation value and temperature information.
MICROELECTROMECHANICAL GYROSCOPE WITH OUT-OF-PLANE DETECTION MOVEMENT
A microelectromechanical gyroscope is provided with a detection structure having: a substrate with a top surface parallel to a horizontal plane (xy); a mobile mass, suspended above the substrate to perform, as a function of a first angular velocity (Ω.sub.x) around a first axis (x) of the horizontal plane (xy), at least a first detection movement of rotation around a second axis (y) of the horizontal plane; and a first and a second stator elements integral with the substrate and arranged underneath the mobile mass to define a capacitive coupling, a capacitance value thereof is indicative of the first angular velocity (Ω.sub.x). The detection structure has a single mechanical anchorage structure for anchoring both the mobile mass and the stator elements to the substrate, arranged internally with respect to the mobile mass, which is coupled to this single mechanical anchorage structure by coupling elastic elements yielding to torsion around the second axis; the stator elements are integrally coupled to the single mechanical anchorage structure in an arrangement suspended above the top surface of the substrate.
MICROELECTROMECHANICAL GYROSCOPE WITH OUT-OF-PLANE DETECTION MOVEMENT
A microelectromechanical gyroscope is provided with a detection structure having: a substrate with a top surface parallel to a horizontal plane (xy); a mobile mass, suspended above the substrate to perform, as a function of a first angular velocity (Ω.sub.x) around a first axis (x) of the horizontal plane (xy), at least a first detection movement of rotation around a second axis (y) of the horizontal plane; and a first and a second stator elements integral with the substrate and arranged underneath the mobile mass to define a capacitive coupling, a capacitance value thereof is indicative of the first angular velocity (Ω.sub.x). The detection structure has a single mechanical anchorage structure for anchoring both the mobile mass and the stator elements to the substrate, arranged internally with respect to the mobile mass, which is coupled to this single mechanical anchorage structure by coupling elastic elements yielding to torsion around the second axis; the stator elements are integrally coupled to the single mechanical anchorage structure in an arrangement suspended above the top surface of the substrate.
MEMS Gyroscope
The invention discloses a MEMS gyroscope, including a substrate, a first unit and a second unit, and the first unit and the second unit are relatively arranged on the substrate along the first direction. The first unit is connected to the second unit through a coupling spring, and the substrate is also provided with a driving electrode and a detection electrode. The first unit includes a first weight and a second weight. The second unit includes the third weight and the fourth weight set oppositely along the second direction. The second set of coupling structures are connected to the third weight and fourth weight. Compared with the prior art, the beneficial effect of the present invention is that the MEMS gyroscope adopts a symmetrical layout, which facilitates the realization of differential detection and improves the sensitivity.