Patent classifications
G01L5/0047
RESIDUAL STRESS EVALUATION METHOD
A method of evaluating a residual stress including a condition setting step of setting a processing condition of water jet peening for a processing target; an analysis step of analyzing a jet flow when a fluid is injected from a nozzle model to a processing target model in accordance with the processing condition, and obtaining a void fraction which is a volume fraction of babbles contained in a unit volume of the fluid, and a collapse fraction, which is a volume fraction of the bubbles which collapse in a unit time in the unit volume of the fluid, at each position on a surface of the processing target model; an impact pressure correlation value calculating step of obtaining an impact pressure correlation value, which is a product of the void fraction and the collapse fraction at each position; an experimental value acquisition step of obtaining an impact pressure experimental value.
Method for Internal Stress Regulation in Superalloy Disk forgings by Pre-spinning
The present application relates to the field of superalloy, disclosing a method for internal stress regulation in superalloy disk forgings by pre-spinning. The method includes: Step S1, determining a target revolution for regulating internal stress in the disk forgings, and determining a target deformation magnitude of plastic deformation required for regulating the internal stress by the pre-spinning of the disk forgings; and Step S2, performing the pre-spinning of the disk forgings by the target revolution, monitoring a deformation magnitude of the disk forgings, and stopping the pre-spinning when a monitored deformation magnitude of the disk forgings reaches the target deformation magnitude.
STRESS AND STRAIN AMOUNT DISTRIBUTION DISPLAY METHOD, DEVICE, AND PROGRAM
A method of displaying stress distribution on a sample surface includes: step S4 of capturing images of the sample surface before loading, during the loading, and after unloading; step S5 of measuring a first strain amount for each pixel position based on correlation between the image before the loading and the image after the unloading; step S6 of measuring a second strain amount for each pixel position based on correlation between the image before the loading and the image during the loading; step S7 of calculating stress for each pixel position based on the difference between the first strain amount and the second strain amount; and step S8 of displaying the distribution of the calculated stress at each pixel position.
MODULE AND METHOD FOR MONITORING ENVIRONMENTAL INFLUENCES ON A MODULE
A module, including at least one first component in the form of a semiconductor component including multiple stress measuring cells situated in a distributed manner for detecting stress measured values at different measuring positions of the semiconductor component, at least one second component which is mechanically coupled to the semiconductor component, and an evaluation unit, which is designed to ascertain at least one location-dependent stress distribution in the semiconductor component based on the stress measured values detected at one measuring point in time, and to ascertain a deformation state of the at least one second component at the measuring point in time on the basis of the at least one ascertained location-dependent stress distribution in the semiconductor component. A corresponding method for monitoring environmental influences on a module is also described.
METHOD AND SYSTEM FOR MEASURING INTERFACIAL STRESS AND RESIDUAL STRESS IN MULTILAYER THIN FILMS COATED ON A SUBSTRATE
A method for measuring interfacial stress and residual stress in multilayer thin films coated on a substrate is disclosed. First of all, a residual stress measurement process is applied to each thin film of a multi-layered structure. Subsequently, after two kinds of interfacial stress (F.sub.HL, F.sub.LH) are calculated, a mathematical formula for estimating at least one adjusting parameter is derived based on the two interfacial stresses. As a result, a modified Ennos formula is obtained by involving the adjusting parameters into the Ennos formula, such that a residual stress in the multi-layered structure (i.e., multilayer thin films) is therefore calculated by using the modified Ennos formula.
Residual stress detection device and detection method thereof
A residual stress detection device for a curved surface coating and a detection method thereof is provided, where its structure includes: a detection piece carrier, configured to fix the detection piece, so that a to-be-detected point on the detection piece remains at a highest point; an X-ray generation source, radiating an X-ray to the to-be-detected point fixedly or along a path; a detection element, including a moving mechanism, where the moving mechanism moves the detection element along a path extending toward a direction orthogonal to an incident direction of the X-ray, so that the detection element receives and detects intensity of a diffraction X-ray at a position of the diffraction X-ray; and a stress calculation module, obtaining a strain value based on an intensity peak of the diffraction X-ray detected by the detection element, and calculating a residual stress value of the detection piece by using a formula.
SYSTEMS AND METHODS FOR ANALYSIS OF MATERIAL PROPERTIES OF COMPONENTS AND STRUCTURES USING MACHINING PROCESSES TO ENABLE STRESS RELIEF IN THE MATERIAL UNDER TEST
Analysis of residual stress in materials is often done in static conditions in a laboratory. Accurate systems and methods for performing these analyses in a dynamic, non-laboratory environment are notoriously difficult and can be very inaccurate. A method using a portable, field deployable apparatus having greater accuracy than currently available is disclosed whereby accurate and repeatable residual stress analysis may be implemented in non-laboratory environments leading to greatly improved diagnostics, maintenance and life limit prediction.
Method for calculating processing parameters for residual stress control by parameter inversion
The present invention belongs to the field of processing residual stress, and discloses a method for calculating processing parameters for residual stress control by parameter inversion. This method comprises: (a) extracting a characteristic index reflecting the residual stress distribution characteristic from a residual stress distribution curve; (b) respectively presetting initial values of processing parameters for residual stress control, calculating an initial value of the characteristic index, and drawing curves of the characteristic index over the respective processing parameters to obtain respective fitted curves; (c) respectively establishing a relation formula between respective characteristic index increment of the processing parameters and the fitting curve; and (d) assigning the values and performing inversion calculation to obtain the required processing parameters. The present invention is simple in operation, reduces the number of tests, lowers the production cost, improves the processing residual stress distribution of the workpiece and improves the anti-fatigue life of the components.
COUPLING MEMBER AND MEASUREMENT SYSTEM
A coupling member for coupling a solidified body and a structural member includes a sensor part that is capable of measuring physical variation resulting from external force and is for detecting information that will help determine whether there is an abnormality in the solidified body and/or structural member. The coupling member has an embedded part at one end that is embedded in the solidified body and/or ground and has a fixing part that is on the side of the other end extending outside of the solidified body and is capable of fixing the structural member.
RESIDUAL STRESS MEASUREMENT METHOD OF CURVED SURFACE BLOCK
A residual stress measurement method of a curved surface block includes steps of: locating a point at which a to-be-detected curved surface of a curved surface block has a highest curvature as a to-be-detected point; applying an instrument integrating an X-ray light resource and a detector, measuring the to-be-detected point by using an X-ray diffraction theory, and analyzing and calculating, in combination with a sin.sup.2 Ψ method, a strain value measured by using the instrument; and calculating, in combination with material property measurement data of the curved surface block material, a residual stress by introducing a curved surface block residual stress calculation model.