A photodiode includes semiconductor layers and a gate insulating layer provided on a buried insulating layer formed on a substrate and has a diffraction grating portion in which a plurality of groove portions are formed in a two-dimensional lattice shape, on the gate insulating layer. Measurement light is guided by an optical system including a photoelastic modulator and is incident on the photodiode. The measurement light is emitted from the light source device in a state of being linearly polarized light having a predetermined wavelength and is converted at a predetermined frequency by the optical system such that states in which the measurement light becomes linearly polarized light beams of two orthogonal directions are repeated. In addition, electric signals from the photodiode in the state in which the measurement light becomes the linearly polarized light beams of the two orthogonal directions are lock-in detected.

A solution is provided comprising boron nitride nanotubes (BNNTs) in a liquid solvent. An optical waveguide, such as an optical fiber, is contacted with the solution so as to form a layer of the solution supported on at least a portion of the optical waveguide. The liquid solvent is then removed from the layer of the solution supported on the optical waveguide in order to form a coating of the BNNTs on the optical waveguide. Further provided is a BNNT coated optical waveguide for use as a sensor.

An integrated device, comprising a substrate having a first surface; and at least one pixel formed on or in the substrate. The at least one pixel comprising a reaction chamber configured to receive a sample, and a sensor configured to detect emission light emitted from the reaction chamber and at least one nanostructure disposed in a plane between a waveguide and the sensor, wherein the optical nanostructure is configured to converge at least a portion of the emission light in a direction substantially perpendicular to the plane. The waveguide is configured to couple excitation light to each pixel.

According to one embodiment, a sample inspection apparatus includes a photodetection circuitry, an image sensor, processing circuitry, and an output interface. The photodetection circuitry has light incident on an optical waveguide in an inspection container and detects the light having propagated within the optical waveguide and coming out of the optical waveguide. The image sensor acquires an image signal for the optical waveguide, using scattered light originated from the light propagating within the optical waveguide. The processing circuitry acquires one or more inspection index values based on at least one of an output of the photodetection circuitry or an output of the image sensor. The output interface outputs a result of processing by the processing circuitry.

Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.

A solution is provided comprising boron nitride nanotubes (BNNTs) in a liquid solvent. An optical waveguide, such as an optical fiber, is contacted with the solution so as to form a layer of the solution supported on at least a portion of the optical waveguide. The liquid solvent is then removed from the layer of the solution supported on the optical waveguide in order to form a coating of the BNNTs on the optical waveguide. Further provided is a BNNT coated optical waveguide for use as a sensor.

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substate layer and includes at least one reference channel and at least one sample channel.

Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.