Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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21/00
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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G01N21/17
Systems in which incident light is modified in accordance with the properties of the material investigated
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G01N2021/5953

Characteristic information extraction method, and rapid detection method and system of organic pollutants in complex system
11635385 · 2023-04-25 · ·

A method for fast extracting an organic pollutant in a complex system is disclosed, which includes following steps. A surface-enhanced Raman scattering (SERS) spectrum of an organic pollutant is divided to obtain P wavelength sub-intervals with overlapping regions. The P wavelength sub-intervals are screened to obtain ω wavelength sub-intervals. The ω wavelength sub-intervals are screened to obtain a required wavelength sub-interval. The required wavelength sub-interval is screened to obtain a required wavelength subset. A method and a system for fast detecting an organic pollutant in a complex system are also disclosed.

CHARACTERISTIC INFORMATION EXTRACTION METHOD, AND RAPID DETECTION METHOD AND SYSTEM OF ORGANIC POLLUTANTS IN COMPLEX SYSTEM
20220042918 · 2022-02-10 ·

A method for fast extracting an organic pollutant in a complex system is disclosed, which includes following steps. A surface-enhanced Raman scattering (SERS) spectrum of an organic pollutant is divided to obtain P wavelength sub-intervals with overlapping regions. The P wavelength sub-intervals are screened to obtain ω wavelength sub-intervals. The ω wavelength sub-intervals are screened to obtain a required wavelength sub-interval. The required wavelength sub-interval is screened to obtain a required wavelength subset. A method and a system for fast detecting an organic pollutant in a complex system are also disclosed.