A web gauging system and methods of using the web gauging system are described. The web gauging system includes a supercontinuum Laser providing a light beam. A beam expander is configured to expand the light beam and provide an expanded beam to a sample illumination area. A detector unit configured to detect a sample light from the illumination area. A moving web can be placed in the illumination area, where the web gauging system measures parameters of the web.

To inspect the shape of a metallic body further accurately, regardless of surface roughness of the metallic body. A shape inspection apparatus for a metallic body according to the present invention includes: a measurement apparatus configured to irradiate a metallic body with at least two illumination light beams, and measure reflected light of the two illumination light beams from the metallic body separately; and an arithmetic processing apparatus configured to calculate information used for shape inspection of the metallic body on the basis of luminance values of the reflected light. The measurement apparatus includes a first illumination light source and a second illumination light source configured to irradiate the metallic body with strip-shaped illumination light having mutually different peak wavelengths, and a color line sensor camera configured to measure reflected light of first illumination light and reflected light of second illumination light, separately. The first illumination light source and the second illumination light source are provided in a manner that their optical axes form substantially equal angles with a direction of regular reflection of an optical axis of the color line sensor camera at a surface of the metallic body. A wavelength difference between a peak wavelength of the first illumination light and a peak wavelength of the second illumination light is equal to or more than 5 nm and equal to or less than 90 nm.

The invention relates to an arrangement for contactless determination of at least one dimension of a moving material web, in particular a material web of opaque material, with a background illumination, with optical detection means for detecting at least one current contrast image and with evaluation means, wherein the background illumination is arranged opposite the optical detection means, wherein the material web moves in a plane between the at least one optical detection means and the background illumination, and wherein the current contrast image has at least one piece of information about at least one light intensity laterally adjacent to the material web. Furthermore, the present invention concerns a corresponding process. For simplifying and improving the non-contact determination of the dimension, the present invention proposes to provide a shadowing element and to compare the current contrast image with a reference contrast image, wherein the current contrast image represents a shadowing of the background illumination by the material web and by the shadowing element.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced b the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

The present disclosure relates to a system and a method of detecting a defect of an optical film, and more particularly, to a system and a method of detecting a defect of an optical film, which obtain an image of a defect of an optical film projected onto a screen and detect the defect of the optical film. As an exemplary embodiment of the present disclosure, a system for detecting a defect of an optical film may be provided. The system for detecting a defect of an optical film may include: a lighting unit, which is spaced apart from the optical film, and irradiates light toward one surface of the optical film; a screen, which is spaced apart from the other surface of the optical film, and on which a defect existing in the optical film is projected and displayed according to the pass of the light irradiated from the lighting unit through the optical film; an imaging unit, which is spaced apart from the screen, and obtains an image of the defect of the optical film projected onto the screen; and an analyzing unit, which analyzes the obtained image, and detects the defect of the optical film based on a result of the analysis.

The invention relates to an arrangement for contactless determination of at least one dimension of a moving material web, in particular a material web of opaque material, with a background illumination, with optical detection means for detecting at least one current contrast image and with evaluation means, wherein the background illumination is arranged opposite the optical detection means, wherein the material web moves in a plane between the at least one optical detection means and the background illumination, and wherein the current contrast image has at least one piece of information about at least one light intensity laterally adjacent to the material web. Furthermore, the present invention concerns a corresponding process. For simplifying and improving the non-contact determination of the dimension, the present invention proposes to provide a shadowing element and to compare the current contrast image with a reference contrast image, wherein the current contrast image represents a shadowing of the background illumination the material web and by the shadowing element.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

The present disclosure relates to a system and a method of detecting a defect of an optical film, and more particularly, to a system and a method of detecting a defect of an optical film, which obtain an image of a defect of an optical film projected onto a screen and detect the defect of the optical film.

As an exemplary embodiment of the present disclosure, a system for detecting a defect of an optical film may be provided. The system for detecting a defect of an optical film may include: a lighting unit, which is spaced apart from the optical film, and irradiates light toward one surface of the optical film; a screen, which is spaced apart from the other surface of the optical film, and on which a defect existing in the optical film is projected and displayed according to the pass of the light irradiated from the lighting unit through the optical film; an imaging unit, which is spaced apart from the screen, and obtains an image of the defect of the optical film projected onto the screen; and an analyzing unit, which analyzes the obtained image, and detects the defect of the optical film based on a result of the analysis.