G01N21/274

METHOD AND APPARATUS FOR DETERMINING A REFLECTANCE OF A TARGET OBJECT
20230028946 · 2023-01-26 ·

A method and apparatus for determining a reflectance, of at least a portion of a target object, in at least one selected wavelength range of electromagnetic (EM) radiation are disclosed. The method comprises, for each selected wavelength range, providing a digital image including at least one target object and a plurality of reference objects, each reference object having respective non-identical predetermined reflectance characteristics, with a digital camera arrangement that provides output image data that comprises digital numbers that are responsive to radiation, in only a selected wavelength range, incident at a sensing plane of the digital camera arrangement. A relationship between a first set of the digital numbers is determined and a first set of the respective predetermined reflectance characteristics of the reference objects. Responsive to the relationship, a further set of digital numbers is transformed to allocate a value of reflectance for each of the digital numbers in the further set. For at least a portion of the target object, a corresponding first group of allocated values of reflectance is determined and responsive to the first group of allocated values, determining a reflectance of the portion of the target object.

Detection and monitoring of dosage delivery for vaporized waxes, solids or viscous oils, and cannabinoids

A sensing module for monitoring dosage delivery of a vaporized material, and a portable vaporization unit including the sensing module, include a light sensor that detects disruptions in a light path across a vapor channel, the disruptions caused by the vaporized material flowing through the vapor channel. The light sensor includes a UV light source, which may emit 370 nm wavelength light, and a UV light detector that converts intensity of incident light in the light path into a signal. A microprocessor of the sensing module compares the signal to a baseline measurement to determine the concentration of a medicament in the vapor; then, using the flow rate and activation time of the device, the microprocessor determines the dosage and can perform monitoring and reporting actions based on the dosage. A measuring circuit measures fluctuations in resistance/impedance of a vaporization element to further determine flow rate and/or dosage.

Method for degradation-compensated evaluation of luminescence sensor detection signals, and evaluation apparatus therefor

A method is provided for degradation-compensated evaluation of detection signals of a sensor arrangement operating on the principle of luminescence quenching, which arrangement has a luminophore that degrades over time, an excitation radiation source, and at least one optical sensor. The luminophore radiates, in accordance with a response characteristic of the sensor arrangement, in reaction to irradiation with a predefined modulated excitation radiation and as a function of the extent of an interaction of the luminophore with a quencher substance that quenches the luminescence of the luminophore. A response radiation is detected by the at least one optical sensor. The sensor arrangement outputs a detected intensity value representing an intensity of the response radiation and a detected phase value representing a phase difference of the response radiation with respect to the modulation of the excitation radiation. A predetermined calibration value correlation is identified in consideration of the reference response characteristic.

Focusing linear model correction and linear model correction for multivariate calibration model maintenance
11561166 · 2023-01-24 · ·

A device may obtain a master beta coefficient of a master calibration model associated with a master instrument. The master beta coefficient may be at a grid of a target instrument. The device may perform constrained optimization of an objective function, in accordance with a set of constraints, in order to determine a pair of transferred beta coefficients. The constrained optimization may be performed based on an initial pair of transferred beta coefficients, the master beta coefficient, and spectra associated with a scouting set. The device may determine, based on the pair of transferred beta coefficients, a transferred beta coefficient. The device may determine a final transferred beta coefficient based on a set of transferred beta coefficients including the transferred beta coefficient. The final transferred beta coefficient may be associated with generating a transferred calibration model, corresponding to the master calibration model, for use by the target instrument.

Optical spectrometer modules, systems and methods for optical analysis with multiple light beams

A method of optical analysis comprises receiving light at an optical spectrometer module from a light source, distributing the received light into two or more light beams with a light distribution component of the optical spectrometer module, concurrently exposing each of a reference and one or more test samples to one of the two or more light beams, and concurrently measuring a property of the light associated with each of the reference sample and one or more test samples with a corresponding detector.

System and method to calibrate a plurality of wafer inspection system (WIS) modules

Various embodiments of systems and methods for calibrating wafer inspection system modules are disclosed herein. More specifically, the present disclosure provides various embodiments of systems and methods to calibrate the multiple spectral band values obtained from a substrate by a camera system included within a WIS module. In one embodiment, multiple spectral band values are red, green, and blue (RGB) values. As described in more detail below, the calibration methods disclosed herein may use a test wafer having a predetermined pattern of thickness changes or color changes to generate multiple spectral band offset values. The multiple spectral band offset values can be applied to the multiple spectral band values obtained from the substrate to generate calibrated RGB values, which compensate for spectral responsivity differences between camera systems included within a plurality of WIS modules.

Systems and Methods for Measuring Concentration of an Analyte

Techniques for acquiring and processing data in combination with a photonic sensor system-on-a-chip (SoC) (1) to provide real-time calibrated concentration levels of an analyte (e.g., a constituent molecule within a biological substance) are described. A raw signal (1300) to be analyzed is collected by the sensor chip (1) via diffuse reflectance or transmittance. Determination of the analyte concentration is based on, in part, Beer-Lambert principles and facilitated by applying (2240) scattering correction to the raw signal (1300) prior to decomposition and analysis thereof.

APPARATUS AND METHOD FOR SPECTROSCOPIC ANALYSIS ON INFRARED RAYS

Provided herein is an infrared spectroscopy technique capable of performing spectroscopic analysis on infrared rays in a broad infrared range (including a near infrared range, a short infrared range, a mid-infrared range, a far infrared range, and an extreme infrared range). An apparatus and a method for spectroscopic analysis on infrared rays are provided, without using an image sensor having a limited response range, to generate a signal in which transmitted light for each wavelength passes through a plurality of filters having different transmittances for each wavelength and is spatially pattern-coded, restore the signal into an infrared transmittance image, discriminate a wavelength according to a transmittance of the filter from the infrared transmittance image, calculate an intensity of the light for each wavelength, and output infrared spectrum information.

DEVICE FOR ANALYZING LARGE-AREA SAMPLE BASED ON IMAGE, DEVICE FOR ANALYZING SAMPLE BASED ON IMAGE BY USING DIFFERENCE IN MEDIUM CHARACTERISTIC, AND METHOD FOR MEASURING AND ANALYZING SAMPLE USING THE SAME
20230215194 · 2023-07-06 · ·

Provided are a device for analyzing a large-area sample based on an image, a device for analyzing a sample based on an image by using a difference in medium characteristic, and a method for measuring and analyzing a sample by using the same. The device for analyzing a large-area sample includes a first sensor array including sensors disposed while being spaced apart from each other in a first direction, a second sensor array including sensors disposed while being spaced apart from each other in the first direction, and spaced apart from the first sensor array in a second direction, and a control unit that obtains image data for a cell included in the sample by using sensing data of the sensor on the sample, in which the sample is interposed between the first sensor array and the second sensor array.

Automatic analyzer and standard solution for evaluating scattered light measurement optical system thereof

As a standard solution for evaluating a scattered light measuring optical system mounted on an automated analyzer, a standard solution containing an insoluble carrier at a concentration, at which transmittance is in a range of 10% to 50%, is used, and a light quantity of a light source is adjusted such that a scattered light detector outputs a predetermined value.